Abstract: Systems and method for classifying manufacturing defects are disclosed. In one embodiment, a first data sample satisfying a first criterion is identified from a training dataset, and the first data sample is removed from the training dataset. A filtered training dataset including a second data sample is output. A first machine learning model is trained with the filtered training dataset. A second machine learning model is trained based on at least one of the first data sample or the second data sample. Product data associated with a manufactured product is received, and the second machine learning model is invoked for predicting confidence of the product data. In response to predicting the confidence of the product data, the first machine learning model is invoked for generating a classification based the product data.

Abstract: A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.

Abstract: A system and method for making predictions relating to products manufactured via a manufacturing process are disclosed. A processor receives input data and makes a first prediction based on the input data. The processor identifies a first machine learning model from a plurality of machine learning models based on the first prediction. The processor further makes a second prediction based on the input data and the first machine learning model, and transmits a signal to adjust the manufacturing of the products based on the second prediction.

Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.

Abstract: A method and a system are presented for controlling a performance of a fusion model. The method includes obtaining a first set and a second set of candidate models for a first and second neural networks, respectively. Each of the first and second set of candidate models is pre-trained with a first source and a second source, respectively. For each possible pairing of one candidate model from the first neural network and one candidate model from the second neural network, a model distance Dm is determined. A subset of possible pairings of one first candidate model and one second candidate model is selected based on the model distance Dm between them. Using the subset of possible parings, the first neural network and the second neural network are combined to generate two branches for a fusion model neural network.

Abstract: A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.

Abstract: A system and method for classifying products. A processor generates first and second instances of a first classifier, and trains the instances based on an input dataset. A second classifier is trained based on the input, where the second classifier is configured to learn a representation of a latent space associated with the input. A first supplemental dataset is generated in the latent space, where the first supplemental dataset is an unlabeled dataset. A first prediction is generated for labeling the first supplemental dataset based on the first instance of the first classifier, and a second prediction is generated for labeling the first supplemental dataset based on the second instance of the first classifier. Labeling annotations are generated for the first supplemental dataset based on the first prediction and the second prediction. A third classifier is trained based on at least the input dataset and the annotated first supplemental dataset.

Abstract: A system and method for classification. In some embodiments, the method includes forming a first training dataset and a second training dataset from a labeled input dataset; training a first classifier with the first training dataset; training a variational auto encoder with the second training dataset, the variational auto encoder comprising an encoder and a decoder; generating a third dataset, by feeding pseudorandom vectors into the decoder; labeling the third dataset, using the first classifier, to form a third training dataset; forming a fourth training dataset based on the third dataset; and training a second classifier with the fourth training dataset.

Abstract: A system and method for identifying line Mura defects on a display. The system is configured to generate a filtered image by preprocessing an input image of a display using at least one filter. The system then identifies line Mura candidates by converting the filtered image to a binary image, counting line components along a slope in the binary image, and marking a potential candidate location when the line components along the slope exceed a line threshold. Image patches are then generated with the candidate locations at the center of each image patch. The image patches are then classified using a machine learning classifier.

Abstract: A method for detecting a fault includes: receiving a plurality of time-series sensor data obtained in one or more manufacturing processes of an electronic device; arranging the plurality of time-series sensor data in a two-dimensional (2D) data array; providing the 2D data array to a convolutional neural network model; identifying a pattern in the 2D data array that correlates to a fault condition using the convolutional neural network model; providing a fault indicator of the fault condition in the one or more manufacturing processes of the electronic device; and determining that the electronic device includes a fault based on the fault indicator. The 2D data array has a dimension of an input data to the convolutional neural network model.

Abstract: A system includes a memory; and a processor configured to train a first machine learning model based on the first dataset labeling; provide the second dataset to the trained first machine learning model to generate an updated second dataset including an updated second dataset labeling, determine a first difference between the updated second dataset labeling and the second dataset labeling; train a second machine learning model based on the updated second dataset labeling if the first difference is greater than a first threshold value; provide the first dataset to the trained second machine learning model to generate an updated first dataset including an updated first dataset labeling, determine a second difference between the updated first dataset labeling and the first dataset labeling; and train the first machine learning model based on the updated first dataset labeling if the second difference is greater than a second threshold value.

