Patents by Inventor Jack Kavalieros

Jack Kavalieros has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11017843
    Abstract: In memory devices where a memory cell includes a thin film cell select transistor, selection between layers of such memory cells may further comprise another thin film select transistor. Bitline and wordline encoding suitable for a memory device having a single layer of memory cells may be scaled up to a 3D memory device having two or more memory cell layers. In a DRAM device one layer of (1TFT-1C) cells may include a 2D array of metal-insulator-metal capacitors over an array of TFTs. Additional layers of such 1TFT-1C cells may be stacked monolithically to form a 3D array. Memory cells in each layer may be accessed through a wordline and local bitline. A local bitline of one cell layer may be coupled to global bitline applicable to all cell layers through a layer-selected TFT according to a voltage applied to a layer-select gate voltage.
    Type: Grant
    Filed: June 28, 2019
    Date of Patent: May 25, 2021
    Assignee: Intel Corporation
    Inventors: Abhishek Sharma, Gilbert Dewey, Willy Rachmady, Van Le, Matthew Metz, Jack Kavalieros
  • Patent number: 11011550
    Abstract: Non-planar thin film transistors (TFTs) incorporating an oxide semiconductor for the channel material. Memory devices may include an array of one thin film transistor and one capacitor (1TFT-1C) memory cells. Methods for fabricating non-planar thin film transistors may include a sacrificial gate/top-gate replacement technique with self-alignment of source/drain contacts.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: May 18, 2021
    Assignee: Intel Corporation
    Inventors: Van Le, Abhishek Sharma, Gilbert Dewey, Ravi Pillarisetty, Shriram Shivaraman, Tahir Ghani, Jack Kavalieros
  • Publication number: 20210036023
    Abstract: Thin film transistor structures may include a regrown source or drain material between a channel material and source or drain contact metallization. The source or drain material may be selectively deposited at low temperatures to backfill recesses formed in the channel material. Electrically active dopant impurities may be introduced in-situ during deposition of the source or drain material. The source or drain material may overlap a portion of a gate electrode undercut by the recesses. With channel material of a first composition and source or drain material of a second composition, thin film transistor structures may display low external resistance and high channel mobility.
    Type: Application
    Filed: August 1, 2019
    Publication date: February 4, 2021
    Applicant: Intel Corporation
    Inventors: Ashish Agrawal, Jack Kavalieros, Anand Murthy, Gilbert Dewey, Matthew Metz, Willy Rachmady, Cheng-Ying Huang, Cory Bomberger
  • Publication number: 20200411692
    Abstract: Transistor structures may include a metal oxide contact buffer between a portion of a channel material and source or drain contact metallization. The contact buffer may improve control of transistor channel length by limiting reaction between contact metallization and the channel material. The channel material may be of a first composition and the contact buffer may be of a second composition.
    Type: Application
    Filed: June 27, 2019
    Publication date: December 31, 2020
    Applicant: Intel Corporation
    Inventors: Gilbert Dewey, Abhishek Sharma, Van Le, Jack Kavalieros, Shriram Shivaraman, Seung Hoon Sung, Tahir Ghani, Arnab Sen Gupta, Nazila Haratipour, Justin Weber
  • Publication number: 20200411686
    Abstract: A vertical transistor structure includes a material stack having a source material, a drain material, and a channel material therebetween. The vertical transistor structure further includes a gate electrode adjacent to a sidewall of the stack, where the sidewall includes the channel material, and at least a partial thickness of both the source material and the drain material. A gate dielectric is present between the sidewall of the stack and the gate electrode. The vertical transistor structure further includes a first metallization over a first area of the stack above the gate dielectric layer, and in contact with the gate electrode on sidewall of the stack. A second metallization is adjacent to the first metallization, where the second metallization is over a second area of the stack, and in contact with the source material or the drain material.
    Type: Application
    Filed: June 27, 2019
    Publication date: December 31, 2020
    Applicant: Intel Corporation
    Inventors: Nazila Haratipour, I-cheng Tung, Abhishek A. Sharma, Arnab Sen Gupta, Van Le, Matthew V. Metz, Jack Kavalieros, Tahir Ghani
  • Publication number: 20200411078
    Abstract: In memory devices where a memory cell includes a thin film cell select transistor, selection between layers of such memory cells may further comprise another thin film select transistor. Bitline and wordline encoding suitable for a memory device having a single layer of memory cells may be scaled up to a 3D memory device having two or more memory cell layers. In a DRAM device one layer of (1TFT-1C) cells may include a 2D array of metal-insulator-metal capacitors over an array of TFTs. Additional layers of such 1TFT-1C cells may be stacked monolithically to form a 3D array. Memory cells in each layer may be accessed through a wordline and local bitline. A local bitline of one cell layer may be coupled to global bitline applicable to all cell layers through a layer-selected TFT according to a voltage applied to a layer-select gate voltage.
