Abstract: Various examples described herein include various mechanisms, techniques, and methods to subtract collected signals caused by a periodic pattern formed on substrates to enable a higher level of defect detection on substrates. Signals detected by various types of metrology and substrate-inspection systems that are caused by periodic patterns on inspected substrates can be reduced or eliminated by, for example, a Fourier analysis of the detected signals. Both gray-scale value thresholds and area thresholds may be applied after the Fourier analysis of the image and are sufficient for defect detection on an image with a substantially-reduced number of false defects or no defects being present in a final image produced after processing. Other techniques and methods are also disclosed.

Abstract: The photovoltaic cell sheet includes: a cell sheet body having a first end and a second end opposite to each other in a width direction of the cell sheet body, wherein the first end of the cell sheet body is provided with a plurality of sawtooth spacing along a length direction of the cell sheet body; a first main gate arranged at one side of front and back sides of the plurality of sawtooth and serving as a first electrode; and a second main gate arranged at another side of the front and back sides of the cell sheet body and serving as a second electrode, wherein the second main gate is adjacent to the second end of the cell sheet body.

Abstract: The photovoltaic cell sheet includes: a cell sheet body having a first end and a second end opposite to each other in a width direction of the cell sheet body, wherein the first end of the cell sheet body is provided with a plurality of sawtooth spacing along a length direction of the cell sheet body; a first main gate arranged at one side of front and back sides of the plurality of sawtooth and serving as a first electrode; and a second main gate arranged at another side of the front and back sides of the cell sheet body and serving as a second electrode, wherein the second main gate is adjacent to the second end of the cell sheet body.

Abstract: An embodiment rotor includes a stacked core including stacked lamination sheets. The lamination sheets include lamination segments arranged in a circle, the stacked core has an upper layer lamination segment coupled to a lower layer lamination segment with a phase difference therebetween of a first angle with respect to a center of the stacked core, the stacked lamination segments have keys arranged in a straight line on an inner surface of the stacked core so that the keys are inserted into a key way disposed in a motor shaft in an axial direction, the lamination segments have a substantially identical shape and are arranged with an interval of a second angle with respect to a center of the rotor thus having a substantially identical pattern, and the lamination segments include upper and lower layer coupling portions repeatedly disposed at intervals of the second angle in a circumferential direction.

Abstract: A fault-tolerant control method and apparatus of a floating wind turbine are provided. The fault-tolerant control method and apparatus of a floating wind turbine can acquire a low-order nonlinear model of a pre-established floating wind turbine, establish a switching linear model of the floating wind turbine based on the low-order nonlinear model, acquire a modal parameter of the current floating wind turbine, and determine based on the modal parameter a sub-model that the floating wind turbine currently satisfies, so as to establish a switching sliding mode surface and a full-order state observer of the floating wind turbine based on the sub-model and the modal parameter, and further calculate a feedback output of a controller of the floating wind turbine according to the switching sliding mode surface and the full-order state observer.

Abstract: Various examples described herein include various mechanisms, techniques, and methods to subtract collected signals caused by a periodic pattern formed on substrates to enable a higher level of defect detection on substrates. Signals detected by various types of metrology and substrate-inspection systems that are caused by periodic patterns on inspected substrates can be reduced or eliminated by, for example, a Fourier analysis of the detected signals. Both gray-scale value thresholds and area thresholds may be applied after the Fourier analysis of the image and are sufficient for defect detection on an image with a substantially-reduced number of false defects or no defects being present in a final image produced after processing. Other techniques and methods are also disclosed.

Abstract: An apparatus according to the present disclosure stacks and aligns predetermined number of laminar members blanked respectively by a blanking block and transports them to a conveyor, thereby eliminating the need for the conventional counting operation and alignment operation of laminar members, and efficiently performing a subsequent adhesion or welding process etc. of laminar members.