Patents by Inventor Jeffrey Dickert

Jeffrey Dickert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Compact high precision adjustable beam defining aperture
    Patent number: 8476608
    Abstract: The present invention provides an adjustable aperture for limiting the dimension of a beam of energy. In an exemplary embodiment, the aperture includes (1) at least one piezoelectric bender, where a fixed end of the bender is attached to a common support structure via a first attachment and where a movable end of the bender is movable in response to an actuating voltage applied to the bender and (2) at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam. In an exemplary embodiment, the beam of energy is electromagnetic radiation. In an exemplary embodiment, the beam of energy is X-rays.
    Type: Grant
    Filed: June 26, 2012
    Date of Patent: July 2, 2013
    Assignee: The Regents of the University of California
    Inventors: Simon A. Morton, Jeffrey Dickert
  • Compact High Precision Adjustable Beam Defining Aperture
    Publication number: 20130020495
    Abstract: The present invention provides an adjustable aperture for limiting the dimension of a beam of energy. In an exemplary embodiment, the aperture includes (1) at least one piezoelectric bender, where a fixed end of the bender is attached to a common support structure via a first attachment and where a movable end of the bender is movable in response to an actuating voltage applied to the bender and (2) at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam. In an exemplary embodiment, the beam of energy is electromagnetic radiation. In an exemplary embodiment, the beam of energy is X-rays.
    Type: Application
    Filed: June 26, 2012
    Publication date: January 24, 2013
    Applicant: The Regents of the University of California
    Inventors: Simon A. Morton, Jeffrey Dickert
  • Refractometric analyzer
    Patent number: D419082
    Type: Grant
    Filed: January 21, 1999
    Date of Patent: January 18, 2000
    Assignee: Techniquip
    Inventors: Martin Wensley, Jeffrey Dickert