Abstract: A ratchet wrench includes wrench body having a head which has a first side and a second side. A through hole is defined through the first and second sides. A first face and a second face are formed on the inner periphery of the through hole. The first face faces the first side. The second face faces the second side. A ratchet wheel is rotatably accommodated in the through hole and includes a first surface formed in a radial direction of the ratchet wheel, and the ratchet wheel further includes a second surface which extends in the axial direction of the ratchet wheel. The first surface contacts the second face. The second surface contacts the first face which is located substantially in an axial direction of the through hole. A sharp angle is formed between the first and second surfaces.

Abstract: A memory includes (n?1) non-volatile cells, (n?1) bit lines and a current driving circuit. Each of the (n?1) non-volatile cells includes a first terminal and a second terminal. An ith bit line of the (n?1) bit lines is coupled to a first terminal of an ith non-volatile cell of the (n?1) non-volatile cells. The current driving circuit includes n first transistors coupled to the (n?1) non-volatile cells.

Abstract: A semiconductor device includes a package and a cooling cover. The package includes a first die having an active surface and a rear surface opposite to the active surface. The rear surface has a cooling region and a peripheral region enclosing the cooling region. The first die includes micro-trenches located in the cooling region of the rear surface. The cooling cover is stacked on the first die. The cooling cover includes a fluid inlet port and a fluid outlet port located over the cooling region and communicated with the micro-trenches.

Abstract: A first MRAM set includes a first transistor and a second transistor. The first transistor includes a first gate structure, a first source/drain doping region and a first common source/drain doping region. The second transistor includes a second gate structure, a second source/drain doping region and the first common source/drain doping region. A second MTJ is disposed on the second transistor. The first common source/drain doping region electrically connects to the second MTJ. A first MTJ is disposed on the first transistor. The sizes of the first MTJ and the second MTJ are different. The second MTJ connects to the first MTJ in series. A bit line electrically connects the first MTJ. A source line electrically connects to the first source/drain doping region and the second source/drain doping region.

Abstract: A semiconductor package is provided. The semiconductor package includes a substrate and a semiconductor die over the substrate. A heat-dissipating feature covers the substrate and the semiconductor die, and a composite thermal interface material (TIM) structure is thermally bonded between the semiconductor die and the heat-dissipating feature. The composite TIM structure includes a metal-containing matrix material layer and polymer particles embedded in the metal-containing matrix material layer.

Abstract: A method for fabricating semiconductor device includes the steps of: forming a first fin-shaped structure on a substrate; forming a first single diffusion break (SDB) structure in the first fin-shaped structure; forming a first gate structure on the first SDB structure and a second gate structure on the first fin-shaped structure; forming an interlayer dielectric (ILD) layer around the first gate structure and the second gate structure; forming a patterned mask on the first gate structure; and performing a replacement metal gate (RMG) process to transform the second gate structure into a metal gate.

Abstract: A method for fabricating semiconductor device includes the steps of: forming a first fin-shaped structure on a substrate; forming a first single diffusion break (SDB) structure in the first fin-shaped structure; forming a first gate structure on the first SDB structure and a second gate structure on the first fin-shaped structure; forming an interlayer dielectric (ILD) layer around the first gate structure and the second gate structure; forming a patterned mask on the first gate structure; and performing a replacement metal gate (RMG) process to transform the second gate structure into a metal gate.

Abstract: A method for fabricating semiconductor device includes the steps of: forming a first fin-shaped structure on a substrate; forming a first single diffusion break (SDB) structure in the first fin-shaped structure; forming a first gate structure on the first SDB structure and a second gate structure on the first fin-shaped structure; forming an interlayer dielectric (ILD) layer around the first gate structure and the second gate structure; forming a patterned mask on the first gate structure; and performing a replacement metal gate (RMG) process to transform the second gate structure into a metal gate.

Abstract: A transistor includes a semiconductor channel layer, a gate structure, a gate insulation layer, an internal electrode, and a ferroelectric material layer. The gate structure is disposed on the semiconductor channel layer. The gate insulation layer is disposed between the gate structure and the semiconductor channel layer. The internal electrode is disposed between the gate insulation layer and the gate structure. The ferroelectric material layer is disposed between the internal electrode and the gate structure. A spacer is disposed on the semiconductor channel layer, and a trench surrounded by the spacer is formed above the semiconductor channel layer. The ferroelectric material layer is disposed in the trench, and the gate structure is at least partially disposed outside the trench. The ferroelectric material layer in the transistor of the present invention is used to enhance the electrical characteristics of the transistor.

Abstract: A transistor includes a semiconductor channel layer, a gate structure, a gate insulation layer, an internal electrode, and a ferroelectric material layer. The gate structure is disposed on the semiconductor channel layer. The gate insulation layer is disposed between the gate structure and the semiconductor channel layer. The internal electrode is disposed between the gate insulation layer and the gate structure. The ferroelectric material layer is disposed between the internal electrode and the gate structure. A spacer is disposed on the semiconductor channel layer, and a trench surrounded by the spacer is formed above the semiconductor channel layer. The ferroelectric material layer is disposed in the trench, and the gate structure is at least partially disposed outside the trench. The ferroelectric material layer in the transistor of the present invention is used to enhance the electrical characteristics of the transistor.

