Abstract: Disclosed in the present application are a concrete protection material, and a preparation method and a construction method therefor. The concrete protection material consists of 50%-90% of a component A and 10%-50% of a component B in percentage by weight, where the component A is prepared from 30%-65% of organic silicon, 2%-5% of nano-silicon dioxide and the balance of an organic solvent in percentage by weight; and the component B is prepared from 20%-50% of an organic base and the balance of water in percentage by weight. The present application not only can form nano-particles having a strengthening effect in capillary channels of a concrete surface layer, but also can achieve a technical effect of superhydrophobicity on the concrete surface layer.

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a bipolar transistor with self-aligned asymmetric spacer and methods of manufacture. The structure includes: a base formed on a semiconductor substrate; an asymmetrical spacer surrounding the base; an emitter on a first side of the base and separated from the base by the asymmetrical spacer; and a collector on a second side of the base and separated from the base by the asymmetrical spacer.

Abstract: A device and method for enhancing nitrogen and phosphorus removal based on a multistage AO partial denitrification coupled with Anammox process in combination with a sludge hydrolytic acidification mixture belong to the technical field of active sludge method wastewater treatment. A system includes a water tank, a water pump, a biochemical reaction zone, a hydrolytic acidification tank and other devices.

Abstract: A lithium battery power display method and corresponding system, the method includes: during charging process of lithium battery, periodically calculating SOC value charged in this charging through a current integration method (S10); obtaining a sum of the SOC value displayed before charging and the SOC value charged, determining whether it is in a predetermined charging platform area (S11); when determination result is in the predetermined charging platform area and it is determined the correction trigger condition is met, a correction coefficient is calculated according to pre-calibrated formula, the SOC value to be displayed is obtained by correcting the SOC value charged with the correction coefficient, the correction coefficient is positive number less than 1 (S12); displaying the SOC value to be displayed (S13). Solve virtual electricity caused by large SOC error in non-full charge and discharge state of lithium batteries, improve experience of lithium battery electric vehicles.

Abstract: A substrate is provided. The substrate includes a base, a semiconductor layer over the base, and an insulator layer between the base and the semiconductor layer. The semiconductor layer has a first semiconductor layer portion having a first thickness, a second semiconductor layer portion having a second thickness, and a third semiconductor layer portion having a third thickness, and the first thickness, the second thickness, and the third thickness are different from each other.

Abstract: The invention provides a modified dolomite powder, a preparation method thereof, and a concrete. The modified dolomite powder is prepared from 98% to 99% of a dolomite powder, 0.2% to 0.5% of a chaotropic agent, 0.6% to 1.0% of a dihydrogen phosphate, and 0.2% to 0.5% of a capillary filler according to the mass percentage. The chaotropic agent is one or more of sodium sulfate, potassium sulfate, and ammonium sulfate. By promoting the dissolution of the surface of the dolomite powder, participating in the hydration reaction, and filling capillary pores, the triple modification solves the problems of bleeding, strength, and durability of the dolomite powder concrete in the related art. The obtained modified dolomite powder has good solubility and high chemical activity, and the prepared concrete has high strength and compactness, low porosity, and good durability.

Abstract: Disclosed are a semiconductor structure and method of forming the structure. The structure includes a field effect transistor (FET) with a channel region between source/drain regions that extend through a semiconductor layer and into an insulator layer, that include a first portion in the insulator layer, and a second portion on the first portion in the semiconductor layer and, optionally, extending above the semiconductor layer. The first portion is relatively wide, includes a shallow section below the second portion, and a deep section adjacent to the channel region and overlayed by the semiconductor layer. The uniquely shaped first portion boosts saturation current to be boosted to allow the height of the second portion to be reduced to minimize overlap capacitance. Optionally, each source/drain region includes multiple semiconductor materials including a stress-inducing semiconductor material grown laterally from the semiconductor layer to improve charge carrier mobility in the channel region.

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to semiconductor devices with a shared common backside well and methods of manufacture. The structure includes: adjacent gate structures over a semiconductor substrate; a common well in the semiconductor substrate under the adjacent gate structures; a deep trench isolation structure extending through the common well between the adjacent gate structures; and a shared diffusion region between the adjacent gate structures.

Abstract: Semiconductor structures include a channel region, a gate dielectric on the channel region, source and drain structures on opposite sides of the channel region, and a gate conductor between the source and drain structures on the gate dielectric. The source and drain structures include source and drain silicides. The gate conductor includes a gate conductor silicide. The gate conductor silicide is thicker than the source and drain silicides.

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a bipolar transistor with self-aligned asymmetric spacer and methods of manufacture. The structure includes: a base formed on a semiconductor substrate; an asymmetrical spacer surrounding the base; an emitter on a first side of the base and separated from the base by the asymmetrical spacer; and a collector on a second side of the base and separated from the base by the asymmetrical spacer.

