Patents by Inventor Jianping Zhao

Jianping Zhao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10388528
    Abstract: This disclosure relates to a plasma processing system for controlling plasma density near the edge or perimeter of a substrate that is being processed. The plasma processing system may include a plasma chamber that can receive and process the substrate using plasma for etching the substrate, doping the substrate, or depositing a film on the substrate. This disclosure relates to a plasma processing system that may be configured to enable non-ambipolar diffusion to counter ion loss to the chamber wall. The plasma processing system may include a ring cavity coupled to the plasma processing system that is in fluid communication with plasma generated in the plasma processing system. The ring cavity may be coupled to a power source to form plasma that may diffuse ions into the plasma processing system to minimize the impact of ion loss to the chamber wall.
    Type: Grant
    Filed: May 25, 2016
    Date of Patent: August 20, 2019
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Lee Chen, Zhiying Chen, Jianping Zhao, Merritt Funk
  • Patent number: 10379252
    Abstract: Disclosed is a method and device for estimating weight of an object to be inspected in an inspection system. An effective atomic number and a high-energy gray value of the dual-energy corresponding to each pixel of the object to be inspected are obtained by a dual-energy radiation scanning. A mass-thickness value for a corresponding pixel is obtained from a pre-created mass-thickness attenuation curve by utilizing the effective atomic numbers and the high-energy gray value of the dual-energy for respective pixels. Weight information for at least a part of the object to be inspected is calculated by multiplying the mass-thickness value by the area of the pixel. Such a method may accurately calculate the weight of the object to be inspected and save the cost for a conventional weighing hardware.
    Type: Grant
    Filed: July 22, 2016
    Date of Patent: August 13, 2019
    Assignees: TSINGHUA UNIVERSITY, NUCTECH COMPANY LIMITED
    Inventors: Zhiqiang Chen, Yuanjing Li, Li Zhang, Ziran Zhao, Yaohong Liu, Juan Zheng, Jianping Gu, Chunguang Zong
  • Patent number: 10381745
    Abstract: Embodiments of the present invention provide a beam forming network, including: a first 180-degree bridge for equal-power division, a 180-degree bridge for unequal-power division, a 90-degree phase shifter, and a second 180-degree bridge for equal-power division. A coupling port of a sum input port of the first 180-degree bridge for equal-power division is connected to a difference input port of the 180-degree bridge for unequal-power division, a straight-through port of the sum input port of the first 180-degree bridge for equal-power division is connected to an input port of the 90-degree phase shifter, an output port of the 90-degree phase shifter is connected to a difference input port of the second 180-degree bridge for equal-power division, and a straight-through port of a sum input port of the 180-degree bridge for unequal-power division is connected to a sum input port of the second 180-degree bridge for equal-power division.
    Type: Grant
    Filed: January 26, 2017
    Date of Patent: August 13, 2019
    Assignee: Huawei Technologies Co., Ltd.
    Inventors: Yang Geng, Guanxi Zhang, Jianping Zhao
  • Publication number: 20190244358
    Abstract: A method for scene parsing includes: performing a convolution operation on a to-be-parsed image by using a deep neural network to obtain a first feature map, the first feature map including features of at least one pixel in the image; performing a pooling operation on the first feature map to obtain at least one second feature map, a size of the second feature map being less than that of the first feature map; and performing scene parsing on the image according to the first feature map and the at least one second feature map to obtain a scene parsing result of the image, the scene parsing result including a category of the at least one pixel in the image. A system for scene parsing and a non-transitory computer-readable storage medium can facilitate realizing the method.
    Type: Application
    Filed: April 16, 2019
    Publication date: August 8, 2019
    Applicant: BEIJING SENSETIME TECHNOLOGY DEVELOPMENT CO., LTD.
    Inventors: Jianping Shi, Hengshuang Zhao
  • Patent number: 10373701
    Abstract: Disclosed is method and apparatus for creating a statistical average model of an enamel-dentine junction. The method includes steps of acquiring CT image data of a tooth; segmenting the CT image data to obtain a surface of an enamel-dentine junction; segmenting the obtained surface using a curvature-based clustering algorithm to remove a bottom of the enamel-dentine junction; spherical-parameterizing, by means of spherical harmonic analysis, the surface of the enamel-dentine junction after removal of the bottom; and aligning different samples of the tooth to obtain a statistical average model.
