Patents by Inventor Izumi Waki

Izumi Waki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7064319
    Abstract: A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.
    Type: Grant
    Filed: March 31, 2003
    Date of Patent: June 20, 2006
    Assignees: Hitachi High-Technologies Corporation, Applera Corporation
    Inventors: Yuichiro Hashimoto, Izumi Waki, Kiyomi Yoshinari, Yasushi Terui, Tsukasa Shishika, Marvin L. Vestal
  • Patent number: 7064320
    Abstract: A mass spectrometer has an atmospheric pressure chemical ionization source that includes a first ionization portion including a needle electrode, for generating a primary ion by discharge of the needle electrode a primary ion introduction aperture, and a second ionization portion including an introduction aperture, for generating a sample ion by the reaction between the primary ion and the sample gas introduced from an end of a column of gas chromatography, a sample ion movement aperture; and a mass analysis portion; wherein the end is arranged at a position satisfying the relation r?2R where R is a radius of an inner diameter of the aperture and r is a distance between an axis connecting the center of the aperture and the center of the aperture, and the end.
    Type: Grant
    Filed: March 4, 2005
    Date of Patent: June 20, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Masuyoshi Yamada, Izumi Waki, Hideo Kasima
  • Publication number: 20060108522
    Abstract: An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided. An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator 3 to be mixed with a sample gas for introduction into an ion source 4 for ionization, thereby obtaining a mass spectrum by a mass analysis region 5. A data processor 6 determines the detection or non-detection of a specific m/z of an organic acid adduct ion obtained by adding a molecule generated from the organic acid to a molecule with specific m/z generated from a target chemical substance to be detected based on the obtained mass spectrum. When there is an ion peak with the m/z of the organic acid adduct ion, the presence of the target chemical substance to be detected is determined, and an alarm is sounded. False detection can be prevented.
    Type: Application
    Filed: January 4, 2006
    Publication date: May 25, 2006
    Inventors: Hisashi Nagano, Izumi Waki, Yasuaki Takada
  • Patent number: 7034287
    Abstract: Disclosed is a mass spectrometer combining an ion trap and a TOFMS non-coaxially, wherein ion trapping efficiency, mass resolution, and CID efficiency can be maximized. The present invention relates to the mass spectrometer combining the ion trap and the TOFMS non-coaxially, having a mass filter disposed between an ion source and an ion trap and a controller for controlling the gas pressure inside the ion trap and the gas pressure inside the mass filter independently, wherein the gas pressure inside the ion trap is set to the level higher than that inside the mass filter.
    Type: Grant
    Filed: January 5, 2004
    Date of Patent: April 25, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Akihiko Okumura, Izumi Waki
  • Publication number: 20060071159
    Abstract: There is provided an ion-mobility spectrometer. This apparatus includes the following configuration components: An ion source for generating first ions, a first drift unit for separating the first ions by flight drift times, an ion dissociation unit for generating second ions by dissociating the first ions separated, and a second drift unit for separating the second ions by flight drift times. Moreover, the first drift unit, the ion dissociation unit, and the second drift unit are located inside a chamber whose pressure is set at 10 mTorr or higher. This apparatus allows execution of low-cost and high-resolving-power ion separation and detection.
    Type: Application
    Filed: March 7, 2005
    Publication date: April 6, 2006
    Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Izumi Waki
  • Patent number: 7015464
    Abstract: An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided. An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator to be mixed with a sample gas for introduction into an ion source for ionization, thereby obtaining a mass spectrum by a mass analysis region. A data processor determines the detection or non-detection of a specific m/z of an organic acid adduct ion obtained by adding a molecule generated from the organic acid to a molecule with specific m/z generated from a target chemical substance to be detected based on the obtained mass spectrum. When there is an ion peak with the m/z of the organic acid adduct ion, the presence of the target chemical substance to be detected is determined, and an alarm is sounded. False detection can be prevented.
    Type: Grant
    Filed: February 19, 2004
    Date of Patent: March 21, 2006
    Assignee: Hitachi, Ltd.
    Inventors: Hisashi Nagano, Izumi Waki, Yasuaki Takada
  • Publication number: 20060054806
    Abstract: A mass spectrometer has an atmospheric pressure chemical ionization source that includes a first ionization portion including a needle electrode, for generating a primary ion by discharge of the needle electrode a primary ion introduction aperture, and a second ionization portion including an introduction aperture, for generating a sample ion by the reaction between the primary ion and the sample gas introduced from an end of a column of gas chromatography, a sample ion movement aperture; and a mass analysis portion; wherein the end is arranged at a position satisfying the relation r?2R where R is a radius of an inner diameter of the aperture and r is a distance between an axis connecting the center of the aperture and the center of the aperture, and the end.
