Abstract: An electronic circuit for single-event latch-up (SEL) detection and protection of a target integrated circuit (IC) is disclosed. The circuit comprises: a first detector configured for detecting an absolute load current (i) and comparing the absolute load current (i) with a threshold current (ith); a second detector configured for detecting a rate of change of load current (di/dt) and comparing the rate of change of load current (di/dt) with a threshold current change rate (di/dt)th; and a determination module for triggering a power shut-down to the target IC if the absolute load current (i) exceeds the threshold current (ith) and/or the rate of change of load current (di/dt) exceeds the threshold current change rate (di/dt)th.

Abstract: A method for providing a voltage reference at a present operating temperature in a circuit is provided. The circuit comprises a first MOS transistor having a first threshold voltage; and a second MOS transistor having a second threshold voltage different from the first threshold voltage is provided.