Patents by Inventor Jeffrey Hawthorne
Jeffrey Hawthorne has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11261529Abstract: A method for fabricating a metallic wire mesh touch sensor with reduced visibility. A metallic wire mesh is formed on a transparent substrate such that the surface of the metallic wires is roughened or textured, so as to cause high scattering of incident light, thereby minimizing specularly reflected light towards the user. The metal lines are formed over patterned catalytic photoresist. The rough or textured surface of the metallic wires is achieved by roughening or texturing the catalytic photoresist, by selecting parameters of electronless plating of copper, or both. An RMS surface roughness of about 50 nm would scatter approximately 70% of incident cyan light incident at 30°.Type: GrantFiled: March 31, 2020Date of Patent: March 1, 2022Assignee: FUTURETECH CAPITAL, INC.Inventors: Robert Routh, Michael Morrione, Jeffrey Hawthorne
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Patent number: 11157122Abstract: Touchscreen having a display device and a touch sensor adhered to the display device via optically clear adhesive; wherein the touch sensor comprises a transparent substrate; a top metal mesh divided into channels; a bottom metal mesh divided into channels; each of the top and bottom metal meshes having line spacing calculated to avoid first order moiré patterns and then the intersections of the lines randomized to avoid secondary order moiré patterns.Type: GrantFiled: June 3, 2020Date of Patent: October 26, 2021Assignee: FUTURETECH CAPITAL, INC.Inventors: Michael Morrione, Jeffrey Hawthorne
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Publication number: 20210301403Abstract: A method for fabricating a metallic wire mesh touch sensor with reduced visibility. A metallic wire mesh is formed on a transparent substrate such that the surface of the metallic wires is roughened or textured, so as to cause high scattering of incident light, thereby minimizing specularly reflected light towards the user. The metal lines are formed over patterned catalytic photoresist. The rough or textured surface of the metallic wires is achieved by roughening or texturing the catalytic photoresist, by selecting parameters of electronless plating of copper, or both. An RMS surface roughness of about 50 nm would scatter approximately 70% of incident cyan light incident at 30°.Type: ApplicationFiled: March 31, 2020Publication date: September 30, 2021Inventors: Robert Routh, Michael Morrione, Jeffrey Hawthorne
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Patent number: 7330583Abstract: Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing such as voltage imaging, electron beam sensing or charge sensing, in which the potential defect information obtained by the visual inspection system is combined with the potential defect information obtained by the electronic sensing system to produce a defect report. One or more high-resolution visual cameras are scanned over a stationary plate, and the image data from the camera(s) is processed to detect potential defects. A high-resolution electronic sensing system examines the stationary plate, and the image data from the sensor(s) is processed to detect potential defects. The potential defects from the visual image data and electronic sensing image data are processed to produce the final defect information.Type: GrantFiled: August 19, 2002Date of Patent: February 12, 2008Assignee: Photon Dynamics, Inc.Inventors: Bernard T. Clark, David L. Freeman, Jeffrey A. Hawthorne, Alexander J. Nagy, William K. Pratt
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Patent number: 7308157Abstract: A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation. The method includes capturing images of a display with R×S sensors; determining sets of sensor coordinates mapping to a pixel, determining multiple misalignment angles between the pixel on the display and the R×S sensors, determining multiple x scaling ratios, determining multiple weighting factors associated with R×S sensors in response to the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, determining multiple luminance values for R×S sensors, determining multiple total luminance values in response to the weighting factors and the luminance values, forming scaled images including first and second luminance values, and inspecting the scaled image to identify potential defects of the pixel on the display.Type: GrantFiled: February 2, 2004Date of Patent: December 11, 2007Assignee: Photon Dynamics, Inc.Inventors: Reza Safaee-Rad, Aleksander Crnatovic, Jeffrey Hawthorne, Branko Bukal, Ray Leerentveld
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Publication number: 20070010954Abstract: A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for imaging work function variations over an entire sample. The data is differential in that it represents changes in the work function (or geometry or surface voltage) across the surface of a sample. A vCPD probe is used to determine absolute CPD data for specific points on the surface of the sample. The combination of vibrating and non-vibrating CPD measurement modes allows the rapid imaging of whole-sample uniformity, and the ability to detect the absolute work function at one or more points.Type: ApplicationFiled: September 12, 2006Publication date: January 11, 2007Inventors: M. Steele, Jeffrey Hawthorne
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Publication number: 20060276976Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.Type: ApplicationFiled: August 15, 2006Publication date: December 7, 2006Inventors: M. Steele, Jeffrey Hawthorne
