Patents by Inventor Huong Nguyen

Huong Nguyen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050256732
    Abstract: A business process software program is executed in a processing element comprising a memory and a processor coupled to the memory. The processor is operative to identify within the software program one or more communications services inserted as generic design elements therein, and for each of the identified communications services, to initiate the execution of one or more corresponding communications tasks. At least one of the communications services may comprise a composite communications service which itself comprises a plurality of communications services.
    Type: Application
    Filed: April 5, 2005
    Publication date: November 17, 2005
    Inventors: David Bauer, Cynthia Hiatt, Erik Johnson, Praveen Mamnani, Mai-Huong Nguyen, Janis Putman, Ross Yakulis
  • Publication number: 20050255697
    Abstract: A method of selectively etching organosilicate layers in integrated circuit fabrication processes is disclosed. The organosilicate layers are selectively etched using a hydrogen-containing fluorocarbon gas. The hydrogen-containing fluorocarbon gas may be used to selectively etch an organosilicate layer formed on a silicon oxide stop etch layer when fabricating a damascene structure.
    Type: Application
    Filed: March 9, 2005
    Publication date: November 17, 2005
    Inventors: Huong Nguyen, Michael Barnes, Li-Qun Xia, Mehul Naik
  • Publication number: 20050241762
    Abstract: Embodiments of the invention generally provide etch or CVD plasma processing methods and apparatus used to generate a uniform plasma across the surface of a substrate by modulation pulsing the power delivered to a plurality of plasma controlling devices found in a plasma processing chamber. The plasma generated and/or sustained in the plasma processing chamber is created by the one or more plasma controlling devices that are used to control, generate, enhance, and/or shape the plasma during the plasma processing steps by use of energy delivered from a RF power source. Plasma controlling devices may include, for example, one or more coils (inductively coupled plasma), one or more electrodes (capacitively coupled plasma), and/or any other energy inputting device such as a microwave source.
    Type: Application
    Filed: February 18, 2005
    Publication date: November 3, 2005
    Inventors: Alexander Paterson, Elizabeth Pavel, Valentin Todorow, Huong Nguyen, Thomas Kropewnicki, Brian Hatcher, John Holland
  • Publication number: 20040238409
    Abstract: A process for the hydrogenation of a hydrocarbon feed includes contacting a major amount of the hydrocarbon feed with hydrogen in a counter-current manner in a first reaction zone under hydrogenation reaction conditions in the presence of a hydrogenation catalyst in at least a first catalyst bed wherein a liquid effluent exits at a bottom end of the first reaction zone and a hydrogen-containing gaseous effluent exits at a top end of the first reaction zone, and contacting a minor portion of the hydrocarbon feed with said hydrogen-containing gaseous effluent in a co-current manner in a second reaction zone having a catalyst bed positioned to receive the hydrogen-containing effluent of the first reaction zone.
    Type: Application
    Filed: May 30, 2003
    Publication date: December 2, 2004
    Inventors: Harjeet Virdi, Arup Roy, Thu-Huong Nguyen
  • Patent number: 6626185
    Abstract: A plasma cleaning method for removing deposits in a CVD chamber. The method includes introducing a cleaning gas comprising a fluorine-based gas into the chamber. A plasma is formed by exposing the cleaning gas to an inductive field generated by resonating a radio frequency current in a RF antenna coil. A plasma cleaning step is performed by contacting interior surfaces of the chamber with the plasma for a time sufficient to remove the deposits on the interior surfaces. An advantage of the plasma cleaning method is that it allows for in-situ cleaning of the chamber at high rates, thereby effectively reducing equipment downtime. The method has particular applicability in the cleaning of a PECVD process chamber.
