Abstract: An active real-time characterization system for monitoring the absorption and/or curing rate of a chemical substance applied to an outer surface of an article under test. Infrared and visible light sources controllably output a pulsed beam of coherent light directed at a particular area on the article under test where the chemical substance has been applied. A series of cameras, including a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, a sum-frequency camera and a third-order camera are configured to receive return beams of light. A processor controls the pulse rate of the light sources and the first visible light source and processes the signals received from the cameras to determine when the chemical substance applied to the outer surface of the article under test has been absorbed or has cured.

Abstract: An electrical device includes an electrical component configured to generate heat during operation of the electrical device. A thermal management coating is configured to transfer heat from the electrical component by thermal conduction. The thermal management coating comprises a non-carbon based topological insulator.

Abstract: An active real-time characterization system for identifying the presence of surface contaminants on to an outer surface of an article under test. Infrared and visible light sources controllably output a beam of coherent light directed at a particular area on the article under test, the infrared light source having an optical parametric oscillator coupled to an optical parametric amplifier. A series of cameras, including a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, a sum-frequency camera and a third-order camera each include an associated filter system and are each configured to receive return beams of light at predetermined frequencies controlled by the filter system. A processor determines whether the received signals have a spectral response that is different from a baseline spectral response thereby indicating that contaminants exist on the surface of the article under test.

Abstract: A system for providing active real-time characterization of an article under test is disclosed. First, second and third RF radiation sources each outputs and directs a beam of RF radiation at a particular area on the article under test. An RF receiver and a second harmonic generation RF receiver, a sum frequency receiver, and a third order receiver are each configured to receive a respective predetermined return beam of RF radiation from the particular area on the article under test. A processor receives signals from the receivers and calculates in real time respective spectroscopic signals and compares each calculated signal with each other calculated signal and with a predetermined baseline signal to ensure that the article under test conforms to an expected value.

Abstract: An active real-time characterization system for monitoring the absorption and/or curing rate of a chemical substance applied to an outer surface of an article under test. Infrared and visible light sources controllably output a pulsed beam of coherent light directed at a particular area on the article under test where the chemical substance has been applied. A series of cameras, including a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, a sum-frequency camera and a third-order camera are configured to receive return beams of light. A processor controls the pulse rate of the light sources and the first visible light source and processes the signals received from the cameras to determine when the chemical substance applied to the outer surface of the article under test has been absorbed or has cured.

Abstract: An active real-time characterization system for detecting unwanted elements and/or physical imperfections on a semiconductor wafer during manufacturing. Infrared and visible light sources output beams of coherent light directed at a particular area on the semiconductor wafer via associated polarizing control elements. A series of cameras, including a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, a sum-frequency camera and a third-order camera are configured to receive return beams of light via associated polarizing control elements. The polarizing control elements include a polarizer, a quarter wave plate and/or a half wave plate. A processor processes the signals received from the cameras to detect unwanted elements and/or physical imperfections on the semiconductor wafer.

Abstract: A system for providing active real-time characterization of an article under test. A broadband infrared light source outputs a beam of infrared light. The infrared light source is configured to direct the beam of infrared light at a particular area on the article under test. A broadband IR light detector is configured to receive a first predetermined return beam of light from the particular area on the article under test. A processor receives signals from the broadband IR light detector and calculates in real time a spectrally sensitive signal. The processor analyzes the calculated signal to ensure that the article under test conforms to an expected value.

Abstract: A system and method for providing active real-time characterization of an article under test. A first scan assembly moves an infrared light source and an first visible light source so that a beam of coherent infrared light and a first beam of visible light move across a surface of an article under test in a raster pattern. A second scan assembly moves a visible light camera, a visible light second harmonic generation camera, an infrared camera, an infrared second harmonic generation camera, and the sum-frequency camera so that each camera receives a respective predetermined return beam of light from the surface of the article under test. A processor receives signals from each camera and generates an image of mechanical properties of the surface of the article under test based on such signals.

Abstract: Methods and systems and components made according to the methods and systems, are disclosed relating to the generation of a holographic image, including a color-containing holographic image, generated exclusively optically addressing information to a projection system.