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Publication number: 20060202837Abstract: A tamper proof transdermal alcohol content monitoring device is made up of analog and digital sides which are securely attached to the human subject to be monitored. The analog side has a sampling circuit which draws a measured insensible skin perspiration sample from the skin of the subject and measured with an electrochemical fuel cell. A distance measurement of the device from the skin of the subject and temperature of the sample are monitored along with the transdermal alcohol content, and converted to digital signals which are transmitted to a modem when the monitor is in proximity to the modem. The signals are stored in the modem and uploaded to a central monitoring station. Automatic alerts may be sent from the central monitoring station to a supervising agency. The supervising agency may also access the information through secured dedicated websites via the Internet.Type: ApplicationFiled: April 25, 2006Publication date: September 14, 2006Applicant: Alcohol Monitoring Systems, LLCInventors: Jeffrey Hawthorne, Brian Phillips, Michael Iiams, William Roushey, Nolan Farmer
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Publication number: 20060202838Abstract: A tamper proof transdermal alcohol content monitoring device is made up of analog and digital sides which are securely attached to the human subject to be monitored. The analog side has a sampling circuit which draws a measured insensible skin perspiration sample from the skin of the subject and measured with an electrochemical fuel cell. A distance measurement of the device from the skin of the subject and temperature of the sample are monitored along with the transdermal alcohol content, and converted to digital signals which are transmitted to a modem when the monitor is in proximity to the modem. The signals are stored in the modem and uploaded to a central monitoring station. Automatic alerts may be sent from the central monitoring station to a supervising agency. The supervising agency may also access the information through secured dedicated websites via the Internet.Type: ApplicationFiled: April 25, 2006Publication date: September 14, 2006Applicant: Alcohol Monitoring Systems, LLCInventors: Jeffrey Hawthorne, Brian Phillips, Michael liams, William Roushey, Nolan Farmer
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Publication number: 20060202836Abstract: A tamper proof transdermal alcohol content monitoring device is made up of analog and digital sides which are securely attached to the human subject to be monitored. The analog side has a sampling circuit which draws a measured insensible skin perspiration sample from the skin of the subject and measured with an electrochemical fuel cell. A distance measurement of the device from the skin of the subject and temperature of the sample are monitored along with the transdermal alcohol content, and converted to digital signals which are transmitted to a modem when the monitor is in proximity to the modem. The signals are stored in the modem and uploaded to a central monitoring station. Automatic alerts may be sent from the central monitoring station to a supervising agency. The supervising agency may also access the information through secured dedicated websites via the Internet.Type: ApplicationFiled: April 25, 2006Publication date: September 14, 2006Applicant: Alcohol Monitoring Systems, LLCInventors: Jeffrey Hawthorne, Brian Phillips, Michael Iiams, William Roushey, Nolan Farmer
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Patent number: 7095883Abstract: A method for inspecting a display panel includes capturing images of a portion of a plurality of display panels having display elements with an image acquisition device having sensor elements, each image comprising an image of approximately a first number of display elements captured with approximately a second number of sensor elements, the first number different from the second number, each image including a Moiré artifact pattern, combining the images of the portion of the plurality of display panels to form a reference image including a Moiré artifact pattern reference, capturing a sample image of a portion of a sample display panel having display elements with the image acquisition device, the sample image comprising an image of approximately the first number of display elements on the sample display captured with approximately the second number of sensor elements, the sample image including a sample Moiré artifact pattern, combining the sample image with the reference image to inhibit the sample Moiré aType: GrantFiled: July 3, 2002Date of Patent: August 22, 2006Assignee: Photon Dynamics, Inc.Inventors: Reza Safaee-Rad, Aleksander Crnatovic, Jeffrey A. Hawthorne, Ray Leerentveld, William K. Pratt, Sunil S. Sawkar
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Publication number: 20050234658Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.Type: ApplicationFiled: June 17, 2005Publication date: October 20, 2005Inventors: M. Steele, Jeffrey Hawthorne
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Publication number: 20050177615Abstract: A bio-information monitoring system passively monitors a patient with a remote portable bio-information unit that takes various bio-information measurements at selected time intervals as well as at random times without patient intervention. The measurements are converted to digital signals which are transmitted from the bio-information unit to a modem when the bio-information unit is in proximity to the modem. The signals are stored in the modem and uploaded to a central monitoring network. Automatic alerts may be sent from the central monitoring network to a treatment provider. The treatment provider may also access the information through secured dedicated websites via the Internet.Type: ApplicationFiled: April 13, 2005Publication date: August 11, 2005Inventors: Jeffrey Hawthorne, Michael Iiams, Glenn Tubb, Richard Stoll, Gary Shoffner
