Patents by Inventor Izumi Waki
Izumi Waki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20090278043Abstract: A charged particle reaction cell of the present invention has a serially-arranged plurality of ring electrodes, wherein a modulated radio frequency voltage obtained by modulating the amplitude of a radio frequency voltage is applied, whereby ions are captured at the bottom of the ups and downs of a formed pseudopotential and are transferred with the move of the pseudopotential. In the charged particle reaction cell, the time required for the charged particle reaction can be secured and also the problem of the decrease of the throughput or the mass resolution can be solved, and the speed of the structure analysis of a measurement sample can be accelerated.Type: ApplicationFiled: March 8, 2006Publication date: November 12, 2009Inventors: Hiroyuki Satake, Takashi Baba, Izumi Waki
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Patent number: 7592589Abstract: A mass spectrometry device includes an ion source for ionizing a sample, an ion trap for trapping ions ionized by the ion source. A control unit for controlling voltages applied to lenses forming part of the ion trap, and a detection unit for detecting the ions trapped by said ion trap. The control unit causes a trap potential to be generated on a central axis of quadrupole rods forming part of the ion trap, causes part of the trapped ions to be oscillated in an intermediate direction between the quadrupole rods which are mutually adjacent to each other, and applies a voltage for ejecting the oscillated ions in a central-axis direction of the quadrupole rods by generating an extraction field.Type: GrantFiled: March 12, 2007Date of Patent: September 22, 2009Assignee: Hitachi, Ltd.Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Takashi Baba, Izumi Waki
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Patent number: 7589320Abstract: An electron capture dissociation device to implement a combination of electron capture dissociation and collision dissociation and a mass spectrometer with the use thereof are provided. This device includes a linear ion trap provided with linear multipole electrodes applied with a radio frequency electric field and wall electrodes that are arranged on both ends in the axis direction of the linear multipole electrodes, have holes on the central axis thereof, and generate a wall electric field by being applied with a direct-current voltage, a cylindrical magnetic field-generating unit that generates a magnetic field parallel to the central axis of the linear multipole electrodes and surrounds the linear ion trap, and an electron source arranged opposite to the linear multipole electrodes with sandwiching one of the wall electrodes. The electron generation site of the electron source is placed in the inside of the magnetic field generated by the magnetic field-generating unit.Type: GrantFiled: October 31, 2007Date of Patent: September 15, 2009Assignee: Hitachi High-Technologies CorporationInventors: Takashi Baba, Hiroyuki Satake, Izumi Waki
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Patent number: 7589321Abstract: An ion trap in which highly accurate isolation, ECD, and CID can be efficiently performed. A reaction cell and a mass spectrometer of the present invention include an ion-trap which has a plurality of rod electrodes and creates a multipole field, a means for generating a magnetic field in the axial direction of the ion-trap, a means for creating a DC harmonic potential in the axial direction of the ion-trap, and an electron source for introducing electrons into the central axis of the ion-trap. The identification ability is greatly improved compared with the prior art.Type: GrantFiled: February 6, 2007Date of Patent: September 15, 2009Assignee: Hitachi High-Technologies CorporationInventors: Yuichiro Hashimoto, Hideki Hasegawa, Takashi Baba, Izumi Waki
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Publication number: 20090200458Abstract: A technology for collecting a granular substance adhering to a baggage with high rate without touching the substance and inspecting whether a dangerous or specific sample material is adhered to the baggage. A method for simplifying or automating such an inspection is also provided. An adhering matter inspection equipment (1) is characterized in that the equipment comprises a collecting section (5) for collecting a sample material peeled off from an inspection object (25) whereupon the sample material is adhered by blowing compression gas through a capturing filter (52), and an inspecting section (2) for analyzing the sample material captured by the capturing filter (52), and further characterized in that the inspection equipment comprises a section (3) for delivering a baggage to the inspecting section (2), and a carrying section (4) for carrying the capturing filter (52) from the capturing section (5) to the inspecting section (2).Type: ApplicationFiled: March 14, 2005Publication date: August 13, 2009Inventors: Hideo Kashima, Yasuaki Takada, Izumi Waki
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Patent number: 7569814Abstract: A mass spectrometer includes: an ion source for ionizing a specimen to generate ions, an ion transport portion for transporting the ions, a linear ion trap portion for accumulating the transported ions by a potential formed axially, and a control portion of ejecting the ions within a second m/z range different from a first m/z range, from the linear ion trap portion, and substantially at the same timing as the timing of accumulating the ions within the first m/z range from the transport portion into the linear ion trap portion. The ion transportation portion having a mass selection means for selecting the ions in the first m/z range.Type: GrantFiled: January 31, 2008Date of Patent: August 4, 2009Assignee: Hitachi High-Technologies CorporationInventors: Yuichiro Hashimoto, Hideki Hasegawa, Takashi Baba, Hiroyuki Satake, Izumi Waki
