Abstract: A method of operating a metrology instrument includes generating relative motion between a probe and a sample at a scan frequency using an actuator. The method also includes detecting motion of the actuator using a position sensor that exhibits noise in the detected motion, and controlling the position of the actuator using a feedback loop and a feed forward algorithm. In this embodiment, the controlling step attenuates noise in the actuator position compared to noise exhibited by the position sensor in a bandwidth of about seven times the scan frequency. Scan frequencies up to a third of the first scanner resonance frequency or greater than 300 Hz are possible.

Abstract: Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (SPM), such as an atomic force microscope (AFM), using Peak Force Tapping (PFT) Mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined, and automatically controls a gain in a feedback loop. A gain control circuit automatically tunes a gain based on separation distances between a probe and a sample to facilitate stability. Accordingly, instability onset is quickly and accurately determined during scanning, thereby eliminating the need of expert user tuning of gains during operation.

Abstract: An anti-counterfeiting authentication method is provided. The method includes: generating an encrypted message corresponding to an i-th authentication step, wherein the i-th authentication step is one of n authentication steps arranged in a predetermined order, and 1?i?n; sending the encrypted message to a terminal device; receiving, from the terminal device, a call request for initiating the i-th authentication step; executing the i-th authentication step if the request is initiated based on the encrypted message; if the i-th authentication step succeeds and i is less than n, increasing i by one and repeating the generating of an encrypted message; if the i-th authentication step fails, sending an indication to the terminal device indicating an authentication failure; and if the i-th authentication step succeeds and i equals to n, sending an indication to the terminal device indicating an authentication success.

Abstract: An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.

Abstract: The invention relates to a short-flow process for desulfurization of circulating hydrogen and a device for the same. A short-flow process for desulfurization of circulating hydrogen is provided, comprising: (a) removing hydrocarbons from the circulating hydrogen mixture, so that the liquid drops of the heavy hydrocarbons in the dispersion phase are separated from the circulating hydrogen in the continuous phase, and a heavy hydrocarbon phase and a mixture phase of circulating hydrogen containing sulfur are obtained; (b) further separating the resultant mixture phase to remove the sulfides therein, so that circulating hydrogen without sulfur is obtained; (c) further separating the resultant circulating hydrogen without sulfur to remove the amine solution therein, so that purified circulating hydrogen is obtained. The invention also provides a device for desulfurization of circulating hydrogen.

Abstract: This disclosure provides systems, methods and apparatus for packaging a display device, such as an electromechanical systems (EMS) device, with a seal. In one aspect, the display device includes a seal or sealant surrounding a display region of the display device in contact with and between two substrates. The sealant can include an epoxy matrix with a plurality of first spacers and a plurality of second spacers. In some implementations, the first spacers can be about the same size and define a substrate-to-substrate gap between the two substrates. In some implementations, each of the second spacers can be smaller than the first spacers, where the second spacers have a water vapor transmission rate less than the epoxy.

Abstract: Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (SPM), such as an atomic force microscope (AFM), using Peak Force Tapping (PFT) Mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined and automatically controls a gain in a feedback loop. A gain control circuit automatically tunes a gain based on separation distances between a probe and a sample to facilitate stability. Accordingly, instability onset is quickly and accurately determined during scanning, thereby eliminating the need of expert user tuning of gains during operation.

Abstract: Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (SPM), such as an atomic force microscope (AFM), using Peak Force Tapping (PFT) Mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined, and automatically controls a gain in a feedback loop. A gain control circuit automatically tunes a gain based on separation distances between a probe and a sample to facilitate stability. Accordingly, instability onset is quickly and accurately determined during scanning, thereby eliminating the need of expert user tuning of gains during operation.

Abstract: Disclosed is a process for producing fluorinated organic compounds, including hydrofluoropropenes, which preferably comprises converting at least one compound of Formula (I): C(X)3CF2C(X)3??(I) to at least one compound of Formula (II) CF3CF?CHZ??(II) where each X and Z is independently H, F, Cl, I or Br, said process preferably not including any substantial amount of oxygen-containing catalyst in certain embodiments. Preferably Z is H.

Abstract: A method of operating a metrology instrument includes generating relative motion between a probe and a sample at a scan frequency using an actuator. The method also includes detecting motion of the actuator using a position sensor that exhibits noise in the detected motion, and controlling the position of the actuator using a feedback loop and a feed forward algorithm. In this embodiment, the controlling step attenuates noise in the actuator position compared to noise exhibited by the position sensor in a bandwidth of about seven times the scan frequency. Scan frequencies up to a third of the first scanner resonance frequency or greater than 300 Hz are possible.