Abstract: Surface sensing methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy are disclosed herein. The methods include exposing a sampled location of the scanned surface to a visible light beam and exposing the sampled location to a tunable infrared beam such that the tunable infrared beam is at least partially coincident with the visible light beam. The methods also include varying a frequency of the tunable infrared beam an inducing optical resonance within an imaged structure that extends at least partially within the sampled location. The methods further include receiving at least a portion of an emitted light beam from the sampled location and scanning the visible light beam and the runnable infrared beam across the scanned portion of the scanned surface. The methods also include generating an image of the scanned portion of the scanned surface based upon the receiving and the scanning.

Abstract: A method of forming a coating can include: preparing a substrate surface with adherent characteristics; and/or applying at least one non-carbon-based topological insulator to the substrate surface to provide a topological insulator layer on the substrate surface. The at least one non-carbon-based topological insulator can have one or more of selected optical transmittance, selected thermal conductivity, selected electrical conductivity, or selected electrical resistivity.

Abstract: The present disclosure is directed to a particle shooter system. The particle shooter system comprises a non-carbon topological insulator nanotube defining a bore extending between first and second ends thereof. A particle shooter is operably coupled with the first end of the non-carbon topological insulator nanotube, and configured to transmit a single particle through the bore of the non-carbon topological insulator nanotube. A positioning mechanism is operably coupled with the non-carbon topological insulator nanotube and configured to aim the non-carbon topological insulator nanotube at a target disposed proximal the second end thereof.

Abstract: A method for increasing a service lifetime of an electronic component includes applying a topological insulator coating layer on a surface of the electronic component and performing a test on the electronic component with the topological insulator coating layer applied thereto. The electronic component with the topological insulator coating layer exhibits at least a 100% improvement during the test when compared to an otherwise equivalent electronic component without the topological insulator layer applied thereto. The electronic component with the topological insulator coating layer exhibits at least a 100% improvement during the test when compared to an otherwise equivalent electronic component with a graphene layer applied thereto. The test includes at least one of: a waterproofness test, an acetic acid test, a sugar solution test, and a methyl alcohol test.

Abstract: Provided is a coated optical element that includes: an optical element; and a coating disposed on the optical element. The coating includes at least one layer of a topological insulator.

Abstract: Various methods and devices for touch screens using topological insulators are provided. One of the touch screen devices includes a touch sensor layer including a three-dimensional “3D”) topological insulator that maintains an electric charge over opposing outer surfaces of the 3D topological insulator. The touch screen device also includes electrodes electrically connected the opposing outer surfaces of the 3D topological insulator. The touch screen device also includes a controller that determines a position at which an object touches the touch screen device based on a change in the electric charge over the opposing outer surfaces.

Abstract: An electrical device includes an electrical component configured lo generate heat during operation of the electrical device. A thermal management coating is configured to transfer heat from the electrical component by thermal conduction. The thermal management coating comprises a non-carbon based topological insulator.

Abstract: Various methods and devices for touch screens using topological insulators are provided. One of the touch screen devices includes a touch sensor layer including a three-dimensional (“3D”) topological insulator that maintains an electric charge over opposing outer surfaces of the 3D topological insulator. The touch screen device also includes electrodes electrically connected the opposing outer surfaces of the 3D topological insulator. The touch screen device also includes a controller that determines a position at which an object touches the touch screen device based on a change in the electric charge over the opposing outer surfaces.

Abstract: A method of forming a coating can include: preparing a substrate surface with adherent characteristics; applying charge of a first polarity to at least one non-carbon-based topological insulator with selected optical transmittance; and/or applying the charged at least one non-carbon-based topological insulator to the substrate surface to provide a topological insulator layer on the substrate surface. The at least one non-carbon-based topological insulator can have one or more of selected optical transmittance, selected thermal conductivity, selected electrical conductivity, or selected electrical resistivity.

Abstract: An electrical device includes an electrical component configured to generate heat during operation of the electrical device. A thermal management coating is configured to transfer heat from the electrical component by thermal conduction. The thermal management coating comprises a non-carbon based topological insulator.

Abstract: An example system for determining relative position information includes a plurality of positioning devices for determining relative position data within a three-dimensional space, each positioning device having a line of sight. The relative position data determined via each positioning device includes relative position data with respect to the positioning device for each other positioning device within its line of sight. The system further includes a plurality of imaging devices for obtaining image data of an object within the three-dimensional space. The system also includes a computing device configured to correlate the relative position data determined via the plurality of positioning devices and the image data obtained via the plurality of imaging devices, to thereby determine relative position information corresponding to the object within the three-dimensional space.