Abstract: A method for fabricating substrate of a semiconductor device includes the steps of: providing a first silicon layer; forming a dielectric layer on the first silicon layer; bonding a second silicon layer to the dielectric layer; removing part of the second silicon layer and part of the dielectric layer to define a first region and a second region on the first silicon layer, wherein the remaining of the second silicon layer and the dielectric layer are on the second region; and forming an epitaxial layer on the first region of the first silicon layer, wherein the epitaxial layer and the second silicon layer comprise same crystalline orientation.

Abstract: An oxide semiconductor transistor includes an oxide semiconductor channel layer, a metal gate, a gate insulation layer, an internal electrode, and a ferroelectric material layer. The metal gate is disposed on the oxide semiconductor channel layer. The gate insulation layer is disposed between the metal gate and the oxide semiconductor channel layer. The internal electrode is disposed between the gate insulation layer and the metal gate. The ferroelectric material layer is disposed between the internal electrode and the metal gate. The ferroelectric material layer in the oxide semiconductor transistor of the present invention is used to enhance the electrical characteristics of the oxide semiconductor transistor.

Abstract: A method for fabricating substrate of a semiconductor device includes the steps of: providing a first silicon layer; forming a dielectric layer on the first silicon layer; bonding a second silicon layer to the dielectric layer; removing part of the second silicon layer and part of the dielectric layer to define a first region and a second region on the first silicon layer, wherein the remaining of the second silicon layer and the dielectric layer are on the second region; and forming an epitaxial layer on the first region of the first silicon layer, wherein the epitaxial layer and the second silicon layer comprise same crystalline orientation.

Abstract: A method for fabricating substrate of a semiconductor device is disclosed. The method includes the steps of: providing a first silicon layer; forming a dielectric layer on the first silicon layer; bonding a second silicon layer to the dielectric layer; removing part of the second silicon layer and part of the dielectric layer to define a first region and a second region on the first silicon layer, wherein the remaining of the second silicon layer and the dielectric layer are on the second region; and forming an epitaxial layer on the first region of the first silicon layer, wherein the epitaxial layer and the second silicon layer comprise same crystalline orientation.

Abstract: A stylus includes a conductive rod, a circuit board, and an antenna. The conductive rod has a first opening. The circuit board is disposed in the conductive rod and includes a ground portion, wherein the conductive rod is electrically connected to the ground portion. The antenna includes a radiating portion and a feeding portion. The feeding portion is electrically connected to the circuit board and extends to the outside of the conductive rod via the first opening. The radiating portion is disposed at the outside of the conductive rod and is electrically connected to the feeding portion.

Abstract: A P-type field effect transistor includes: a gate area; an insulated area, adjacent to the gate area; a source region and a drain region made by silicon germanium, respectively, adjacent to the second side of the insulated area; a channel area, adjacent to the insulated area and formed between the source region and the drain region; a conductive layer, electrically connected to the source region and the drain region, respectively; and a plurality of capping layers, connected between the conductive layer and the source/drain regions, wherein the silicon layer(s) and the silicon germanium layer(s) are stacked alternately, and of which a silicon layer contacts the source/drain silicon germanium regions, while a silicon germanium layer contacts the conductive layer. The present invention also provides a complementary metal oxide semiconductor transistor including the P-type field effect transistor mentioned above.

Abstract: A P-type field effect transistor includes: a gate area; an insulated area, adjacent to the gate area; a source region and a drain region made by silicon germanium, respectively, adjacent to the second side of the insulated area; a channel area, adjacent to the insulated area and formed between the source region and the drain region; a conductive layer, electrically connected to the source region and the drain region, respectively; and a plurality of capping layers, connected between the conductive layer and the source/drain regions, wherein the silicon layer(s) and the silicon germanium layer(s) are stacked alternately, and of which a silicon layer contacts the source/drain silicon germanium regions, while a silicon germanium layer contacts the conductive layer. The present invention also provides a complementary metal oxide semiconductor transistor including the P-type field effect transistor mentioned above.

Abstract: A method for fabricating substrate of a semiconductor device is disclosed. The method includes the steps of: providing a first silicon layer; forming a dielectric layer on the first silicon layer; bonding a second silicon layer to the dielectric layer; removing part of the second silicon layer and part of the dielectric layer to define a first region and a second region on the first silicon layer, wherein the remaining of the second silicon layer and the dielectric layer are on the second region; and forming an epitaxial layer on the first region of the first silicon layer, wherein the epitaxial layer and the second silicon layer comprise same crystalline orientation.

Abstract: A method of characterizing a device may be used to determine a metal work function of the device according to a threshold voltage, a body effect, and an oxide capacitance of the device. The threshold voltage may be determined according to a current to voltage curve. The oxide capacitance may be determined according to a capacitor to voltage curve.

Abstract: A stylus includes a conductive rod, a circuit board, and an antenna. The conductive rod has a first opening. The circuit board is disposed in the conductive rod and includes a ground portion, wherein the conductive rod is electrically connected to the ground portion. The antenna includes a radiating portion and a feeding portion. The feeding portion is electrically connected to the circuit board and extends to the outside of the conductive rod via the first opening. The radiating portion is disposed at the outside of the conductive rod and is electrically connected to the feeding portion.