    Type: Application
    Filed: June 28, 2019
    Publication date: December 31, 2020
    Applicant: Intel Corporation
    Inventors: Abhishek Sharma, Gilbert Dewey, Willy Rachmady, Van Le, Matthew Metz, Jack Kavalieros
  • Publication number: 20200411528
    Abstract: An integrated circuit includes one or more layers of insulating material defining a vertical bore with a first portion and a second portion. A capacitor structure is in the first portion of the vertical bore and includes a first electrode, a second electrode, and a dielectric between the first electrode and the second electrode. A transistor structure is in the second portion of the vertical bore and includes a third electrode extending into the second portion of the vertical bore, a layer of semiconductor material in contact with the first electrode and in contact with the second electrode, and a dielectric between the semiconductor material and the insulating material. A fourth electrode wraps around the transistor structure such that the dielectric is between the semiconductor material and the fourth electrode. The capacitor structure can be above or below the transistor structure in a self-aligned vertical arrangement.
    Type: Application
    Filed: June 25, 2019
    Publication date: December 31, 2020
    Applicant: Intel Corporation
    Inventors: Seung Hoon Sung, Charles C. Kuo, Abhishek A. Sharma, Van H. Le, Jack Kavalieros
  • Publication number: 20200411695
    Abstract: A transistor includes a semiconductor body including a material such as an amorphous or polycrystalline material, for example and a gate stack on a first portion of the body. The gate stack includes a gate dielectric on the body, and a gate electrode on the gate dielectric. The transistor further includes a first metallization structure on a second portion of the body and a third metallization structure on a third portion of the body, opposite to the second portion. The transistor further includes a ferroelectric material on at least a fourth portion of the body, where the ferroelectric material is between the gate stack and the first or second metallization structure.
    Type: Application
    Filed: June 28, 2019
    Publication date: December 31, 2020
    Inventors: Seung Hoon Sung, Gilbert Dewey, Abhishek Sharma, Van H. Le, Jack Kavalieros
  • Patent number: 10878889
    Abstract: A high retention time memory element is described that has dual gate devices. A memory element has a write transistor with a gate having a source coupled to a write bit line, a gate coupled to a write line, and a drain coupled to a storage node, wherein a value is written to the storage node by enabling the gate and applying the value to the bit line, and a read transistor having a source coupled to a read line, a gate coupled to the storage node, and a drain coupled to a read bit line, wherein the value of the storage node is sensed by applying a current to the source and reading the sense line to determine a status of the gate.
    Type: Grant
    Filed: December 23, 2015
    Date of Patent: December 29, 2020
    Assignee: Intel Corporation
    Inventors: Rafael Rios, Gilbert Dewey, Van H. Le, Jack Kavalieros, Mesut Meterelliyoz
  • Publication number: 20200403081
    Abstract: Described is a transistor which includes: a source region; a drain region; and a gate region between the source and drain regions, wherein the gate region comprises: high-K dielectric material between spacers such that the high-K dielectric material is recessed; and metal electrode on the recessed high-K dielectric material. The gate recessed gate dielectric allows for using thick gate dielectric even with much advanced process technology nodes (e.g., 7 nm and below).
    Type: Application
    Filed: June 19, 2019
    Publication date: December 24, 2020
    Inventors: Seung Hoon Sung, Sou-Chi Chang, Ashish Verma Penumatcha, Nazila Haratipour, Matthew Metz, Michael Harper, Jack Kavalieros, Uygar Avci, Ian Young
  • Publication number: 20200395460
    Abstract: Described is a ferroelectric-based capacitor that improves reliability of a ferroelectric memory by providing tensile stress along a plane (e.g., x-axis) of a ferroelectric or anti-ferroelectric material of the ferroelectric/anti-ferroelectric based capacitor. Tensile stress is provided by a spacer comprising metal, semimetal, or oxide (e.g., metal or oxide of one or more of: Al, Ti, Hf, Si, Ir, or N). The tensile stress provides polar orthorhombic phase to the ferroelectric material and tetragonal phase to the anti-ferroelectric material. As such, memory window and reliability of the ferroelectric/anti-ferroelectric oxide thin film improves.