    Type: Grant
    Filed: November 13, 2014
    Date of Patent: August 6, 2019
    Assignee: Nuctech Company Limited
    Inventors: Zhiqiang Chen, Yuanjing Li, Li Zhang, Ziran Zhao, Jianping Gu, Shuo Wang
  • Patent number: 10375812
    Abstract: A surface wave plasma (SWP) source couples microwave (MW) energy into a processing chamber through, for example, a radial line slot antenna, to result in a low mean electron energy (Te). An ICP source, is provided between the SWP source and the substrate and is energized at a low power, less than 100 watts for 300 mm wafers, for example, at about 25 watts. The ICP source couples energy through a peripheral electric dipole coil to reduce capacitive coupling.
    Type: Grant
    Filed: March 28, 2016
    Date of Patent: August 6, 2019
    Assignee: Tokyo Electron Limited
    Inventors: Jianping Zhao, Lee Chen, Merritt Funk, Radha Sundararajan
  • Publication number: 20190234904
    Abstract: A detection apparatus and a detection method are disclosed. In one aspect, the detection apparatus includes a sampling device for collecting samples to be checked. It further includes a sample pre-processing device configured to pre-process the sample from the sampling device. It further includes a sample analyzing device for separating samples from the pre-processing device and for analyzing the separated samples. The detection apparatus is miniaturized and highly precise, and is capable of quickly and accurately detecting gaseous phase or particulate substances, and it has applications for safety inspections at airports, ports, and subway stations.
    Type: Application
    Filed: April 5, 2019
    Publication date: August 1, 2019
    Inventors: Qingjun Zhang, Yuanjing Li, Zhiqiang Chen, Ziran Zhao, Yinong Liu, Yaohong Liu, Huishao He, Qiufeng Ma, Weiping Zhu, Xiang Zou, Jianping Chang, Song Liang
  • Publication number: 20190234905
    Abstract: A detection apparatus and a detection method are disclosed. In one aspect, the detection apparatus includes a sampling device for collecting samples to be checked. It further includes a sample pre-processing device configured to pre-process the sample from the sampling device. It further includes a sample analyzing device for separating samples from the pre-processing device and for analyzing the separated samples. The detection apparatus is miniaturized and highly precise, and is capable of quickly and accurately detecting gaseous phase or particulate substances, and it has applications for safety inspections at airports, ports, and subway stations.
    Type: Application
    Filed: April 5, 2019
    Publication date: August 1, 2019
    Inventors: Qingjun Zhang, Yuanjing Li, Zhiqiang Chen, Ziran Zhao, Yinong Liu, Yaohong Liu, Huishao He, Qiufeng Ma, Weiping Zhu, Xiang Zou, Jianping Chang, Song Liang
  • Patent number: 10354841
    Abstract: The present invention provides a SWP (surface wave plasma) processing system that does not create underdense conditions when operating at low microwave power and high gas pressure, thereby achieving a larger process window. The DC ring subsystem can be used to adjust the edge to central plasma density ratio to achieve uniformity control in the SWP processing system.
    Type: Grant
    Filed: April 7, 2016
    Date of Patent: July 16, 2019
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Jianping Zhao, Lee Chen, Barton G. Lane, Merritt Funk, Radha Sundararajan
  • Patent number: 10354837
    Abstract: The invention is an plasma processing system with a plasma chamber for processing semiconductor substrates, comprising: a radio frequency or microwave power generator coupled to the plasma chamber; a low pressure vacuum system coupled to the plasma chamber; and at least one chamber surface that is configured to be exposed to a plasma, the chamber surface comprising: a YxOyFz layer that comprises Y in a range from 20 to 40%, O in a range from greater than zero to less than or equal to 60%, and F in a range of greater than zero to less than or equal to 75%. Alternatively, the YxOyFz layer can comprise Y in a range from 25 to 40%, O in a range from 40 to 55%, and F in a range of 5 to 35% or Y in a range from 25 to 40%, O in a range from 5 to 40%, and F in a range of 20 to 70%.
