Publication number: 20090228846
Abstract: For application to analog, mixed-signal, and custom digital circuits, a system and method to do: global statistical optimization (GSO), global statistical characterization (GSC), global statistical design (GSD), and block-specific design. GSO can perform global yield optimization on hundreds of variables, with no simplifying assumptions. GSC can capture and display mappings from design variables to performance, across the whole design space. GSC can handle hundreds of design variables in a reasonable time frame, e.g., in less than a day, for a reasonable number of simulations, e.g., less than 100,000. GSC can capture design variable interactions and other possible nonlinearities, explicitly capture uncertainties, and intuitively display them. GSD can support the user's exploration of design-to-performance mappings with fast feedback, thoroughly capturing design variable interactions in the whole space, and allow for more efficiently created, more optimal designs.
Type:
Application
Filed:
March 3, 2009
Publication date:
September 10, 2009
Applicant:
SOLIDO DESIGN AUTOMATION INC.
Inventors:
Trent Lorne McCONAGHY, Pat DRENNAN, Joel COOPER, Jeffrey DYCK, David CALLELE, Shawn RUSAW, Samer SALLAM, Jiangdon GE, Anthony ARKLES, Kristopher BREEN, Sean COCKS