Patents by Inventor Jay Small
Jay Small has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11173548Abstract: An apparatus includes an optical source situated to produce a fiducial source beam, and an optical fiducial pattern generator situated to produce with the fiducial source beam at least one transient optical fiducial on a laser processing target that is in a field of view of a laser scanner situated to scan a laser processing beam across the laser processing target, so that a positioning of the laser processing beam on the laser processing target becomes adjustable relative to the at least one transient optical fiducial.Type: GrantFiled: April 4, 2018Date of Patent: November 16, 2021Assignee: nLIGHT, Inc.Inventors: Jay Small, Robert J. Martinsen
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Publication number: 20210126435Abstract: Apparatus include a first laser diode situated to emit a beam from an exit facet along an optical axis, the beam as emitted having perpendicular fast and slow axes perpendicular to the optical axis, a first fast axis collimator (FAC) optically coupled to the beam as emitted from the exit facet and configured to direct the beam along a redirected beam axis having a non-zero angle with respect to the optical axis of the first laser diode, a second laser diode situated to emit a beam from an exit facet of the second laser diode along an optical axis parallel to the optical axis of the first laser diode and with a slow axis in a common plane with the slow axis of the first laser diode, and a second fast axis collimator (FAC) optically coupled to the beam as emitted from the exit facet of the second laser diode and configured to direct the beam along a redirected beam axis having a non-zero angle with respect to the optical axis of the second laser diode.Type: ApplicationFiled: November 9, 2020Publication date: April 29, 2021Applicant: nLIGHT, Inc.Inventors: Zhigang Chen, Manoj Kanskar, Shuang Li, Jim Zhang, Mark DeFranza, David Martin Hemenway, Eric Martin, Jay Small
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Publication number: 20200371285Abstract: An apparatus for scattering light may include: an optical fiber having a first length; and a sleeve, having a second length shorter than the first length, around the optical fiber. The optical fiber may include: a core; and cladding around the core. The sleeve may include fiber-optic material. The fiber-optic material may be substantially polymer-free. An outer surface of the sleeve may be roughened to scatter the light out of the sleeve through the roughened surface. A method of forming an apparatus for scattering light may include: providing a sleeve having a first length, the sleeve having inner and outer surfaces; providing an optical fiber having a second length longer than the first length; passing the sleeve around the optical fiber or threading the optical fiber through the sleeve; and roughening at least a portion of the outer surface of the sleeve.Type: ApplicationFiled: May 22, 2020Publication date: November 26, 2020Applicant: NLIGHT, INC.Inventors: Manoj KANSKAR, Shuang LI, Eric MARTIN, Jay SMALL, Jiamin ZHANG
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Patent number: 10833482Abstract: Apparatus include a first laser diode situated to emit a beam from an exit facet along an optical axis, the beam as emitted having perpendicular fast and slow axes perpendicular to the optical axis, a first fast axis collimator (FAC) optically coupled to the beam as emitted from the exit facet and configured to direct the beam along a redirected beam axis having a non-zero angle with respect to the optical axis of the first laser diode, a second laser diode situated to emit a beam from an exit facet of the second laser diode along an optical axis parallel to the optical axis of the first laser diode and with a slow axis in a common plane with the slow axis of the first laser diode, and a second fast axis collimator (FAC) optically coupled to the beam as emitted from the exit facet of the second laser diode and configured to direct the beam along a redirected beam axis having a non-zero angle with respect to the optical axis of the second laser diode.Type: GrantFiled: February 6, 2019Date of Patent: November 10, 2020Assignee: nLIGHT, Inc.Inventors: Zhigang Chen, Manoj Kanskar, Shuang Li, Jim Zhang, Mark DeFranza, David Martin Hemenway, Eric Martin, Jay Small
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Publication number: 20200292765Abstract: Some embodiments may include a method of generating assessment data in a system including a galvanometric scanning system (GSS) having a laser device to generate a laser beam and an X-Y scan head module to position the laser beam on a work piece. The method may include selecting a dimension based on a desired accuracy for validation (and/or a characteristic of an imaging system in embodiments that utilize an imaging system). The method may include commanding the GSS to draw a mark based on a polygon or ellipse of the selected dimension around a predetermined target point associated with the work piece to generate assessment data, and following operation of the GSS based on said commanding, validating a calibration of the GSS using the assessment data (or an image thereof in embodiments that utilize an imaging system). Other embodiments may be disclosed and/or claimed.Type: ApplicationFiled: March 12, 2020Publication date: September 17, 2020Applicant: NLIGHT, INC.Inventors: Jay Small, Ken Gross
