Patents by Inventor Jang Ryul KIM

Jang Ryul KIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240029810
    Abstract: A memory system includes a memory; and a memory controller which includes a spare buffer suitable for storing an error location in the memory and data at the location, and commands the memory to perform a spare read operation when a read operation needs to be performed in a region of the memory including the error location.
    Type: Application
    Filed: October 6, 2023
    Publication date: January 25, 2024
    Inventors: Munseon JANG, Hoiju CHUNG, Jang Ryul KIM
  • Patent number: 11817169
    Abstract: A memory system includes a memory; and a memory controller which includes a spare buffer suitable for storing an error location in the memory and data at the location, and commands the memory to perform a spare read operation when a read operation needs to be performed in a region of the memory including the error location.
    Type: Grant
    Filed: November 22, 2021
    Date of Patent: November 14, 2023
    Assignee: SK hynix Inc.
    Inventors: Munseon Jang, Hoiju Chung, Jang Ryul Kim
  • Patent number: 11748007
    Abstract: A memory includes: a non-volatile memory suitable for storing a defect address; a register suitable for receiving and storing the defect address from the non-volatile memory during a boot-up operation, and receiving and storing an address that is input from an exterior during a register access operation; a comparison circuit suitable for comparing the address stored in the register with an address that is input from the exterior to produce a comparison result; redundant memory cells that are accessed according to the comparison result of the comparison circuit and a redundancy activation bit; and normal memory cells that are accessed according to the comparison result of the comparison circuit and the redundancy activation bit.
    Type: Grant
    Filed: June 22, 2021
    Date of Patent: September 5, 2023
    Assignee: SK hynix Inc.
    Inventors: Munseon Jang, Hoiju Chung, Jang Ryul Kim
  • Publication number: 20230222033
    Abstract: A method for operating a memory includes: reading data and an error correction code from a memory core; correcting an error of the read data based on the read error correction code to produce error-corrected data; generating new data by replacing a portion of the error-corrected data with write data, the portion becoming a write data portion; generating a new error correction code based on the new data; and writing the write data portion of the new data and the new error correction code into the memory core.
    Type: Application
    Filed: February 27, 2023
    Publication date: July 13, 2023
    Inventors: Munseon JANG, Hoi Ju CHUNG, Jang Ryul KIM
  • Patent number: 11698835
    Abstract: A method for operating a memory includes: reading data and an error correction code from a memory core; correcting an error of the read data based on the read error correction code to produce error-corrected data; generating new data by replacing a portion of the error-corrected data with write data, the portion becoming a write data portion; generating a new error correction code based on the new data; and writing the write data portion of the new data and the new error correction code into the memory core.
    Type: Grant
    Filed: May 25, 2021
    Date of Patent: July 11, 2023
    Assignee: SK hynix Inc.
    Inventors: Munseon Jang, Hoi Ju Chung, Jang Ryul Kim
  • Publication number: 20230056231
    Abstract: A memory system includes a memory; and a memory controller which includes a spare buffer suitable for storing an error location in the memory and data at the location, and commands the memory to perform a spare read operation when a read operation needs to be performed in a region of the memory including the error location.
    Type: Application
    Filed: November 22, 2021
    Publication date: February 23, 2023
    Inventors: Munseon JANG, Hoiju CHUNG, Jang Ryul KIM
  • Patent number: 11442810
    Abstract: A memory includes: a memory core including sequentially disposed N data cell regions and an ECC cell region respectively suitable for storing N data pieces of K bits and a corresponding ECC of M bits; and an error correction circuitry suitable for generating the ECC based on the data pieces and error-correcting the data pieces based on the ECC, through a check matrix configured by a message part of a [M×(K*N)] bit-dimension and an ECC part of a [M×M] bit-dimension, wherein the message part includes N characteristic indicator groups of a [M/2×K] bit-dimension, respectively corresponding to the data pieces, and each including K indicators of a [M/2×1] bit-dimension and having the same value, and wherein a hamming distance between the indicators respectively corresponding to the data pieces stored in neighboring ones among the data cell regions is 1 or M/2.
    Type: Grant
    Filed: May 26, 2021
    Date of Patent: September 13, 2022
    Assignee: SK hynix Inc.
    Inventors: Munseon Jang, Hoiju Chung, Jang Ryul Kim
  • Patent number: 11245769
    Abstract: The present invention pertains to an Internet of things platform which includes: a middleware that includes an apparatus management unit for receiving apparatus generated information from an Internet of things apparatus so as to establish a connection to the Internet of things apparatus, a service management unit for abstracting the Internet of things apparatus into a service apparatus and for controlling the Internet of things apparatus according to a service scenario, and a data management unit for generating and storing data regarding the apparatus management unit, the service management unit and the Internet of things apparatus; and a script editor that generates the service scenario for the service apparatus.
