Abstract: Provided are a semiconductor device and a method of operating the same. A semiconductor includes a test circuit which comprises: a test transistor to be tested for time-dependent dielectric breakdown (TDDB) characteristics using a stress voltage; an input switch disposed between a voltage application node to which the stress voltage is applied and an input node which transmits the stress voltage to the test transistor; and a protection switch disposed between the input node and a ground node.

Abstract: Provided are a semiconductor device and a method of operating the same. A semiconductor includes a test circuit which comprises: a test transistor to be tested for time-dependent dielectric breakdown (TDDB) characteristics using a stress voltage; an input switch disposed between a voltage application node to which the stress voltage is applied and an input node which transmits the stress voltage to the test transistor; and a protection switch disposed between the input node and a ground node.

Abstract: Provided are a semiconductor device and a method of operating the same. A semiconductor includes a test circuit which comprises: a test transistor to be tested for time-dependent dielectric breakdown (TDDB) characteristics using a stress voltage; an input switch disposed between a voltage application node to which the stress voltage is applied and an input node which transmits the stress voltage to the test transistor; and a protection switch disposed between the input node and a ground node.

Abstract: Provided are a semiconductor device and a method of operating the same. A semiconductor includes a test circuit which comprises: a test transistor to be tested for time-dependent dielectric breakdown (TDDB) characteristics using a stress voltage; an input switch disposed between a voltage application node to which the stress voltage is applied and an input node which transmits the stress voltage to the test transistor; and a protection switch disposed between the input node and a ground node.

Abstract: A nonvolatile memory device includes a voltage generating circuit configured to generate voltages applied to word lines corresponding to a selected memory block among memory blocks. The voltage generating circuit includes voltage source lines having linear voltages, a first voltage generating unit configured to generate a first voltage and apply the generated first voltage to a first voltage source line among the voltage source lines, a second voltage generating unit configured to generate a second voltage and apply the generated second voltage to a second voltage source line among the voltage source lines, and a linear voltage generator having a resistor string connected between the first voltage source line and the second voltage source line. At least one of the voltage source lines has a voltage distributed between the first voltage and the second voltage.

Abstract: A nonvolatile memory device includes a voltage generating circuit configured to generate voltages applied to word lines corresponding to a selected memory block among memory blocks. The voltage generating circuit includes voltage source lines having linear voltages, a first voltage generating unit configured to generate a first voltage and apply the generated first voltage to a first voltage source line among the voltage source lines, a second voltage generating unit configured to generate a second voltage and apply the generated second voltage to a second voltage source line among the voltage source lines, and a linear voltage generator having a resistor string connected between the first voltage source line and the second voltage source line. At least one of the voltage source lines has a voltage distributed between the first voltage and the second voltage.

Abstract: An external power control method includes determining whether to apply a second external voltage to a first node according to a drop of a first external voltage; generating a flag signal according to a drop of the second external voltage when the second external voltage is applied to the first node; transferring a voltage of the first node to a second node in response to the flag signal; and discharging at least one voltage of an internal circuit connected to the second node in response to the flag signal.

Abstract: A method of operating a non-volatile memory includes; during power-on, reading control information from an information block and lock information from an additional information block, then upon determining that a secure block should be locked, generating a lock enable signal that inhibits access to data stored in the secure block, and a read-only enable signal that prevents change in the data stored in the additional information block.

Abstract: A nonvolatile memory device includes a voltage supply controller (VSC) detecting a level of a power supply voltage and generating a first internal voltage in response thereto. The VSC provides the first internal voltage at a level equal to an external high voltage when a power supply voltage is normally supplied, but provides the first internal voltage at a level lower than the external high voltage when a power supply voltage is abnormally supplied.

Abstract: A method is provided for reading data in a nonvolatile memory device. The method includes performing a first read operation on multiple multi-level memory cells (MLCs), performing a first sensing operation on at least one flag cell corresponding to the MLCs, selectively performing a second read operation on the MLCs based on a result of the first sensing operation, and performing a second sensing operation on the at least one flag cell when the second read operation is performed. Read data is output based on results of the first read operation and the first sensing operation when the second read operation is not performed, and the read data is output based on result of the first read operation, the first sensing operation, the second read operation and the second sensing operation when the second read operation is performed. The read data corresponds to programmed data in the MLCs.