    Type: Grant
    Filed: March 4, 1999
    Date of Patent: September 30, 2003
    Assignee: LAM Research Corporation
    Inventors: Alex Demos, Paul Kevin Shufflebotham, Michael Barnes, Huong Nguyen, Brian McMillin, Monique Ben-Dor
  • Patent number: 6333920
    Abstract: A communications system employs frequency division duplexing to accommodate symmetric and asymmetric services, while substantially eliminating near-end cross talk. Upstream and downstream channels are separated by a guard band in order to insure that near-end cross talk is kept to a minimum. An asymmetric upstream channel is preferably located at a lower frequency range than that of the asymmetric downstream channel. The guard band between these asymmetric upstream and downstream channels shifts in frequency along with the shift in frequency of the respective upstream and downstream channels as a function of reach. This guard band shifting permits the communications systems to utilize a greater percentage of the frequencies available to it and to thereby substantially maximize the communications rate that it can support. Although the asymmetric guard band is allowed to shift in the manner described, it is not allowed to do so in a manner that would create a conflict with symmetric channels.
    Type: Grant
    Filed: September 8, 1997
    Date of Patent: December 25, 2001
    Assignee: Lucent Technologies Inc.
    Inventors: Mai-Huong Nguyen, Jean-Jacques Werner
  • Publication number: 20010019903
    Abstract: A method of depositing a dielectric film on a substrate in a process chamber of an inductively coupled plasma-enhanced chemical vapor deposition reactor. Gap filling between electrically conductive lines on a semiconductor substrate and depositing a cap layer are achieved. Films having significantly improved physical characteristics including reduced film stress are produced by heating the substrate holder on which the substrate is positioned in the process chamber.
    Type: Application
    Filed: February 5, 2001
    Publication date: September 6, 2001
    Inventors: Paul Kevin Shufflebotham, Brian McMillin, Alex Demos, Huong Nguyen, Butch Berney, Monique Ben-Dor
  • Patent number: 6270862
    Abstract: A plasma processing system for processes such as chemical vapor deposition includes a plasma processing chamber, a substrate holder for supporting a substrate within the processing chamber, a dielectric member having an interior surface facing the substrate holder, the dielectric member forming a wall of the processing chamber a gas supply for supplying gas to the chamber, directed towards the substrate, and an RF energy source such as a planar coil which inductively couples RF energy through the dielectric member and into the chamber to energize the process gas into a plasma state. The gas supply may comprise a primary gas ring and a secondary gas ring for supplying gases or gas mixtures into the chamber. The gas supply may further include injectors attached to the primary gas ring which inject gas into the chamber, directed toward the substrate. The plasma processing system may also include a cooling mechanism for cooling the primary gas ring during processing.
    Type: Grant
    Filed: July 26, 1999
    Date of Patent: August 7, 2001
    Assignee: Lam Research Corporation
    Inventors: Brian McMillin, Huong Nguyen, Michael Barnes, Butch Berney
  • Publication number: 20010008138
    Abstract: A plasma cleaning method for removing deposits in a CVD chamber. The method includes introducing a cleaning gas comprising a fluorine-based gas into the chamber. A plasma is formed by exposing the cleaning gas to an inductive field generated by resonating a radio frequency current in a RF antenna coil. A plasma cleaning step is performed by contacting interior surfaces of the chamber with the plasma for a time sufficient to remove the deposits on the interior surfaces. An advantage of the plasma cleaning method is that it allows for in-situ cleaning of the chamber at high rates, thereby effectively reducing equipment downtime. The method has particular applicability in the cleaning of a PECVD process chamber.
    Type: Application
    Filed: March 4, 1999
    Publication date: July 19, 2001
    Inventors: ALEX DEMOS, PAUL KEVIN SHUFFLEBOTHAM, MICHAEL BARNES, HUONG NGUYEN, BRIAN MCMILLIN, MONIQUE BEN-DOR
  • Publication number: 20010006509
    Abstract: A communications system employs frequency division duplexing to accommodate symmetric and asymmetric services, while substantially eliminating near-end cross talk. Upstream and downstream channels are separated by a guard band in order to insure that near-end cross talk is kept to a minimum. An asymmetric upstream channel is preferably located at a lower frequency range than that of the asymmetric downstream channel. The guard band between these asymmetric upstream and downstream channels shifts in frequency along with the shift in frequency of the respective upstream and downstream channels as a function of reach. This guard band shifting permits the communications systems to utilize a greater percentage of the frequencies available to it and to thereby substantially maximize the communications rate that it can support. Although the asymmetric guard band is allowed to shift in the manner described, it is not allowed to do so in a manner that would create a conflict with symmetric channels.