    Type: Grant
    Filed: January 5, 2018
    Date of Patent: February 8, 2022
    Assignee: SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
    Inventors: Soon Hoi Ha, Eun Jin Jeong, Hyun Jae Lee, Dong Hyun Kang, Jang Ryul Kim
  • Publication number: 20210397516
    Abstract: A memory includes: a memory core including sequentially disposed N data cell regions and an ECC cell region respectively suitable for storing N data pieces of K bits and a corresponding ECC of M bits; and an error correction circuitry suitable for generating the ECC based on the data pieces and error-correcting the data pieces based on the ECC, through a check matrix configured by a message part of a [M×(K*N)] bit-dimension and an ECC part of a [M×M] bit-dimension, wherein the message part includes N characteristic indicator groups of a [M/2×K] bit-dimension, respectively corresponding to the data pieces, and each including K indicators of a [M/2×1] bit-dimension and having the same value, and wherein a hamming distance between the indicators respectively corresponding to the data pieces stored in neighboring ones among the data cell regions is 1 or M/2.
    Type: Application
    Filed: May 26, 2021
    Publication date: December 23, 2021
    Inventors: Munseon JANG, Hoiju CHUNG, Jang Ryul KIM
  • Publication number: 20210397515
    Abstract: A method for operating a memory includes: reading data and an error correction code from a memory core; correcting an error of the read data based on the read error correction code to produce error-corrected data; generating new data by replacing a portion of the error-corrected data with write data, the portion becoming a write data portion; generating a new error correction code based on the new data; and writing the write data portion of the new data and the new error correction code into the memory core.
    Type: Application
    Filed: May 25, 2021
    Publication date: December 23, 2021
    Inventors: Munseon JANG, Hoi Ju CHUNG, Jang Ryul KIM
  • Publication number: 20210397355
    Abstract: A memory includes: a non-volatile memory suitable for storing a defect address; a register suitable for receiving and storing the defect address from the non-volatile memory during a boot-up operation, and receiving and storing an address that is input from an exterior during a register access operation; a comparison circuit suitable for comparing the address stored in the register with an address that is input from the exterior to produce a comparison result; redundant memory cells that are accessed according to the comparison result of the comparison circuit and a redundancy activation bit; and normal memory cells that are accessed according to the comparison result of the comparison circuit and the redundancy activation bit.
    Type: Application
    Filed: June 22, 2021
    Publication date: December 23, 2021
    Inventors: Munseon JANG, Hoiju CHUNG, Jang Ryul KIM
  • Patent number: 11030040
    Abstract: A memory device includes a write error check circuit suitable for detecting an error in received data using an error correction code during a write operation; and a memory core suitable for storing the received data and the received error correction code when no error is detected by the write error check circuit.
    Type: Grant
    Filed: July 5, 2018
    Date of Patent: June 8, 2021
    Assignee: SK hynix Inc.
    Inventors: Hoiju Chung, Young-Do Hur, Hyuk Lee, Jang-Ryul Kim
  • Patent number: 10915398
    Abstract: A memory system includes a memory controller including: a system error correction code generation circuit configured to generate a first system error correction code and a second system error correction code based on write data; and a memory including: a memory error correction code generation circuit configured to generate a first memory error correction code based on the write data transferred from the memory controller, and generate a second memory error correction code based on the second system error correction code transferred from the memory controller, and a memory core configured to store the write data, the first system error correction code, the second system error correction code, the first memory error correction code and the second memory error correction code.
    Type: Grant
    Filed: May 17, 2019
    Date of Patent: February 9, 2021
    Assignee: SK hynix Inc.
    Inventors: Hoiju Chung, Young-Do Hur, Hyuk Lee, Jang-Ryul Kim
  • Patent number: 10901842
    Abstract: A memory system includes a memory controller including: a system error correction code generation circuit configured to generate a first system error correction code based on write data, and generate a second system error correction code based on the write data and the first system error correction code; and a memory including: a memory error correction code generation circuit configured to generate a memory error correction code based on the write data and the first system error correction code transferred from the memory controller; and a memory core configured to store the write data, the first system error correction code, the second system error correction code and the memory error correction code.
    Type: Grant
    Filed: May 17, 2019
    Date of Patent: January 26, 2021
    Assignee: SK hynix Inc.