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Publication number: 20090189065Abstract: In a mass spectrometer introducing ions produced at an ion source, and including quadrupole rods which have an inlet and an outlet and to which a radio-frequency voltage is applied, the mass spectrometer, i.e., a mass spectrometry device implemented by a linear trap which exhibits high ejection efficiency, high mass resolution, and low ejection energy, executes the following steps: Trapping at least part of the ions by a trap potential generated on the central axis of a quadrupole field, oscillating part of the trapped ions in an intermediate direction between the mutually-adjacent quadrupole rods, ejecting the oscillated ions by an extraction field, and detecting the ejected ions or introducing the ejected ions into another detection process.Type: ApplicationFiled: March 8, 2006Publication date: July 30, 2009Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Takashi Baba, Izumi Waki
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Patent number: 7566870Abstract: A mass spectrometer capable of realizing a high-sensitivity ion analysis and a high ion selectivity performance. The mass spectrometer includes the ion source where ions are produced, the ion trap where ions are accumulated, isolated, dissociated, and ejected, the detector to detect ions to be detected, and the controller to control operations of the ion trap. It has the features that the total ion accumulation in or just before each period is calculated based on the result obtained from the mass spectrometry in the preceding period, and that in at least one out of all periods, the condition of voltage applied to the ion trap is corrected depending on the total ion accumulation. Compared to the related art, the mass spectrometer of the present invention provides much improved performance in analysis sensitivity and ion selectivity.Type: GrantFiled: June 5, 2006Date of Patent: July 28, 2009Assignee: Hitachi High-Technologies CorporationInventors: Hideki Hasegawa, Yuichiro Hashimoto, Izumi Waki
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Publication number: 20090084950Abstract: An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided. An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator 3 to be mixed with a sample gas for introduction into an ion source 4 for ionization, thereby obtaining a mass spectrum by a mass analysis region 5. A data processor 6 determines the detection or non-detection of a specific m/z of an organic acid adduct ion obtained by adding a molecule generated from the organic acid to a molecule with specific m/z generated from a target chemical substance to be detected based on the obtained mass spectrum. When there is an ion peak with the m/z of the organic acid adduct ion, the presence of the target chemical substance to be detected is determined, and an alarm is sounded. False detection can be prevented.Type: ApplicationFiled: July 14, 2008Publication date: April 2, 2009Inventors: Hisashi Nagano, Izumi Waki, Yasuaki Takada
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Publication number: 20090039253Abstract: A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.Type: ApplicationFiled: October 2, 2008Publication date: February 12, 2009Inventors: Yasuaki Takada, Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri, Yasuo Seto, Yasuhiro Sano, Shigeharu Yamashiro, Isaac Ohsawa
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Patent number: 7449685Abstract: A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.Type: GrantFiled: January 23, 2006Date of Patent: November 11, 2008Assignees: Hitachi, Ltd., National Research Institute of Police ScienceInventors: Yasuaki Takada, Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri, Yasuo Seto, Yasuhiro Sano, Shigeharu Yamashiro, Isaac Ohsawa
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Patent number: 7420180Abstract: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.Type: GrantFiled: January 30, 2007Date of Patent: September 2, 2008Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Masao Suga, Izumi Waki
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Patent number: 7408153Abstract: An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided. An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator 3 to be mixed with a sample gas for introduction into an ion source 4 for ionization, thereby obtaining a mass spectrum by a mass analysis region 5. A data processor 6 determines the detection or non-detection of a specific m/z of an organic acid adduct ion obtained by adding a molecule generated from the organic acid to a molecule with specific m/z generated from a target chemical substance to be detected based on the obtained mass spectrum. When there is an ion peak with the m/z of the organic acid adduct ion, the presence of the target chemical substance to be detected is determined, and an alarm is sounded. False detection can be prevented.Type: GrantFiled: January 4, 2006Date of Patent: August 5, 2008Assignee: Hitachi, Ltd.Inventors: Hisashi Nagano, Izumi Waki, Yasuaki Takada