    Type: Application
    Filed: January 31, 2001
    Publication date: July 5, 2001
    Inventors: Mai-Huong Nguyen, Jean-Jacques Werner
  • Patent number: 6184158
    Abstract: A method of depositing a dielectric film on a substrate in a process chamber of an inductively coupled plasma-enhanced chemical vapor deposition reactor. Gap filling between electrically conductive lines on a semiconductor substrate and depositing a cap layer are achieved. Films having significantly improved physical characteristics including reduced film stress are produced by heating the substrate holder on which the substrate is positioned in the process chamber.
    Type: Grant
    Filed: December 23, 1996
    Date of Patent: February 6, 2001
    Assignee: Lam Research Corporation
    Inventors: Paul Kevin Shufflebotham, Brian McMillin, Alex Demos, Huong Nguyen, Butch Berney, Monique Ben-Dor
  • Patent number: 6013155
    Abstract: A plasma processing system for plasma processing of substrates such as semiconductor wafers. The system includes a plasma processing chamber, a substrate support for supporting a substrate within the processing chamber, a dielectric member having an interior surface facing the substrate support, the dielectric member forming a wall of the processing chamber, a gas supply comprising one or more injector tubes extending rectilinearly in the plasma processing chamber and having one or more orifices in a sidewall for supplying gas into the chamber, and an RF energy source such as a planar coil which inductively couples RF energy through the dielectric member and into the chamber to energize the process gas into a plasma state. The gas is supplied through orifices located outside of regions at the distal tip of the injector tubes where electric field lines are concentrated.
    Type: Grant
    Filed: June 30, 1997
    Date of Patent: January 11, 2000
    Assignee: LAM Research Corporation
    Inventors: Brian McMillin, Huong Nguyen, Michael Barnes, Tom Ni
  • Patent number: 5835334
    Abstract: An electrostatic chuck comprises an electrode cap with a dielectric layer for attracting and holding the back side of a semiconductor wafer positioned on the top surface of the dielectric layer, and a lower electrode. The electrostatic chuck is heated by resistive heating elements attached to or embedded within the chuck. The electrostatic chuck is cooled by circulating liquid coolant through the body of the chuck. Coolant gas is provided at the back side of the semiconductor wafer to improve thermal transfer. A feedback control mechanism maintains the chuck, and consequently the wafer, at a predetermined temperature by actively controlling both the heating and the cooling functions.
    Type: Grant
    Filed: September 30, 1996
    Date of Patent: November 10, 1998
    Assignee: Lam Research
    Inventors: Brian McMillin, Michael Barnes, Butch Berney, Huong Nguyen
  • Patent number: 5539746
    Abstract: Timing control resolution between two communications devices is provided by assigning each device to one of a plurality of priorities and by transmitting an identification of this priority to the other communications device. The determination of which device is the master and which device is the slave is then resolved by comparing the received and transmitted identifications from the contending devices to a predetermined ranking of identification signals. When such identifications signals are the same, each device randomly selects an identification signal from a group of such signals. Preferably this group includes all of the identification signals except that transmitted in the immediately prior contention round. The received and transmitted identifications signals from the contending devices are then compared to the predetermined ranking of identification signals.
    Type: Grant
    Filed: April 14, 1995
    Date of Patent: July 23, 1996
    Assignee: AT&T Corp.
    Inventors: Gang Huang, Mai-Huong Nguyen, Jean-Jacques Werner
  • Patent number: 5442637
    Abstract: The Transmission Control Protocol (TCP) is a connection-oriented transport layer protocol that offers a full duplex reliable virtual circuit connection between two endpoints. Each received TCP packet in an endpoint contains both control information and data. The complexity of processing this control information in an endpoint is reduced by only periodically processing the control information. In particular, control information in received packets are not processed in an endpoint until either a) a predetermined number of packets are received, or b) a timer expires, whichever occurs first. As a result, this overall decreases the amount of processing associated with the receipt of each TCP packet and improves the performance of the TCP protocol in a high-speed packet network.
    Type: Grant
    Filed: October 15, 1992
    Date of Patent: August 15, 1995
    Assignee: AT&T Corp.
    Inventor: Mai-Huong Nguyen