Abstract: A system and method for white spot Mura defects on a display. The system is configured to pre-process an input images to generate a plurality of image patches. A feature vector is then extracted for each of the plurality of image patches. The feature vector includes at least one image moment feature and at least one texture feature. A machine learning classifier then determines the presence of a defect in each patch using the feature vector.

Abstract: A system and method for identifying white spot Mura defects on a display. The system and method generates a first filtered image by filtering an input image using a first image filter. First potential candidate locations are determined using the first filtered image. A second filtered image is generated by filtering an input image using a second image filter and second potential candidate locations are determined using the second filtered image. A list of candidate locations is produced, where the list of candidate locations is of locations in both the first potential candidate locations and the second potential candidate locations.

Abstract: A multi-touch display panel includes: a display panel configured to display an image according to image data; a multi-touch panel arranged over the display panel and configured to generate touch data; and a communication module configured to communicate with a remote device. The remote device includes a display panel and a touch screen, and the communication module is further configured to receive the image data from the remote device and to provide the touch data to the remote device.

Abstract: A virtual device for processing Web-based content to be displayed on a remote rendering device includes: a processor implemented by one or more cloud resources; and a memory, and the memory stores instructions that, when executed, cause the processor to: receive the content; detect an attribute of the remote rendering device and process the content according to the detected attribute; analyze the content to construct a render tree corresponding to the content; prepare render tree data for rendering by the remote rendering device, the render tree data corresponding to the constructed render tree; and transmit the render tree data over a communication network to the remote rendering device.

Abstract: A method for detecting one or more white spot MURA defects in a display panel includes receiving an image of the display panel, the image including the one or more white spot MURA defects, dividing the image into a plurality of patches, each one of the plurality of patches corresponding to an m pixel by n pixel area of the image (wherein m and n are integers greater than or equal to one), generating a plurality of feature vectors for the plurality of patches, each of the feature vectors corresponding to one of the plurality of patches and including one or more image texture features and one or more image moment features, and classifying each one of the plurality of patches based on a respective one of the plurality of feature vectors by utilizing a multi-class support vector machine to detect the one or more white spot MURA defects.

Abstract: A system and method for identifying line Mura defects on a display. The system is configured to generate a filtered image by preprocessing an input image of a display using at least one filter. The system then identifies line Mura candidates by converting the filtered image to a binary image, counting line components along a slope in the binary image, and marking a potential candidate location when the line components along the slope exceed a line threshold. Image patches are then generated with the candidate locations at the center of each image patch. The image patches are then classified using a machine learning classifier.

Abstract: A system and method for white spot Mura defects on a display. The system is configured to pre-process an input images to generate a plurality of image patches. A feature vector is then extracted for each of the plurality of image patches. The feature vector includes at least one image moment feature and at least one texture feature. A machine learning classifier then determines the presence of a defect in each patch using the feature vector.

Abstract: A system and method for identifying white spot Mura defects on a display. The system and method generates a first filtered image by filtering an input image using a first image filter. First potential candidate locations are determined using the first filtered image. A second filtered image is generated by filtering an input image using a second image filter and second potential candidate locations are determined using the second filtered image. A list of candidate locations is produced, where the list of candidate locations is of locations in both the first potential candidate locations and the second potential candidate locations.

Abstract: A method for detecting one or more white spot MURA defects in a display panel includes receiving an image of the display panel, the image including the one or more white spot MURA defects, dividing the image into a plurality of patches, each one of the plurality of patches corresponding to an m pixel by n pixel area of the image (wherein m and n are integers greater than or equal to one), generating a plurality of feature vectors for the plurality of patches, each of the feature vectors corresponding to one of the plurality of patches and including one or more image texture features and one or more image moment features, and classifying each one of the plurality of patches based on a respective one of the plurality of feature vectors by utilizing a multi-class support vector machine to detect the one or more white spot MURA defects.