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Publication number: 20200292806Abstract: Some embodiments may include a method assessing whether a dynamic focus module in a three axis galvanometric scanning system (three-axis GSS) is associated with a focus calibration error. The method may include identifying a reference layer associated with a surface of the work piece and positive and negative offset distances each a difference distance above or below the reference layer, respectively, and selecting a target pattern based on the offset distances, wherein the pattern includes an individual line for each offset distance. The method may include commanding the three-axis GSS to draw the target pattern on the work piece, and then assessing whether the dynamic focus module is associated with the focus calibration error by correlating laser marking artifacts on the work piece to ones of the individual lines of the selected pattern. Other embodiments may be disclosed and/or claimed.Type: ApplicationFiled: March 12, 2020Publication date: September 17, 2020Applicant: NLIGHT, INC.Inventors: Jay Small, Ken Gross
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Patent number: 10739579Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.Type: GrantFiled: April 18, 2019Date of Patent: August 11, 2020Assignee: nLIGHT, Inc.Inventors: Jay Small, Ken Gross, Vito P. Errico
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Publication number: 20200001396Abstract: Some embodiments may include a galvanometric laser system, comprising: a laser device to generate a laser beam; an X-Y scan head module to position the laser beam on a work piece, the X-Y scan head module including a laser ingress to receive the laser beam and a laser egress to output the laser beam; a support platen located below the laser egress; an in-machine imaging system integrated with the galvanometric laser, wherein a camera of the in-machine imaging system is arranged to view a surface of an object located on the support platen using one or more optical components of the X-Y scan head module to generate assessment data associated with a calibration of the X-Y scan head module by imaging the surface of the object, wherein a calibration fiducial is located on the surface of the object.Type: ApplicationFiled: August 30, 2019Publication date: January 2, 2020Applicant: NLIGHT, INC.Inventors: Aaron Brown, Jay Small, Robert J. Martinsen
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Publication number: 20190252863Abstract: Apparatus include a first laser diode situated to emit a beam from an exit facet along an optical axis, the beam as emitted having perpendicular fast and slow axes perpendicular to the optical axis, a first fast axis collimator (FAC) optically coupled to the beam as emitted from the exit facet and configured to direct the beam along a redirected beam axis having a non-zero angle with respect to the optical axis of the first laser diode, a second laser diode situated to emit a beam from an exit facet of the second laser diode along an optical axis parallel to the optical axis of the first laser diode and with a slow axis in a common plane with the slow axis of the first laser diode, and a second fast axis collimator (FAC) optically coupled to the beam as emitted from the exit facet of the second laser diode and configured to direct the beam along a redirected beam axis having a non-zero angle with respect to the optical axis of the second laser diode.Type: ApplicationFiled: February 6, 2019Publication date: August 15, 2019Applicant: nLIGHT, Inc.Inventors: Zhigang Chen, Manoj Kanskar, Shuang Li, Jim Zhang, Mark DeFranza, David Martin Hemenway, Eric Martin, Jay Small
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Publication number: 20190250398Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.Type: ApplicationFiled: April 18, 2019Publication date: August 15, 2019Applicant: nLIGHT, Inc.Inventors: Jay Small, Ken Gross, Vito P. Errico
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Patent number: 10295820Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.Type: GrantFiled: January 19, 2017Date of Patent: May 21, 2019Assignee: nLIGHT, Inc.Inventors: Jay Small, Ken Gross, Vito P. Errico
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Patent number: 10295405Abstract: A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.Type: GrantFiled: March 24, 2016Date of Patent: May 21, 2019Assignee: nLIGHT, Inc.Inventors: Scott R. Karlsen, Jay Small, Mitch Stanek, Vito P. Errico, Cary S. Kiest
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Publication number: 20180281067Abstract: An apparatus includes an optical source situated to produce a fiducial source beam, and an optical fiducial pattern generator situated to produce with the fiducial source beam at least one transient optical fiducial on a laser processing target that is in a field of view of a laser scanner situated to scan a laser processing beam across the laser processing target, so that a positioning of the laser processing beam on the laser processing target becomes adjustable relative to the at least one transient optical fiducial.Type: ApplicationFiled: April 4, 2018Publication date: October 4, 2018Applicant: nLIGHT, Inc.Inventors: Jay Small, Robert J. Martinsen
