Abstract: A test configuration for the functional testing of a semiconductor chip is described. The semiconductor chip, which can be subjected to a functional test for the purpose of checking the functionality of the semiconductor chip, is disposed on a support material. The semiconductor chip contains a self-test unit for generating test information and for carrying out the functional test. An energy source serves for providing an electrical energy supply from energy that is fed in contactlessly. The energy source is disposed on the support material and is connected to the semiconductor chip for the purpose of providing an energy supply on the semiconductor chip. The test configuration makes it possible to carry out a contactless functional test and to reduce the test costs by virtue of high parallelism during the functional test of a plurality of semiconductor chips.

Abstract: An integrated semiconductor circuit, in particular a semiconductor memory configuration, which can be operated in various operating modes and which has an apparatus for switching between these operating modes is described. The semiconductor circuit has a switching apparatus with at least one fuse unit, which can be blown and programmed from the exterior.

Abstract: The invention relates to a fusible link configuration in or on integrated circuits, in particular highly integrated memory chips, in which in each case one bank of fusible links (F1, F2, . . . ), together with an evaluation logic unit is configured beside and in association with a memory field segment. The evaluation logic unit is electrically connected to the fusible links (F1, F2, . . . ) and determines whether one or more of the fusible links (F1, F2, . . . ) is severed. One or more banks of the fusible links (F1, F2, . . . ) are divided up into smaller units while restricting the width(s) of the bank or banks. The units are grouped such that at least some of the fusible links (F1, F2, . . . ) are located beside one another transversely with respect to the width direction of the bank.

Abstract: The low-inertia and high-strength accelerating lever comprises a hub part, arm and end part made of a thermoplastics reinforced by high-strength fibers. The lever is built up from a number of layers in the form a Prepregs or semifinisheds, which are placed one on another, the layers having different fiber orientations and extending substantially parallel to the movement plane. Longitudinal components of the fiber orientations predominate in the arm with a gradual transition to the hub part and end part; the hub part and end part having a substantially isotropic distribution of the fiber orientations.

Abstract: A process for the operation of rechargeable zinc electrodes in galvanic cells with the aid of a residual discharge, which comprises subjecting the rechargeable zinc electrode in a cell after a normal discharge to a residual discharge by connecting with at least one auxiliary electrode within said cell.