Refractometric analyzer

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Description

FIG. 1 is a perspective view of a refractometric analyzer showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is a left side elevational view thereof.

Referenced Cited
U.S. Patent Documents
D348849 July 19, 1994 Thompson
4890916 January 2, 1990 Rainer
5355211 October 11, 1994 Thompson et al.
5859696 January 12, 1999 Nicholas et al.
Patent History
Patent number: D419082
Type: Grant
Filed: Jan 21, 1999
Date of Patent: Jan 18, 2000
Assignee: Techniquip (Livermore, CA)
Inventors: Martin Wensley (Alameda, CA), Jeffrey Dickert (Pleasanton, CA)
Primary Examiner: Antoine Duval Davis
Attorney: Philip H. Townsend and Townsend and Crew Albert
Application Number: 0/99,428
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)
International Classification: 1004;