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Patent number: 9720244Abstract: An intensity distribution management system includes a light source, a mask for receiving light therefrom and for allowing some light to propagate through and past the mask, a surface for receiving light allowed past the mask, and a diffusive element disposed between the mask and the light source for ensuring a substantially even light intensity distribution in relation to the surface. An imaging method includes emitting a light beam, manipulating the beam to have a first numerical aperture across a first divergence axis, directing the beam through a diffusive element to increase the numerical aperture of the beam, directing the beam through one or more transmissive portions of a mask, the mask being disposed relative to the diffusive element, and imaging transmitted portions of the beam to a target surface wherein the beam has a substantially ripple-free and uniform intensity distribution across the first divergence axis at the target surface.Type: GrantFiled: September 30, 2011Date of Patent: August 1, 2017Assignee: nLIGHT, Inc.Inventors: Joseph V. DeBartolo, Jr., Scott Karlsen, Rob Martinsen, Jay Small
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Publication number: 20170205623Abstract: A method includes determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern, determining a set of scan optic actuation rates based on the set of initial scan optic actuation corrections, and updating the set of initial scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors.Type: ApplicationFiled: January 19, 2017Publication date: July 20, 2017Applicant: nLIGHT, Inc.Inventors: Jay Small, Ken Gross, Vito P. Errico
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Patent number: 9705289Abstract: An apparatus includes at least one multijunction diode laser situated to emit a plurality of beams along respective mutually parallel propagation axes, each beam having an associated mutually parallel slow axes and associated collinear fast axes, a fast axis collimator situated to receive and collimate the plurality of beams along the corresponding fast axes so as to produce corresponding fast axis collimated beams that propagate along associated non-parallel axes, and a reflector situated to receive the plurality of fast axis collimated beams and to reflect the beams so that the reflected fast axis collimated beams propagate along substantially parallel axes.Type: GrantFiled: December 30, 2015Date of Patent: July 11, 2017Assignee: NLIGHT, INC.Inventors: Manoj Kanskar, Raymond Kirk Price, Jay Small, David Martin Hemenway, Zhigang Chen
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Patent number: 9484707Abstract: Optical fibers that provide stable output beam sizes have core refractive indices that decrease non-monotonically from a core center to a core/cladding interface. A maximum refractive index of the core is situated at a radius of between about ½ and ¾ of the core radius so that a core center has a depressed refractive index. Such fibers are included in diode pumped solid state lasers to deliver pump laser power to a laser medium.Type: GrantFiled: December 30, 2013Date of Patent: November 1, 2016Assignee: nLIGHT, Inc.Inventors: Jay Small, Ken Gross, Shuang Li
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Publication number: 20160209267Abstract: A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.Type: ApplicationFiled: March 24, 2016Publication date: July 21, 2016Applicant: nLIGHT, Inc.Inventors: Scott R. Karlsen, Jay Small, Mitch Stanek, Vito P. Errico, Cary S. Kiest
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Publication number: 20160181764Abstract: An apparatus includes at least one multijunction diode laser situated to emit a plurality of beams along respective mutually parallel propagation axes, each beam having an associated mutually parallel slow axes and associated collinear fast axes, a fast axis collimator situated to receive and collimate the plurality of beams along the corresponding fast axes so as to produce corresponding fast axis collimated beams that propagate along associated non-parallel axes, and a reflector situated to receive the plurality of fast axis collimated beams and to reflect the beams so that the reflected fast axis collimated beams propagate along substantially parallel axes.Type: ApplicationFiled: December 30, 2015Publication date: June 23, 2016Inventors: Manoj Kanskar, Raymond Kirk Price, Jay Small, Marty Hemenway, Zhigang Chen
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Patent number: 9310248Abstract: A monitoring system for a multi-laser module includes detectors corresponding to each laser and situated to receive a portion of the associated laser beam uncombined with other beams. Laser characteristics are measured and stored, and in operation are used to identify device failures. A comparator receives a reference value and compares the reference value with a current operational value. If the current value is less that the reference value, a possible failure is indicated. Signal cross-coupling among the detectors is also used to identify undesirable scattering that can be associated with surface contamination or device failure.Type: GrantFiled: March 14, 2013Date of Patent: April 12, 2016Assignee: nLIGHT, Inc.Inventors: Scott R. Karlsen, Jay Small, Mitch Stanek, Vito Errico, Cary Kiest