    Type: Application
    Filed: June 13, 2019
    Publication date: December 17, 2020
    Applicant: Intel Corporation
    Inventors: Nazila Haratipour, Sou-Chi Chang, Chia-Ching Lin, Jack Kavalieros, Uygar Avci, Ian Young
  • Publication number: 20200357929
    Abstract: Described is an apparatus which comprises: a gate comprising a metal; a first layer adjacent to the gate, the first layer comprising a dielectric material; a second layer adjacent to the first layer, the second layer comprising a second material; a third layer adjacent to the second layer, the third layer comprising a third material including an amorphous metal oxide; a fourth layer adjacent to the third layer, the fourth layer comprising a fourth material, wherein the fourth and second materials are different than the third material; a source partially adjacent to the fourth layer; and a drain partially adjacent to the fourth layer.
    Type: Application
    Filed: September 29, 2017
    Publication date: November 12, 2020
    Applicant: INTEL CORPORATION
    Inventors: Van H. Le, Abhishek A. Sharma, Gilbert Dewey, Kent Millard, Jack Kavalieros, Shriram Shivaraman, Tristan A. Tronic, Sanaz Gardner, Justin R. Weber, Tahir Ghani, Li Huey Tan, Kevin Lin
  • Publication number: 20200335610
    Abstract: Tunneling Field Effect Transistors (TFETs) are promising devices in that they promise significant performance increase and energy consumption decrease due to a steeper subthreshold slope (for example, smaller sub-threshold swing). In various embodiments, vertical fin-based TFETs can be fabricated in trenches, for example, silicon trenches. In another embodiment, vertical TFETs can be used on different material systems acting as a substrate and/or trenches (for example, Si, Ge, III-V semiconductors, GaN, and the like). In one embodiment, the tunneling direction in the channel of the vertical TFET can be perpendicular to the Si substrates. In one embodiment, this can be different than the tunneling direction in the channel of lateral TFETs.
    Type: Application
    Filed: February 28, 2018
    Publication date: October 22, 2020
    Applicant: Intel Corporation
    Inventors: Cheng-Ying Huang, Jack Kavalieros, Ian Young, Matthew Metz, Willy Rachmady, Uygar Avci, Ashish Agrawal, Benjamin Chu-Kung
  • Publication number: 20200312976
    Abstract: Techniques and mechanisms to provide electrical insulation between a gate and a channel region of a non-planar circuit device. In an embodiment, the gate structure, and insulation spacers at opposite respective sides of the gate structure, each extend over a semiconductor fin structure. In a region between the insulation spacers, a first dielectric layer extends conformally over the fin, and a second dielectric layer adjoins and extends conformally over the first dielectric layer. A third dielectric layer, adjoining the second dielectric layer and the insulation spacers, extends under the gate structure. Of the first, second and third dielectric layers, the third dielectric layer is conformal to respective sidewalls of the insulation spacers. In another embodiment, the second dielectric layer is of dielectric constant which is greater than that of the first dielectric layer, and equal to or less than that of the third dielectric layer.
    Type: Application
    Filed: March 25, 2019
    Publication date: October 1, 2020
    Applicant: Intel Corporation
    Inventors: Seung Hoon Sung, Jack Kavalieros, Ian Young, Matthew Metz, Uygar Avci, Devin Merrill, Ashish Verma Penumatcha, Chia-Ching Lin, Owen Loh
  • Publication number: 20200312841
    Abstract: Transistor structures including a non-planar body that has an active portion comprising a semiconductor material of a first height that is variable, and an inactive portion comprising an oxide of the semiconductor material of a second variable height, complementary to the first height. Gate electrodes and source/drain terminals may be coupled through a transistor channel having any width that varies according to the first height. Oxidation of a semiconductor material may be selectively catalyzed to convert a desired portion of a non-planar body into the oxide of the semiconductor material. Oxidation may be enhanced through the application of a catalyst, such as one comprising metal and oxygen, for example.
    Type: Application
    Filed: March 27, 2019
    Publication date: October 1, 2020
    Applicant: Intel Corporation
    Inventors: Willy RACHMADY, Cheng-Ying HUANG, Gilbert DEWEY, Jack KAVALIEROS, Caleb BARRETT, Jay P. GUPTA, Nishant GUPTA, Kaiwen HSU, Byungki JUNG, Aravind S. KILLAMPALLI, Justin RAILSBACK, Supanee SUKRITTANON, Prashant WADHWA
  • Publication number: 20200312978
    Abstract: Techniques and mechanisms for providing electrical insulation or other protection of an integrated circuit (IC) device with a spacer structure which comprises an (anti)ferromagnetic material. In an embodiment, a transistor comprises doped source or drain regions and a channel region which are each disposed in a fin structure, wherein a gate electrode and an underlying dielectric layer of the transistor each extend over the channel region. Insulation spacers are disposed on opposite sides of the gate electrode, where at least a portion of one such insulation spacer comprises an (anti)ferroelectric material. Another portion of the insulation spacer comprises a non-(anti)ferroelectric material. In another embodiment, the two portions of the spacer are offset vertically from one another, wherein the (anti)ferroelectric portion forms a bottom of the spacer.