Abstract: Structures for a transistor and methods of forming a structure for a transistor. The structure includes a first dielectric spacer, a second dielectric spacer, and a gate laterally between the first dielectric spacer and the second dielectric spacer. The gate includes a first silicide layer extending from the first dielectric spacer to the second dielectric spacer. The structure further includes a second silicide layer within the first silicide layer, and a contact that is aligned to the second silicide layer.

Abstract: Disclosed are a semiconductor structure and method of forming the structure. The structure includes a field effect transistor (FET) with a channel region between source/drain regions that extend through a semiconductor layer and into an insulator layer, that include a first portion in the insulator layer, and a second portion on the first portion in the semiconductor layer and, optionally, extending above the semiconductor layer. The first portion is relatively wide, includes a shallow section below the second portion, and a deep section adjacent to the channel region and overlayed by the semiconductor layer. The uniquely shaped first portion boosts saturation current to be boosted to allow the height of the second portion to be reduced to minimize overlap capacitance. Optionally, each source/drain region includes multiple semiconductor materials including a stress-inducing semiconductor material grown laterally from the semiconductor layer to improve charge carrier mobility in the channel region.

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to semiconductor devices with a shared common backside well and methods of manufacture. The structure includes: adjacent gate structures over a semiconductor substrate; a common well in the semiconductor substrate under the adjacent gate structures; a deep trench isolation structure extending through the common well between the adjacent gate structures; and a shared diffusion region between the adjacent gate structures.

Abstract: A highly thixotropic 3D printing concrete and a manufacturing method therefor are provided. The weight percentage of each component calculated per cube of concrete is: 35-40% of cement, 0.1-0.4% of polycarboxylate superplasticizer, 0.1-0.4% of polypropylene fiber, 1.0-3.0% of special thixotropic agent for 3D printing concrete, and 12.5-14.5% of water, and the remainder is sand.

Abstract: A highly thixotropic 3D printing concrete and a manufacturing method therefor are provided. The weight percentage of each component calculated per cube of concrete is: 35-40% of cement, 0.1-0.4% of polycarboxylate superplasticizer, 0.1-0.4% of polypropylene fiber, 1.0-3.0% of special thixotropic agent for 3D printing concrete, and 12.5-14.5% of water, and the remainder is sand.

Abstract: An equal-fork pallet comprising a pallet body is provided. The pallet body is provided with a stand structure and a reinforcing structure, the reinforcing structure is a reinforcing rib embodied by a groove structure pressed on the surface of the pallet body, and the reinforcing rib comprises a connection type reinforcing rib and a semi-partition type reinforcing rib, the stand structure comprises a corner stand, an edge stand and a center stand, and neither end of the partition type reinforcing rib is connected to the stand. The equal-fork pallet has a reasonable structural design and strong pressure bearing capacity, with targeted layout and design of the reinforcing rib centralized position and stress concentration position such as stand. The pallet can overcome the problems of low local compressive strength and proneness to produce stress fracture and local cracking.

Abstract: Structures for a field-effect transistor and methods of forming a field-effect transistor. A gate structure of the field-effect transistor is arranged over an active region comprised of a semiconductor material. A first sidewall spacer is arranged adjacent to the gate structure. A second sidewall spacer includes a section arranged between the first sidewall spacer and the active region. The first sidewall spacer is composed of a low-k dielectric material.

Abstract: A method of forming a logic or memory cell with an epi-RSD width of larger than 1.3× fin pitch and the resulting device are provided. Embodiments include a device including a RSD region formed on each of a plurality of fins over a substrate, wherein the RSD has a width larger than 1.3× fin pitch, a TS formed on the RSD, and an ILD formed over the TS.

Abstract: The present invention provides a method for processing a molded tray based on bamboo shavings, comprising: extracting, crushing, mixing, drying, separating by wind separation, heat balance treatment, mixing glue, paving and hot pressing, cooling and grinding, inspecting and warehousing. In the invention, the industrial trays are manufactured by bamboo materials. The bamboo materials do not include bamboo peels and other impurities. The use of bamboo materials can improve the quality of trays from raw materials and increase the strength of trays. The industrial trays made by the processing method of the present invention have increased the weight supporting capacity by at least 1.5 times compared to ordinary trays, and the product's service life is 3 to 5 years in normal uses (no water soaking, no overpressure).

Abstract: Structures that include a single diffusion break and methods of forming a single diffusion break. A source/drain region is arranged inside a first cavity in a semiconductor fin, and a dielectric layer is arranged inside a second cavity in the semiconductor fin. A liner, which is composed of a dielectric material, includes a section that is arranged inside the second cavity laterally between the dielectric layer and the source/drain region.