Abstract: In a field-effect semiconductor device, alternating first n-type and p-type pillar regions are arranged in the active area. The first n-type pillar regions are in Ohmic contact with the drain metallization. The first p-type pillar regions are in Ohmic contact with the source metallization. An integrated dopant concentration of the first n-type pillar regions substantially matches that of the first p-type pillar regions. A second p-type pillar region is in Ohmic contact with the source metallization, arranged in the peripheral area and has an integrated dopant concentration smaller than that of the first p-type pillar regions divided by a number of the first p-type pillar regions. A second n-type pillar region is arranged between the second p-type pillar region and the first p-type pillar regions, and has an integrated dopant concentration smaller than that of the first n-type pillar regions divided by a number of the first n-type pillar regions.

Abstract: A semiconductor device includes a first coil that is monolithically integrated in a first portion of a semiconductor body and that includes a first winding wrapping around a first core structure. A second coil is monolithically integrated in a second portion of the semiconductor body and includes a second winding wrapping around the second core structure. The first and second coils are magnetically coupled with each other. An insulator frame in the semiconductor body surrounds the first portion and excludes the second portion. High dielectric strength between the first and the second coils is achieved without patterning a backside metallization for connecting the turns of the windings and without being restricted to thin substrates.

Abstract: In a field-effect semiconductor device, alternating first n-type and p-type pillar regions are arranged in the active area. The first n-type pillar regions are in Ohmic contact with the drain metallization. The first p-type pillar regions are in Ohmic contact with the source metallization. An integrated dopant concentration of the first n-type pillar regions substantially matches that of the first p-type pillar regions. A second p-type pillar region is in Ohmic contact with the source metallization, arranged in the peripheral area and has an integrated dopant concentration smaller than that of the first p-type pillar regions divided by a number of the first p-type pillar regions. A second n-type pillar region is arranged between the second p-type pillar region and the first p-type pillar regions, and has an integrated dopant concentration smaller than that of the first n-type pillar regions divided by a number of the first n-type pillar regions.

Abstract: A diode includes a semiconductor body, a first emitter region of a first conductivity type, a second emitter region of a second conductivity type, a base region arranged between the first and second emitter regions and having a lower doping concentration than the first and second emitter regions, a first emitter electrode electrically coupled to the first emitter region, a second emitter electrode in electrical contact with the second emitter region, a control electrode arrangement comprising a first control electrode section and a first dielectric layer arranged between the first control electrode section and the semiconductor body, and at least one pn junction extending to the first dielectric layer, or arranged distant to the first dielectric layer by less than 250 nm. The breakdown voltage of the diode is adjusted by applying a control potential to the first control electrode section.

Abstract: A semiconductor device includes a semiconductor body having first and second opposing surfaces, a first isolation layer on the first surface of the semiconductor body, and an electrostatic discharge protection structure. The electrostatic discharge protection structure includes a diode structure on the first isolation layer, a first terminal and a second terminal. The diode structure includes a polysilicon layer having first regions and at least one second region of opposite conductivity type alternatingly arranged along a first lateral direction between the first terminal and the second terminal. The diode structure extends from an electrostatic discharge protection part into an edge termination part along a second lateral direction. A first breakdown voltage associated with the diode structure in the electrostatic discharge protection part is smaller than a second breakdown voltage associated with the diode structure in the edge termination part.

Abstract: A half-bridge circuit includes a low-side transistor and a high-side transistor each having a load path and a control terminal. The half-bridge circuit further includes a high-side drive circuit having a level shifter with a level shifter transistor. The low-side transistor and the level shifter transistor are integrated in a common semiconductor body.

Abstract: A semiconductor device comprises a semiconductor body having a first surface and a second surface opposite to the first surface. The semiconductor device further comprises a first isolation layer on the first surface of the semiconductor body, and an electrostatic discharge protection structure on the first isolation layer. The electrostatic discharge protection structure includes a first terminal and a second terminal. The semiconductor device further comprises a heat dissipation structure having a first end in direct contact with the electrostatic discharge protection structure and a second end in direct contact with an electrically isolating region.

Abstract: A semiconductor device includes a semiconductor body including a first trench extending into the semiconductor body from a first surface and a diode including an anode region and a cathode region. One of the anode region and the cathode region is at least partly arranged in the first trench. The other one of the anode region and the cathode region includes a first semiconductor region directly adjoining the one of the anode region and the cathode region from outside of the first trench, thereby constituting a pn junction. The semiconductor device further includes a conducting path through a sidewall of the first trench.

Abstract: A semiconductor device comprises a semiconductor body having a first surface and a second surface opposite to the first surface. The semiconductor device further comprises a first isolation layer on the first surface of the semiconductor body, and an electrostatic discharge protection structure on the first isolation layer. The electrostatic discharge protection structure has a first terminal and a second terminal. The semiconductor device further comprises a heat dissipation structure, which has a first end in contact with the electrostatic discharge protection structure and a second end which is in direct contact to an electrically isolating region.

Abstract: A wafer includes a semiconductor layer having a concentration of n-dopants. A first mask is formed on the wafer and has first openings in an active area of a semiconductor device and at least one second opening in a peripheral area of the device. The first openings define first zones in the semiconductor layer and each second opening defines a second zone in the layer. Donor ions are implanted through the first mask into the first and second zones. The first mask is replaced by a second mask which has third openings in the active area and at least one fourth opening in the peripheral area. Each fourth opening defines a fourth zone in the semiconductor layer which at least partially overlaps with the second zone. The third openings define third zones in the semiconductor layer. Acceptor ions are implanted through the second mask into the third and fourth zones.

