Patents by Inventor Hung-Hao Chen

Hung-Hao Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9735028
    Abstract: A method for forming a semiconductor device structure is provided. The method includes providing a substrate and forming a bottom layer, a middle layer, and a top layer on the substrate. The method also includes patterning the top layer to form a patterned top layer and patterning the middle layer by a patterning process including a plasma process to form a patterned middle layer. The plasma process is performed by using a mixed gas including hydrogen gas (H2). The method further includes controlling a flow rate of the hydrogen gas (H2) to improve an etching selectivity of the middle layer to the top layer, and the patterned middle layer includes a first portion and a second portion parallel to the first portion, and a pitch is between the first portion and the second portion.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: August 15, 2017
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Hung-Hao Chen, Yu-Shu Chen, Yu-Cheng Liu
  • Publication number: 20160268143
    Abstract: A method for forming a semiconductor device structure is provided. The method includes providing a substrate and forming a bottom layer, a middle layer, and a top layer on the substrate. The method also includes patterning the top layer to form a patterned top layer and patterning the middle layer by a patterning process including a plasma process to form a patterned middle layer. The plasma process is performed by using a mixed gas including hydrogen gas (H2). The method further includes controlling a flow rate of the hydrogen gas (H2) to improve an etching selectivity of the middle layer to the top layer, and the patterned middle layer includes a first portion and a second portion parallel to the first portion, and a pitch is between the first portion and the second portion.
    Type: Application
    Filed: July 1, 2015
    Publication date: September 15, 2016
    Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
    Inventors: Hung-Hao CHEN, Yu-Shu CHEN, Yu-Cheng LIU
  • Patent number: 9355893
    Abstract: A method for forming an interconnect structure is provided. The method includes providing a substrate. The method also includes forming a dielectric layer on the substrate, and the dielectric layer includes an extreme low-k (ELK) dielectric layer. The method includes forming a via hole in the dielectric layer and forming a photoresist in the via hole and on the dielectric layer. The method also includes removing the photoresist by a plasma process using a CxHyOz gas and forming a conductive structure in the via hole.
    Type: Grant
    Filed: January 20, 2015
    Date of Patent: May 31, 2016
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Hung-Hao Chen, Yu-Shu Chen, Yu-Cheng Liu
  • Publication number: 20080081075
    Abstract: The present invention discloses a novel mixed micelle structure with a functional inner core and hydrophilic outer shells self-assembled from a graft macromolecule and one or more block copolymer, and preferably from a graft copolymer and two or more diblock copolymers. The micelle synthesized in the present invention has a size of about 50-200 nm, which can be used as a cancer diagnosis agent and a cancer drug delivery carrier.
    Type: Application
    Filed: January 25, 2007
    Publication date: April 3, 2008
    Applicant: National Tsing Hua University
    Inventors: Ging-Ho Hsiue, Chun-Liang Lo, Ko-Min Lin, Chun-Kai Huang, Hung-Hao Chen