    Type: Application
    Filed: March 4, 2005
    Publication date: March 16, 2006
    Inventors: Masuyoshi Yamada, Izumi Waki, Hideo Kasima
  • Publication number: 20050269504
    Abstract: A mass spectrometer using a linear ion trap capable of efficiently suppressing the space charge and enabling scanning for a wide m/z range at a high Duty Cycle is provided.
    Type: Application
    Filed: June 7, 2005
    Publication date: December 8, 2005
    Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Takashi Baba, Hiroyuki Satake, Izumi Waki
  • Patent number: 6967323
    Abstract: An ion mass spectrometer comprising an ionization source for generating ions, a linear trap region for accumulation and dissociation of ions, and a time-of-flight mass spectrometer for mass spectroscopy of ions based on the flying time, and having a collision damping region introduced with a buffer gas for reducing the kinetic energy of ions ejected from the linear trap region and converting the ion packet into continuous beam and provided with plural electrodes for generating multipole electric fields in the inside between the linear trap region and the time-of-flight mass spectrometer, and having an ion transmission control mechanism for allowing or inhibiting incidence of ion from the linear trap region to the collision damping region between the linear trap region and the collision damping region.
    Type: Grant
    Filed: June 17, 2004
    Date of Patent: November 22, 2005
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuichiro Hashimoto, Takashi Baba, Hideki Hasegawa, Izumi Waki
  • Publication number: 20050199799
    Abstract: A mass spectrometric apparatus capable of generating and detecting positive and negative ions stably at the same time. The apparatus preferably comprises: an opening through which a sample gas is introduced; an ion source to generate ions of the sample gas; and a mass spectrometer to analyze the mass of the generated ions. The ion source utilized with the mass spectrometric device comprises: a first needle electrode on which a voltage is applied in order to generate positive ions of the sample gas introduced through the opening; a first counter electrode having a first opening through which the sample gas and the positive ions pass; a second counter electrode disposed opposite the first counter electrode having a second opening through which the sample gas and the positive ions pass; a second needle electrode on which voltage is applied in order to generate negative ions of the sample gas; and a vent through which the sample gas is ejected.
    Type: Application
    Filed: December 13, 2004
    Publication date: September 15, 2005
    Inventors: Yasuaki Takada, Hisashi Nagano, Masao Suga, Hideo Kashima, Izumi Waki
  • Patent number: 6917037
    Abstract: The measurement throughput and the precision in sample identification are improved in a tandem type mass spectrograph. Thus, in a mass spectrum analyzing system utilizing a tandem type mass spectrograph in which the selection of an ionic species to serve as the measurement target, dissociation thereof and spectral measurement are repeated in n stages, the ionic species to be measured in MSn is selected based on the mass-to-charge ratios (m/z values) obtained as a result of the spectral analysis in MSn?1 (n?2), and this procedure is repeated until the sequence of a required number of amino acids is determined.
    Type: Grant
    Filed: February 4, 2004
    Date of Patent: July 12, 2005
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsushi Ootake, Kinya Kobayashi, Kiyomi Yoshinari, Atsumu Hirabayashi, Izumi Waki
  • Publication number: 20050127290
    Abstract: A mass spectrometer capable of analyzing a wide mass range with high sensitivity and high mass accuracy.
    Type: Application
    Filed: November 29, 2004
    Publication date: June 16, 2005
    Inventors: Yuichiro Hashimoto, Takashi Baba, Hideki Hasegawa, Izumi Waki
  • Patent number: 6900430
    Abstract: A practical mass spectrometer for proteome analysis is provided. In an ion trap-connected, orthogonal acceleration type time-of-flight mass spectrometer, the mass-to-charge ratio range that may be analyzed by one procedure is increased by providing means for reducing the velocity of ions ejected from an ion trap. The efficiency in protein identification in proteome analysis is thereby improved.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: May 31, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Akihiko Okumura, Atsumu Hirabayashi, Izumi Waki
  • Patent number: 6888134
    Abstract: There is provided an ion trap mass spectrometer which can detect fragment ions having a low mass and enables high-sensitivity measurement. A mass spectrometer has an ion source generating sample ions; an ion trap having a pair of and endcap electrodes and a ring electrode and accumulating ions generated by the ion source and isolating precursor ions from the accumulated ion and dissociating the isolated precursor ions and ejecting the dissociated ions from the ion trap. A gas introduction hole is arranged in the endcap electrode or the ring electrode for introducing in intermittently-introduced bath gas therethrough into the ion trap. A detector detects the ions ejected from the ion trap. The center axis of the gas introduction hole is arranged so as to pass through a region near the center of gravity of the ion trap.