    Inventors: Hoiju Chung, Young-Do Hur, Hyuk Lee, Jang-Ryul Kim
  • Patent number: 10884848
    Abstract: A memory device includes: an in-memory error correction code generating circuit suitable for generating an in-memory error correction code based on a data received from a memory controller during a write operation; a memory core suitable for storing the received data and the in-memory error correction code during the write operation; an in-memory error correction circuit suitable for correcting an error of the data which is read from the memory core based on the in-memory error correction code which is read from the memory core during a read operation; and a data transmitter suitable for transferring the data whose error is corrected by the in-memory error correction circuit to the memory controller during the read operation, and transferring the data which is read from the memory core to the memory controller during a read retry operation.
    Type: Grant
    Filed: May 10, 2019
    Date of Patent: January 5, 2021
    Assignee: SK hynix Inc.
    Inventors: Hoiju Chung, Young-Do Hur, Hyuk Lee, Jang-Ryul Kim
  • Publication number: 20200389528
    Abstract: The present invention pertains to an Internet of things platform which includes: a middleware that includes an apparatus management unit for receiving apparatus generated information from an Internet of things apparatus so as to establish a connection to the Internet of things apparatus, a service management unit for abstracting the Internet of things apparatus into a service apparatus and for controlling the Internet of things apparatus according to a service scenario, and a data management unit for generating and storing data regarding the apparatus management unit, the service management unit and the Internet of things apparatus; and a script editor that generates the service scenario for the service apparatus.
    Type: Application
    Filed: January 5, 2018
    Publication date: December 10, 2020
    Applicant: SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
    Inventors: Soon Hoi Ha, Eun Jin Jeong, Hyun Jae Lee, Dong Hyun Kang, Jang Ryul Kim
  • Patent number: 10810080
    Abstract: A memory system includes an error correction code (“ECC”) generation circuit using write data to generate an ECC to be stored together with the write data; a memory device, during a write operation, storing received data and a received ECC in a memory core, and, during a read operation, checking for an error in data read from the memory core, correcting the error in read data using the ECC and outputting error-corrected data and the ECC, when the error in the read data is between one bit and N bits inclusive, and outputting the read data and the ECC when no error is present in the read data or the error in the read data exceeds N bits; and an error correction circuit correcting, when an error is present in data outputted from the memory device, the error in the data outputted using an ECC outputted from the memory device.
    Type: Grant
    Filed: July 5, 2018
    Date of Patent: October 20, 2020
    Assignee: SK hynix Inc.
    Inventors: Hoiju Chung, Young-Do Hur, Hyuk Lee, Jang-Ryul Kim
  • Publication number: 20190354435
    Abstract: A memory system includes a memory controller including: a system error correction code generation circuit configured to generate a first system error correction code based on write data, and generate a second system error correction code based on the write data and the first system error correction code; and a memory including: a memory error correction code generation circuit configured to generate a memory error correction code based on the write data and the first system error correction code transferred from the memory controller; and a memory core configured to store the write data, the first system error correction code, the second system error correction code and the memory error correction code.
    Type: Application
    Filed: May 17, 2019
    Publication date: November 21, 2019
    Inventors: Hoiju CHUNG, Young-Do HUR, Hyuk LEE, Jang-Ryul KIM
  • Publication number: 20190354436
    Abstract: A memory system includes a memory controller including: a system error correction code generation circuit configured to generate a first system error correction code and a second system error correction code based on write data; and a memory including: a memory error correction code generation circuit configured to generate a first memory error correction code based on the write data transferred from the memory controller, and generate a second memory error correction code based on the second system error correction code transferred from the memory controller, and a memory core configured to store the write data, the first system error correction code, the second system error correction code, the first memory error correction code and the second memory error correction code.
    Type: Application
    Filed: May 17, 2019
    Publication date: November 21, 2019
    Inventors: Hoiju CHUNG, Young-Do HUR, Hyuk LEE, Jang-Ryul KIM
  • Publication number: 20190347158
    Abstract: A memory device includes: an in-memory error correction code generating circuit suitable for generating an in-memory error correction code based on a data received from a memory controller during a write operation; a memory core suitable for storing the received data and the in-memory error correction code during the write operation; an in-memory error correction circuit suitable for correcting an error of the data which is read from the memory core based on the in-memory error correction code which is read from the memory core during a read operation; and a data transmitter suitable for transferring the data whose error is corrected by the in-memory error correction circuit to the memory controller during the read operation, and transferring the data which is read from the memory core to the memory controller during a read retry operation.
    Type: Application
    Filed: May 10, 2019
    Publication date: November 14, 2019
    Inventors: Hoiju CHUNG, Young-Do HUR, Hyuk LEE, Jang-Ryul KIM