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Publication number: 20080156979Abstract: Amass spectrometer includes: an ion source for ionizing a specimen to generate ions, an ion transport portion for transporting the ions, a linear ion trap portion for accumulating the transported ions by a potential formed axially, and a control portion of ejecting the ions within a second m/z range different from a first m/z range, from the linear ion trap portion, and substantially at the same timing as the timing of accumulating the ions within the first m/z range from the transport portion into the linear ion trap portion. The ion transportation portion having a mass selection means for selecting the ions in the first m/z range.Type: ApplicationFiled: January 31, 2008Publication date: July 3, 2008Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Takashi Baba, Hiroyuki Satake, Izumi Waki
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Publication number: 20080121795Abstract: A mass spectrometer that is switchable to operate as a linear trap or as a mass filter, and attaining both high ejection efficiency when operated as a linear trap and high mass resolving power when operated as a mass filter. A mass spectrometer includes an ion source for ionizing a sample, a linear trap quadrupole rod lens supplied with ionized ions, a trap electrode for forming a potential to trap the supplied ions between one end of the quadrupole lens and the other end, a control unit to regulate the trap lens voltage, and a mass analyzer or detector to detect ions ejected from the linear trap, and characterized in switching between an operation where the supplied ions are trapped in a section quadrupole rod lens and ejected by the controller unit regulating the trap electrode voltage; and an operation where ions are selective passed through according to their mass.Type: ApplicationFiled: November 8, 2007Publication date: May 29, 2008Inventors: Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa, Izumi Waki
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Patent number: 7378650Abstract: There is provided an ion-mobility spectrometer. This apparatus includes the following configuration components: An ion source for generating first ions, a first drift unit for separating the first ions by flight drift times, an ion dissociation unit for generating second ions by dissociating the first ions separated, and a second drift unit for separating the second ions by flight drift times. Moreover, the first drift unit, the ion dissociation unit, and the second drift unit are located inside a chamber whose pressure is set at 10 mTorr or higher. This apparatus allows execution of low-cost and high-resolving-power ion separation and detection.Type: GrantFiled: August 1, 2007Date of Patent: May 27, 2008Assignee: Hitachi, Ltd.Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Izumi Waki
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Publication number: 20080116372Abstract: A linear trap having high ejection efficiency and low ejection energy is realized. In a mass spectrometer in which ion generated by an ion source are introduced to a quadrupole rod structure applied with RF voltage and ejected from the quadrupole rod structure so as to be detected by a detection mechanism, a mass dependent potential is formed in the axial direction of the quadrupole rod structure and ions are ejected mass selectively from the vicinity of a minimum point of the potential, the mass dependent potential being formed by applying electrostatic voltage and RF voltage to an insertion electrode inserted in the quadrupole rods.Type: ApplicationFiled: May 8, 2007Publication date: May 22, 2008Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Izumi Waki, Masuyuki Sugiyama
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Patent number: 7375316Abstract: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.Type: GrantFiled: March 2, 2007Date of Patent: May 20, 2008Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Masao Suga, Izumi Waki
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Publication number: 20080092629Abstract: A gas component collector comprises a filter assembly 3 comprising an adsorbent and an adsorbent holding plate having a first face, a second face and a plurality of holes that are bored through from the first face to the second face and are filled with the adsorbent adsorbing at least one gas component to be analyzed, the filter assembly satisfying (AL?V)2/L3?0.003 mm3 and V/AL?0.3, where V is a total volume of the adsorbent, A is a sum of an opening areas of the holes, and L is an average length of the holes, and a holding container 2 housing the filter assembly 3. On at least one of the holding container 2 a first opening portion for introducing gas and a second opening portion for allowing the introduced gas to be discharged are formed.Type: ApplicationFiled: October 18, 2007Publication date: April 24, 2008Inventors: Masao Suga, Masuyoshi Yamada, Izumi Waki
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Publication number: 20080078930Abstract: An electron capture dissociation device to implement a combination of electron capture dissociation and collision dissociation and a mass spectrometer with the use thereof are provided. This device includes a linear ion trap provided with linear multipole electrodes applied with a radio frequency electric field and wall electrodes that are arranged on both ends in the axis direction of the linear multipole electrodes, have holes on the central axis thereof, and generate a wall electric field by being applied with a direct-current voltage, a cylindrical magnetic field-generating unit that generates a magnetic field parallel to the central axis of the linear multipole electrodes and surrounds the linear ion trap, and an electron source arranged opposite to the linear multipole electrodes with sandwiching one of the wall electrodes. The electron generation site of the electron source is placed in the inside of the magnetic field generated by the magnetic field-generating unit.Type: ApplicationFiled: October 31, 2007Publication date: April 3, 2008Inventors: Takashi Baba, Hiroyuki Satake, Izumi Waki