Abstract: One embodiment of an integrated circuit includes a semiconductor body. In the semiconductor body a first trench region extends into the semiconductor body from a first surface. The integrated circuit further includes a diode including an anode region and a cathode region. One of the anode region and the cathode region is at least partly arranged in the first trench region. The other one of the anode region and the cathode region includes a first semiconductor region adjoining the one of the anode region and the cathode region from outside of the first trench region.

Abstract: A wafer includes a semiconductor layer having a concentration of n-dopants. A first mask is formed on the wafer and has first openings in an active area of a semiconductor device and at least one second opening in a peripheral area of the device. The first openings define first zones in the semiconductor layer and each second opening defines a second zone in the layer. Donor ions are implanted through the first mask into the first and second zones. The first mask is replaced by a second mask which has third openings in the active area and at least one fourth opening in the peripheral area. Each fourth opening defines a fourth zone in the semiconductor layer which at least partially overlaps with the second zone. The third openings define third zones in the semiconductor layer. Acceptor ions are implanted through the second mask into the third and fourth zones.

Abstract: A diode includes a semiconductor body, a first emitter region of a first conductivity type, a second emitter region of a second conductivity type, a base region arranged between the first and second emitter regions and having a lower doping concentration than the first and second emitter regions, a first emitter electrode electrically coupled to the first emitter region, a second emitter electrode in electrical contact with the second emitter region, a control electrode arrangement comprising a first control electrode section and a first dielectric layer arranged between the first control electrode section and the semiconductor body, and at least one pn junction extending to the first dielectric layer, or arranged distant to the first dielectric layer by less than 250 nm. The breakdown voltage of the diode is adjusted by applying a control potential to the first control electrode section.

Abstract: A power semiconductor device includes a semiconductor body having a first surface and including an active area including n-type semiconductor regions and p-type semiconductor regions, the n-type semiconductor regions alternating, in a direction substantially parallel to the first surface, with the p-type semiconductor regions. The semiconductor body further includes a peripheral area surrounding the active area and including a low-doped semiconductor region having a first concentration of n-dopants lower than a doping concentration of n-dopants of the n-type semiconductor regions, and at least one auxiliary semiconductor region having a concentration of n-dopants higher than the first concentration and a concentration of p-dopants higher than the first concentration.

Abstract: A charge-compensation semiconductor device includes a semiconductor body including a first surface, a second surface arranged opposite to the first surface, an edge delimiting the semiconductor body in a horizontal direction substantially parallel to the first surface, a drain region of a of a first conductivity type extending to the second surface, an active area, and a peripheral area arranged between the active area and the edge, a source metallization arranged on the first surface, and a drain metallization arranged on the drain region and in Ohmic contact with the drain region.

Abstract: In a field-effect semiconductor device, alternating first n-type and p-type pillar regions are arranged in the active area. The first n-type pillar regions are in Ohmic contact with the drain metallization. The first p-type pillar regions are in Ohmic contact with the source metallization. An integrated dopant concentration of the first n-type pillar regions substantially matches that of the first p-type pillar regions. A second p-type pillar region is in Ohmic contact with the source metallization, arranged in the peripheral area and has an integrated dopant concentration smaller than that of the first p-type pillar regions divided by a number of the first p-type pillar regions. A second n-type pillar region is arranged between the second p-type pillar region and the first p-type pillar regions, and has an integrated dopant concentration smaller than that of the first n-type pillar regions divided by a number of the first n-type pillar regions.

Abstract: A charge-compensation semiconductor device includes a semiconductor body including a first surface, a second surface arranged opposite to the first surface, an edge delimiting the semiconductor body in a horizontal direction substantially parallel to the first surface, a drain region of a of a first conductivity type extending to the second surface, an active area, and a peripheral area arranged between the active area and the edge, a source metallization arranged on the first surface, and a drain metallization arranged on the drain region and in Ohmic contact with the drain region.

Abstract: A field-effect semiconductor device includes a semiconductor body having a first surface and an edge, an active area, and a peripheral area between the active area and the edge, a source metallization on the first surface and a drain metallization. In the active area, first conductivity type drift portions alternate with second conductivity type compensation regions. The drift portions contact the drain metallization and have a first maximum doping concentration. The compensation regions are in Ohmic contact with the source metallization. The peripheral area includes a first edge termination region and a second semiconductor region in Ohmic contact with the drift portions having a second maximum doping of the first conductivity type which lower than the first maximum doping concentration by a factor of ten. The first edge termination region of the second conductivity type adjoins the second semiconductor region and is in Ohmic contact with the source metallization.

Abstract: A semiconductor device includes a semiconductor body, which includes transistor cells and a drift zone between a drain layer and the transistor cells. The drift zone includes a compensation structure. Above a depletion voltage a first output charge gradient obtained by increasing a drain-to-source voltage from the depletion voltage to a maximum drain-to-source voltage deviates by less than 5% from a second output charge gradient obtained by decreasing the drain-to-source voltage from the maximum drain-to-source voltage to the depletion voltage. At the depletion voltage the first output charge gradient exhibits a maximum curvature.

Abstract: A semiconductor device includes a semiconductor body with transistor cells arranged in an active area and absent in an edge area between the active area and a side surface. A field dielectric adjoins a first surface of the semiconductor body and separates, in the edge area, a conductive structure connected to gate electrodes of the transistor cells from the semiconductor body. The field dielectric includes a transition from a first vertical extension to a second, greater vertical extension. The transition is in the vertical projection of a non-depletable extension zone in the semiconductor body, wherein the non-depletable extension zone has a conductivity type of body/anode zones of the transistor cells and is electrically connected to at least one of the body/anode zones.