Patents by Inventor Iwao Suzuki

Iwao Suzuki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory
    Patent number: 6826720
    Abstract: A testing circuit using ALPG is mounted in a testing board in which sockets for mounting semiconductor memories as devices to be tested in the board is mounted and a volatile memory for storing a data table for generating a random pattern is provided in the testing circuit so that a test using a test pattern having no regularity is performed using the data table in addition to a test using a test pattern having regularity generated by the ALPG.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: November 30, 2004
    Assignee: Renesas Technology, Corp.
    Inventors: Iwao Suzuki, Shuji Kikuchi, Fumie Kobayashi, Hideyuki Aoki
  • Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory
    Publication number: 20020066056
    Abstract: A testing circuit using ALPG is mounted in a testing board in which sockets for mounting semiconductor memories as devices to be tested in the board is mounted and a volatile memory for storing a data table for generating a random pattern is provided in the testing circuit so that a test using a test pattern having no regularity is performed using the data table in addition to a test using a test pattern having regularity generated by the ALPG.
    Type: Application
    Filed: November 28, 2001
    Publication date: May 30, 2002
    Inventors: Iwao Suzuki, Shuji Kikuchi, Fumie Kobayashi, Hideyuki Aoki