Abstract: A monitoring system within a computing system is set out. The monitoring system monitors components within the computing system. The monitoring system includes a plurality of monitoring devices, a dedicated bus and a controller. The dedicated bus is dedicated for use by the monitoring devices. Each monitoring device is connected to the dedicated bus. The controller is also connected to the dedicated bus. The controller assigns addresses to each monitoring device, stores exception events, and reports the exception events to system software for the computing system.

Abstract: Contaminants that accumulate on test probes utilized to contact aluminum pads on integrated circuit chips cause the probe resistance to become unacceptably high. As disclosed herein, the contaminants (predominantly a mixture of aluminum and aluminum oxide) are substantially removed by immersing the probes in boiling water. Adding small quantities of phosphoric and/or hydrofluoric acids to the water further improves the cleaning action.