    Type: Grant
    Filed: January 12, 2018
    Date of Patent: July 16, 2019
    Assignee: Tokyo Electron Limited
    Inventor: Jianping Zhao
  • Patent number: 10351967
    Abstract: The present invention provides a method for forming a sensitive film for neutron detection, wherein the sensitive film is formed by electrophoresis coating, the liquid used for electrophoresis coating includes neutron sensitive material, electrophoresis paint and deionized water, and the neutron sensitive material is 10B single substance, 10B compound or mixture containing 10B. The sensitive film for neutron detection has the high detection efficiency because of the high content of 10B. The sensitive film for neutron detection has the uniform and stable film thickness, and excellent consistency. The production efficiency and the cost of the sensitive film are improved.
    Type: Grant
    Filed: December 15, 2017
    Date of Patent: July 16, 2019
    Assignee: NUCTECH COMPANY LIMITED
    Inventors: Yongqiang Wang, Qingjun Zhang, Yuanjing Li, Ziran Zhao, Jianping Chang, Yanchun Wang, Lifeng Sun, Nan Bai, Xingliang Zhai
  • Patent number: 10339673
    Abstract: Disclosed is a dual-energy ray imaging method and system. The method comprises: calculating the mass thicknesses of the materials in the overlapped area of two materials by using a calibrated surface fitting method, and then decomposing a pair of original high-energy and low-energy data for this pixel into two high-low-energy data sets corresponding to the two materials, and finally calculating and acquiring the composition result of different materials for each pixel. The disclosure is especially advantageous in that the problem of error recognition of materials due to the two overlapped materials can be eliminated and the stratified imaging of multiple materials can be achieved, thereby improving the accuracy of the substance recognition and reducing the rate of false positive and false negative which is very important to the applications in the field of security check and anti-smuggling.
    Type: Grant
    Filed: December 23, 2015
    Date of Patent: July 2, 2019
    Assignees: Tsinghua University, Nuctech Company Limited
    Inventors: Liang Li, Zhiqiang Chen, Kejun Kang, Li Zhang, Ziran Zhao, Yuxiang Xing, Yongshun Xiao, Jianping Gu, Juan Zheng
  • Patent number: 10332244
    Abstract: A method and an apparatus for estimating an image fuzziness are provided. The method may comprise: acquiring an image; obtaining a multi-scale representation of the image by performing a multi-scale transform on the image; calculating gradients of the image and a normalized histogram of the gradients at each scale based on the multi-scale representation; calculating error vectors between the normalized histogram of gradients at each scale and a normalized original histogram of gradients of the image; performing a weighted summing on the error vectors by using respective weights to obtain a summed result, wherein the weights are determined based on a reciprocal of the sums of squares of the gradients of the image at each scale; estimating the ambiguity of the image based on the summed result.
    Type: Grant
    Filed: June 1, 2017
    Date of Patent: June 25, 2019
    Assignee: Nuctech Company Limited
    Inventors: Zhiqiang Chen, Yuanjing Li, Ziran Zhao, Yaohong Liu, Jianping Gu, Zhiming Wang
  • Patent number: 10333220
    Abstract: Embodiments of the present invention disclose an interleaved polarized multi-beam antenna, including: at least one dual-polarized antenna element, where the dual-polarized antenna element includes a +45-degree-polarized first antenna element and a ?45-degree-polarized second antenna element; and a first Butler matrix and a second Butler matrix, where the first Butler matrix is connected to the first antenna element so that the first antenna element transmits a first target beam, and the second Butler matrix is connected to the second antenna element so that the second antenna element transmits a second target beam. The first target beam and the second target beam in the embodiments are alternately arranged, and any two adjacent first target beam and second target beam have different polarization characteristics; therefore, complexity, a loss, and costs of implementation of a Butler matrix can be effectively reduced, and interference between adjacent multiplexed beams can be effectively decreased.
    Type: Grant
    Filed: June 28, 2017
    Date of Patent: June 25, 2019
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Jianping Zhao, Yang Geng, Qingming Xie
  • Publication number: 20190170894
    Abstract: This invention provides a scan method, scan system and radiation scan controller, and relates to the field of radiation. The scanning method includes obtaining detection data of an object to be inspected under radiation scanning using a detector, adjusting an accelerator output beam dose rate and/or an output electron beam energy level of a radiation emission device according to the detection data. With this method, working conditions of the accelerator of the radiation emission device may be adjusted according to the detection data detected by the detector, so that for a region having a larger mass thickness, a higher output beam dose rate or a higher electron beam output energy level is adopted to guarantee satisfied imaging technical indexes, for a region having a smaller mass thickness, a lower output beam dose rate or a lower electron beam output energy level is adopted to reduce the environmental dose level while guaranteeing satisfied imaging technical indexes.