Abstract: An anti-counterfeiting authentication method is provided. The method includes: generating an encrypted message corresponding to an i-th authentication step, wherein the i-th authentication step is one of n authentication steps arranged in a predetermined order, and 1?i?n; sending the encrypted message to a terminal device; receiving, from the terminal device, a call request for initiating the i-th authentication step; executing the i-th authentication step if the request is initiated based on the encrypted message; if the i-th authentication step succeeds and i is less than n, increasing i by one and repeating the generating of an encrypted message; if the i-th authentication step fails, sending an indication to the terminal device indicating an authentication failure; and if the i-th authentication step succeeds and i equals to n, sending an indication to the terminal device indicating an authentication success.

Abstract: An apparatus and method of collecting topography, mechanical property data and electrical property data with an atomic force microscope (AFM) in either a single pass or a dual pass operation. PFT mode is preferably employed thus allowing the use of a wide range of probes, one benefit of which is to enhance the sensitivity of electrical property measurement.

Abstract: Disclosed are processes for the production of fluorinated olefins, preferably adapted to commercialization of CF3CF?CH2 (1234yf). Three steps may be used in preferred embodiments in which a feedstock such as CCl2?CClCH2Cl (which may be purchased or synthesized from 1,2,3-trichloropropane) is fluorinated (preferably with HF in gas-phase in the presence of a catalyst) to synthesize a compound such as CF3CCl?CH2, preferably in a 80-96% selectivity. The CF3CCl?CH2 is preferably converted to CF3CFClCH3 (244-isomer) using a SbCl5 as the catalyst which is then transformed selectively to 1234yf, preferably in a gas-phase catalytic reaction using activated carbon as the catalyst. For the first step, a mixture of Cr2O3 and FeCl3/C is preferably used as the catalyst to achieve high selectivity to CF3CCl?CH2 (96%). In the second step, SbCl5/C is preferably used as the selective catalyst for transforming 1233xf to 244-isomer, CF3CFClCH3.

Abstract: This disclosure provides systems, methods and apparatus for displaying images and for manufacturing display devices. Such displays can be fabricated in part by joining two substrates via a conductive seal. A substantially planar contact pad on at least one of the substrates can be exposed through a passivation layer via laser ablation, enabling the conductive seal to make contact with circuitry formed on the substrate.

Abstract: Disclosed is a process for producing fluorinated organic compounds, including hydrofluoropropenes, which preferably comprises converting at least one compound of Formula (I): C(X)3CF2C(X)3??(I) to at least one compound of Formula (II) CF3CF?CHZ??(II) where each X and Z is independently H, F, Cl, I or Br, said process preferably not including any substantial amount of oxygen-containing catalyst in certain embodiments. Preferably Z is H.

Abstract: A method of operating a metrology instrument includes generating relative motion between a probe and a sample at a scan frequency using an actuator. The method also includes detecting motion of the actuator using a position sensor that exhibits noise in the detected motion, and controlling the position of the actuator using a feedback loop and a feed forward algorithm. In this embodiment, the controlling step attenuates noise in the actuator position compared to noise exhibited by the position sensor in a bandwidth of about seven times the scan frequency. Scan frequencies up to a third of the first scanner resonance frequency or greater than 300 Hz are possible.

Abstract: A multi-functional photochromic chiral nematic liquid crystal window comprises at least a photochromic chiral nematic liquid crystal layer. The windows are able to not only to darken in color upon exposure to sunlight irradiation but also control the light and the heat passing through them, which can be used as the windows of buildings, vehicles, and the like.

Abstract: A device, a system and a chip for controlling charging, and a user terminal are provided. The device for controlling charging includes: a battery detection circuit, a charging control circuit, a charging circuit and a charging interface circuit, wherein the charging circuit is connected with a battery, the battery detection circuit, the charging control circuit and the charging interface circuit respectively; the battery detection circuit is adapted for obtaining a voltage value of the battery; the charging interface circuit is connected with a charging power supply; and the charging control circuit is adapted for transmitting a charging control signal for increasing a charging current of the charging power supply through the charging interface circuit when the battery detection circuit detects that the voltage value of the battery is lower than a preset threshold value. The device for controlling charging can improve charging speed when battery power is low.

Abstract: A method of operating a metrology instrument includes generating relative motion between a probe and a sample at a scan frequency using an actuator. The method also includes detecting motion of the actuator using a position sensor that exhibits noise in the detected motion, and controlling the position of the actuator using a feedback loop and a feed forward algorithm. In this embodiment, the controlling step attenuates noise in the actuator position compared to noise exhibited by the position sensor over the scan bandwidth. Scan frequencies up to a third of the first scanner resonance frequency or greater than 300 Hz are possible.

Abstract: Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (SPM), such as an atomic force microscope (AFM), using Peak Force Tapping (PFT) Mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined and automatically controls a gain in a feedback loop. A gain control circuit automatically tunes a gain based on separation distances between a probe and a sample to facilitate stability. Accordingly, instability onset is quickly and accurately determined during scanning, thereby eliminating the need of expert user tuning of gains during operation.