    Type: Grant
    Filed: June 30, 2003
    Date of Patent: May 3, 2005
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuichiro Hashimoto, Hideki Hasegawa, Takashi Baba, Izumi Waki
  • Patent number: 6884997
    Abstract: A dangerous substance detecting apparatus comprises an oven for accommodating a wiping member stuck with a sample derived from a dangerous substance, a light source for emitting infrared rays for heating the sample, an ion source for ionizing the sample evaporated in the oven, a mass analyzer for performing a mass analysis on ions, a data processing unit for processing an output signal from the mass analyzer to determine the presence or absence of a dangerous substance, an operation panel for displaying the result of the determination, an alarm unit for generating an alarm based on the result of the determination, and a control unit for controlling the respective components of the apparatus based on operating conditions entered from the operation panel and specified for the respective components of the apparatus.
    Type: Grant
    Filed: March 20, 2003
    Date of Patent: April 26, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Hideo Kashima, Izumi Waki, Yasuaki Takada, Hisashi Nagano, Katsumi Nagumo, Mitsuhiro Noda
  • Publication number: 20050061964
    Abstract: An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided. An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator 3 to be mixed with a sample gas for introduction into an ion source 4 for ionization, thereby obtaining a mass spectrum by a mass analysis region 5. A data processor 6 determines the detection or non-detection of a specific m/z of an organic acid adduct ion obtained by adding a molecule generated from the organic acid to a molecule with specific m/z generated from a target chemical substance to be detected based on the obtained mass spectrum. When there is an ion peak with the m/z of the organic acid adduct ion, the presence of the target chemical substance to be detected is determined, and an alarm is sounded. False detection can be prevented.
    Type: Application
    Filed: February 19, 2004
    Publication date: March 24, 2005
    Inventors: Hisashi Nagano, Izumi Waki, Yasuaki Takada
  • Patent number: 6852970
    Abstract: There will be provided a mass spectrometer for detecting impurity in sample gas of a low flow rate. A mass spectrometer including: an atmospheric pressure chemical ionization source having a primary ionization part 28 for generating a primary ion by means of electric discharge of reagent gas, and a secondary ionization part 23 for generating an ion of the sample by a reaction of the primary ion and the sample; a mass spectrometric part 11 for performing mass spectrometric analysis of the ion generated; a mixing portion 33 for mixing the sample to be introduced into the secondary ionization part with dilution gas; and a mean 30 for controlling a flow rate of the dilution gas for flowing through the mixing portion; and a mean 12-1 or 12-2 or 12-3 for controlling a flow rate of the sample gas, wherein mixed gas obtained by mixing the sample with the dilution gas is introduced into the secondary ionization part and the sample is ionized.
    Type: Grant
    Filed: November 4, 2003
    Date of Patent: February 8, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Masuyoshi Yamada, Izumi Waki
  • Patent number: 6852971
    Abstract: In an electric charge adjusting method and mass spectrometer, tandem linear ion traps are employed such that charge-reducing reactions occur in only one of the linear ion traps. An ion reaching a given charge value is selectively moved to another linear ion trap. Through MS/MS mass analysis, the structure of a biomolecule is analyzed very efficiently with high sensitivity via a simple analysis.
    Type: Grant
    Filed: December 17, 2002
    Date of Patent: February 8, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Takashi Baba, Yuichiro Hashimoto, Izumi Waki
  • Publication number: 20050023452
    Abstract: An ion mass spectrometer comprising an ionization source for generating ions, a linear trap region for accumulation and dissociation of ions, and a time-of-flight mass spectrometer for mass spectroscopy of ions based on the flying time, and having a collision damping region introduced with a buffer gas for reducing the kinetic energy of ions ejected from the linear trap region and converting the ion packet into continuous beam and provided with plural electrodes for generating multipole electric fields in the inside between the linear trap region and the time-of-flight mass spectrometer, and having an ion transmission control mechanism for allowing or inhibiting incidence of ion from the linear trap region to the collision damping region between the linear trap region and the collision damping region.
    Type: Application
    Filed: June 17, 2004
    Publication date: February 3, 2005
    Inventors: Yuichiro Hashimoto, Takashi Baba, Hideki Hasegawa, Izumi Waki
  • Patent number: 6844546
    Abstract: An explosive detection system including a sample injection region, an ion source region for generating ions of a sample injected by the ion injection region, a mass analysis region for analyzing mass of the ions, a heater for heating the sample injection region and the ion source region, a plurality of pumps for exhausting a chamber in which the mass analysis region is disposed, and a controller for controlling the regions and the plurality of pumps. The controller conducts control so as to heat the sample injection region and the ion source region with the heaters, then reduce heating electric power supplied to the heaters in order to prevent a predetermined electric power value from being exceeded, and drive the plurality of pumps successively to exhaust the chamber.
    Type: Grant
    Filed: August 28, 2002
    Date of Patent: January 18, 2005
    Assignee: Hitachi, Ltd.
    Inventors: Hisashi Nagano, Yasuaki Takada, Izumi Waki, Koushou Aikawa, Masayuki Takizawa, Shigenori Morishima