    Type: Application
    Filed: January 22, 2019
    Publication date: June 6, 2019
    Inventors: Kejun KANG, Yaohong LIU, Ziran ZHAO, Wei JIA, Jianping GU, Chuanxiang TANG, Huaibi CHEN, Jianjun GAO, Wei YIN, Xiying LIU
  • Patent number: 10311757
    Abstract: The invention relates to the technical field of data hiding, in particular to a data hiding method and a data hiding system. An image is used as a data carrier; after secret data is converted into a bit sequence by a sending end, the values of each bit in the bit sequence are hidden in the image; the image hidden with the secret data is obtained and is sent to a receiving end; and the receiving end can extract the hidden secret data from the image according to a corresponding secret key. During data hiding, each square image block can hide two-bit data through inverse number odd-even properties of a pixel gray value sequence of two diagonal lines of each square image block, so that the volume of data hidden in the image is twice of the number of the image blocks split by the image.
    Type: Grant
    Filed: February 27, 2017
    Date of Patent: June 4, 2019
    Assignee: SHENZHEN UNIVERSITY
    Inventors: Dongning Zhao, Yong Zhang, Weixin Xie, Yanshan Li, Jianping Yu, Jianyong Chen
  • Patent number: 10301736
    Abstract: The invention relates to an inorganic aqueous surface treatment agent for a single-face electrogalvanized, chromium free surface treated steel plate, a single-face electrogalvanized, chromium-free surface treated steel plate used for fuel tanks and a process of making the same.
    Type: Grant
    Filed: January 14, 2014
    Date of Patent: May 28, 2019
    Assignee: Baoshan Iron & Steel Co., Ltd.
    Inventors: Yanliang Zhao, Yigang Dai, Jianping Zhang, Lan Zhu
  • Publication number: 20190156139
    Abstract: An inspection method and system for inspecting whether there is any liquor in goods is provided. The method includes: acquiring a radiation image of goods being inspected; processing on the radiation image to obtain an ROI; inspecting on the ROI using a liquor goods inspection model to determine if the ROI of the radiation image contains liquor goods. The above solution performs liquor inspection on scanned images of goods, especially containers, so as to intelligently assist the image inspectors.
    Type: Application
    Filed: January 23, 2019
    Publication date: May 23, 2019
    Inventors: Zhiqiang CHEN, Li ZHANG, Ziran ZHAO, Yaohong LIU, Duokun ZHANG, Jianping GU, Qiang LI, Jian ZHANG
  • Publication number: 20190148113
    Abstract: A system and method for using plasma to treat a substrate are described. The system includes a substrate holder disposed within a plasma processing system, and arranged to support a substrate, a first signal generator for coupling a first signal at a first frequency to plasma in the plasma processing system, and a second signal generator for coupling a second signal at a second frequency to plasma in the plasma processing system, wherein the second frequency being less than the first frequency. The system further includes an amplitude modulation circuit for modulating the first signal between a high amplitude state and a low amplitude state in response to an amplitude modulation signal, and a timing circuit configured to define the amplitude modulation signal that synchronizes the amplitude modulation of the first signal with a target phase for each cycle of the second signal.
    Type: Application
    Filed: September 21, 2018
    Publication date: May 16, 2019
    Inventors: Jianping Zhao, Peter L. G. Ventzek, Barton Lane
  • Patent number: 10289699
    Abstract: A vehicle inspection method and system are disclosed. In one aspect, the method includes acquiring a transmission image of an inspected vehicle. The method further includes acquiring a transmission image template of a vehicle model corresponding to the model of the inspected vehicle from a database. The method further includes performing registration on the transmission image of the inspected vehicle and the transmission image template. The method further includes determining a difference between a transmission image after the registration and a transmission image template after the registration, to obtain a difference area of the transmission image of the vehicle relative to the transmission image template. The method further includes processing the difference area to determine whether the vehicle carries a suspicious object or not.
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: May 14, 2019
    Assignees: Tsinghua University, Nuctech Company Limited
    Inventors: Zhiqiang Chen, Li Zhang, Ziran Zhao, Yaohong Liu, Jianping Gu, Zheng Hu, Qiang Li