Abstract: A method of operating a non-volatile memory includes; during power-on, reading control information from an information block and lock information from an additional information block, then upon determining that a secure block should be locked, generating a lock enable signal that inhibits access to data stored in the secure block, and a read-only enable signal that prevents change in the data stored in the additional information block.

Abstract: A nonvolatile memory device comprises a first mat, a second mat, a third mat, a first address decoder, a second address decoder, and a third address decoder. The first mat comprises first memory blocks, the second mat comprises second memory blocks, and the third mat comprises third memory blocks. The first address decoder selects one of the first memory blocks according to a first even address, the second address decoder selects one of the second memory blocks according to a second even address or a first odd address, and the third address decoder selects one of the third memory blocks according to a second odd address.

Abstract: A nonvolatile memory device comprises a first mat, a second mat, a third mat, a first address decoder, a second address decoder, and a third address decoder. The first mat comprises first memory blocks, the second mat comprises second memory blocks, and the third mat comprises third memory blocks. The first address decoder selects one of the first memory blocks according to a first even address, the second address decoder selects one of the second memory blocks according to a second even address or a first odd address, and the third address decoder selects one of the third memory blocks according to a second odd address.

Abstract: A method is provided for reading data in a nonvolatile memory device. The method includes performing a first read operation on multiple multi-level memory cells (MLCs), performing a first sensing operation on at least one flag cell corresponding to the MLCs, selectively performing a second read operation on the MLCs based on a result of the first sensing operation, and performing a second sensing operation on the at least one flag cell when the second read operation is performed. Read data is output based on results of the first read operation and the first sensing operation when the second read operation is not performed, and the read data is output based on result of the first read operation, the first sensing operation, the second read operation and the second sensing operation when the second read operation is performed. The read data corresponds to programmed data in the MLCs.

Abstract: A nonvolatile memory device includes a voltage supply controller (VSC) detecting a level of a power supply voltage and generating a first internal voltage in response thereto. The VSC provides the first internal voltage at a level equal to an external high voltage when a power supply voltage is normally supplied, but provides the first internal voltage at a level lower than the external high voltage when a power supply voltage is abnormally supplied.

Abstract: A nonvolatile memory device comprises a first mat, a second mat, a third mat, a first address decoder, a second address decoder, and a third address decoder. The first mat comprises first memory blocks, the second mat comprises second memory blocks, and the third mat comprises third memory blocks. The first address decoder selects one of the first memory blocks according to a first even address, the second address decoder selects one of the second memory blocks according to a second even address or a first odd address, and the third address decoder selects one of the third memory blocks according to a second odd address.

Abstract: A flash memory device includes a flash memory and a buffer memory. The flash memory is divided into a main region and a spare region. The buffer memory is a random access memory and has the same structure as the flash memory. In addition, the flash memory device further includes control means for mapping an address of the flash memory applied from a host so as to divide a structure of the buffer memory into a main region and a spare region and for controlling the flash memory and the buffer memory to store data of the buffer memory in the flash memory or to store data of the flash memory in the buffer memory.

Abstract: A semiconductor memory device includes a memory core and a fail detection circuit. The memory core includes a memory cell array having a plurality of memory cells. The fail detection circuit compares read data with test data to generate a comparison signal representing whether each of the memory cells is failed or not, and accumulates and stores fail information of the memory cells corresponding to a plurality of addresses to output accumulated fail information. The read data are read out from the memory cells in which the test data are written.

Abstract: The disclosure is a NAND flash memory with the function of error checking and correction during a page copy operation. The NAND flash memory is able to prohibit transcription of erroneous bits to a duplicate page from a source page. Embodiments of the inventive flash memory include a correction circuit for correcting bit errors of source data stored in a page buffer, a circuit configured to provide the source data to the correction circuit and to provide correction data to the page buffer, and a copy circuit configured to copy the source data to the page buffer, and to store the correction data in the other page from the page buffer.

Abstract: A dual-chip package is disclosed which includes at least two memory chips each of which may contain buffer and flash memories having different address systems from each other. Each memory chip may include a register for storing first and second flag signals each indicative of selections of corresponding memory chips, a comparator circuit for comparing the first and second flag signals in the register with a reference signal to generate a flash access signal and a buffer access signal, and a controller for controlling the buffer memory and the flash memory in response to the flash access signal and the buffer access signal.