    Type: Application
    Filed: March 25, 2019
    Publication date: October 1, 2020
    Applicant: Intel Corporation
    Inventors: Jack KAVALIEROS, Ian YOUNG, Matthew METZ, Uygar AVCI, Chia-Ching LIN, Owen LOH, Seung Hoon SUNG, Aditya KASUKURTI, Sou-Chi CHANG, Tanay GOSAVI, Ashish Verma PENUMATCHA
  • Patent number: 10784170
    Abstract: Architectures and techniques for co-integration of heterogeneous materials, such as group III-V semiconductor materials and group IV semiconductors (e.g., Ge) on a same substrate (e.g. silicon). In embodiments, multi-layer heterogeneous semiconductor material stacks having alternating nanowire and sacrificial layers are employed to release nanowires and permit formation of a coaxial gate structure that completely surrounds a channel region of the nanowire transistor. In embodiments, individual PMOS and NMOS channel semiconductor materials are co-integrated with a starting substrate having a blanket layers of alternating Ge/III-V layers. In embodiments, vertical integration of a plurality of stacked nanowires within an individual PMOS and individual NMOS device enable significant drive current for a given layout area.
    Type: Grant
    Filed: April 1, 2019
    Date of Patent: September 22, 2020
    Assignee: Intel Corporation
    Inventors: Marko Radosavljevic, Ravi Pillarisetty, Gilbert Dewey, Niloy Mukherjee, Jack Kavalieros, Willy Rachmady, Van Le, Benjamin Chu-Kung, Matthew Metz, Robert Chau
  • Publication number: 20200286685
    Abstract: Described is a ferroelectric based capacitor that reduces non-polar monoclinic phase and increases polar orthorhombic phase by epitaxial strain engineering in the oxide thin film and/or electrodes. As such, both memory window and reliability are improved. The capacitor comprises: a first structure comprising metal, wherein the first structure has a first lattice constant; a second structure comprising metal, wherein the second structure has a second lattice constant; and a third structure comprising ferroelectric material (e.g., oxide of Hf or Zr), wherein the third structure is between and adjacent to the first and second structures, wherein the third structure has a third lattice constant, and wherein the first and second lattice constants are smaller than the third lattice constant.
    Type: Application
    Filed: March 6, 2019
    Publication date: September 10, 2020
    Applicant: Intel Corporation
    Inventors: Chia-Ching Lin, Sou-Chi Chang, Ashish Verma Penumatcha, Nazila Haratipour, Seung Hoon Sung, Owen Y. Loh, Jack Kavalieros, Uygar E. Avci, Ian A. Young
  • Publication number: 20200286687
    Abstract: Described is an ultra-dense ferroelectric memory. The memory is fabricated using a patterning method by that applies atomic layer deposition with selective dry and/or wet etch to increase memory density at a given via opening. A ferroelectric capacitor in one example comprises: a first structure (e.g., first electrode) comprising metal; a second structure (e.g., a second electrode) comprising metal; and a third structure comprising ferroelectric material, wherein the third structure is between and adjacent to the first and second structures, wherein a portion of the third structure is interdigitated with the first and second structures to increase surface area of the third structure. The increased surface area allows for higher memory density.
    Type: Application
    Filed: March 7, 2019
    Publication date: September 10, 2020
    Applicant: Intel Corporation
    Inventors: Chia-Ching Lin, Sou-Chi Chang, Nazila Haratipour, Seung Hoon Sung, Ashish Verma Penumatcha, Jack Kavalieros, Uygar E. Avci, Ian A. Young
  • Publication number: 20200286686
    Abstract: Described is a ferroelectric-based capacitor that improves reliability of a ferroelectric memory by using low-leakage insulating thin film. In one example, the low-leakage insulating thin film is positioned between a bottom electrode and a ferroelectric oxide. In another example, the low-leakage insulating thin film is positioned between a top electrode and ferroelectric oxide. In yet another example, the low-leakage insulating thin film is positioned in the middle of ferroelectric oxide to reduce the leakage current and improve reliability of the ferroelectric oxide.
    Type: Application
    Filed: March 7, 2019
    Publication date: September 10, 2020
    Applicant: Intel Corporation
    Inventors: Chia-Ching Lin, Sou-Chi Chang, Ashish Verma Penumatcha, Nazila Haratipour, Seung Hoon Sung, Owen Y. Loh, Jack Kavalieros, Uygar E. Avci, Ian A. Young