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Publication number: 20050162178Abstract: A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for imaging work function variations over an entire sample. The data is differential in that it represents changes in the work function (or geometry or surface voltage) across the surface of a sample. A vCPD probe is used to determine absolute CPD data for specific points on the surface of the sample. The combination of vibrating and non-vibrating CPD measurement modes allows the rapid imaging of whole-sample uniformity, and the ability to detect the absolute work function at one or more points.Type: ApplicationFiled: March 11, 2005Publication date: July 28, 2005Inventors: M. Brandon Steele, Jeffrey Hawthorne
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Publication number: 20050163293Abstract: A bio-information monitoring system passively monitors a patient with a remote portable bio-information unit that takes various bio-information measurements at selected time intervals as well as at random times without patient intervention. The measurements are converted to digital signals which are transmitted from the bio-information unit to a modem when the bio-information unit is in proximity to the modem. The signals are stored in the modem and uploaded to a central monitoring network. Automatic alerts may be sent from the central monitoring network to a treatment provider. The treatment provider may also access the information through secured dedicated websites via the Internet.Type: ApplicationFiled: March 22, 2005Publication date: July 28, 2005Inventors: Jeffrey Hawthorne, Michael Iiams, Glenn Tubb, Richard Stoll, Gary Shoffner
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Patent number: 6882899Abstract: Methods, apparatuses, and systems are presented for positioning a sensing head relative to a workpiece, involving a control unit operative to provide a plurality of control signals to iteratively control positioning of the sensing head relative to the workpiece, a plurality of air injectors disposed and fixedly connected on a periphery of the sensing head, each of the air injectors capable of being independently controlled to eject a gas between the sensing head and the workpiece to create an air bearing and affect positioning of the sensing head relative to the workpiece in response to at least one of the control signals, and a plurality of sensors providing a plurality of feedback signals to the control unit, the feedback signals containing information relating to positioning of an optical imaging sensing head relative to the workpiece.Type: GrantFiled: May 15, 2001Date of Patent: April 19, 2005Assignee: Photon Dynamics, Inc.Inventors: David L. Baldwin, Alexander J. Nagy, Jeffrey A. Hawthorne, Jeffrey P. Sample, Thanh V. Dang
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Publication number: 20050059174Abstract: A method and system for identifying a defect or contamination on a surface of a material. The method and system involves providing a material, such as a semiconductor wafer, using a non-vibrating contact potential difference sensor to scan the wafer, generate contact potential difference data and processing that data to identify a pattern characteristic of the defect or contamination.Type: ApplicationFiled: August 5, 2004Publication date: March 17, 2005Inventors: M. Steele, Jeffrey Hawthorne, Chunho Kim, David Sowell
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Publication number: 20050016279Abstract: An apparatus having a non-vibrating contact potential probe. The non-vibrating contact potential probe is capable of measuring the chemical and geometrical irregularities on a rotating shaft. The chemical and geometrical information can be used to determine various properties of the rotating shaft.Type: ApplicationFiled: July 23, 2004Publication date: January 27, 2005Inventors: Jeffrey Hawthorne, M. Steele
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Publication number: 20040213449Abstract: A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation. The method includes capturing images of a display with R×S sensors; determining sets of sensor coordinates mapping to a pixel, determining multiple misalignment angles between the pixel on the display and the R×S sensors, determining multiple x scaling ratios, determining multiple weighting factors associated with R×S sensors in response to the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, determining multiple luminance values for R×S sensors, determining multiple total luminance values in response to the weighting factors and the luminance values, forming scaled images including first and second luminance values, and inspecting the scaled image to identify potential defects of the pixel on the display.Type: ApplicationFiled: February 2, 2004Publication date: October 28, 2004Applicant: Photon Dynamics, Inc.Inventors: Reza Safaee-Rad, Aleksander Crnatovic, Jeffrey Hawthorne, Branko Bukal, Ray Leerentveld
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Publication number: 20040032280Abstract: Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing such as voltage imaging, electron beam sensing or charge sensing, in which the potential defect information obtained by the visual inspection system is combined with the potential defect information obtained by the electronic sensing system to produce a defect report. One or more high-resolution visual cameras are scanned over a stationary plate, and the image data from the camera(s) is processed to detect potential defects. A high-resolution electronic sensing system examines the stationary plate, and the image data from the sensor(s) is processed to detect potential defects. The potential defects from the visual image data and electronic sensing image data are processed to produce the final defect information.Type: ApplicationFiled: August 19, 2002Publication date: February 19, 2004Inventors: Bernard T. Clark, David L. Freeman, Jeffrey A. Hawthorne, Alexander J. Nagy, William K. Pratt