Abstract: An apparatus for selecting and detecting at least one spectral region of a spectrally spread light beam, preferably in the beam path of a confocal scanning microscope, the spread light beam being focussable in a focal line, is characterized, for non-overlapping detection of the spectrally spread light beam of the selected spectral regions in the context of an increased number of detectors and an error-tolerant arrangement, in that there is arranged in the spread light beam an optical component which reflects and/or refracts the light beam to a detector and whose optically effective region becomes smaller or larger along the surface, so that by orientation of the component with respect to the focal line and the resulting superposition of the focal line and surface, the spectral region arriving at the detector is definable.

Abstract: The present invention concerns a microscope and a method for operating a microscope, in particular a confocal or double confocal scanning microscope, having an optical beam path (9) extending between a light source (1), a specimen (2), and a detector (7) and/or a detection optical system, in which context intentional and unintentional relative motions occur between the specimen (2) and the optical beam path (9), undesired relative motions of the microscope components in optical beam path (9) are intended to result in no (or only minor) image defects, and method steps are provided which eliminate or minimize the image defects brought about by undesired relative motions between the specimen (2) and optical beam path (9); and is characterized in that a first device (8) detects relative motions; and a second device (22) compensates for unintentional relative motions.

Abstract: A device (70) is disclosed for adjusting a light beam (1) in an optical system (100), whereby the optical system (100) defines an optical axis (60). The device (70) for adjusting comprises means for coupling-in (3) of the light beam into a housing part (80) of the device (70). The means for coupling-in (3) determines a coupling-in point (3a) and a coupled in light beam (9). At a least first and a second photo detector (10, 22) are arranged in different in distances to the coupling-in point (3a). In the coupled in light beam (9) at least one beam splitter (36) is provided, which directs the coupled in light beam (9) on at least one of the photo detectors (10, 22).

Abstract: A device (70) for adjusting the light beam (1) in a microscope (15) is disclosed, wherein the microscope (15) defined an optical axis (60). The device (70) comprises means for coupling in (3) the light beam into a housing (80) of the device (70). The means for coupling in (3) defines a coupling in point (3a) and a coupled in light beam (9). At least a first and a second detector (10, 22) are positioned in different distances to the coupling point (3a). In the coupled in light beam (9) at least one beam splitter (36) is provided, which directs the coupled in light beam (9) onto at least one of the photo detectors (10, 22).

Abstract: A scanning microscope has at least one illumination source for emitting a light beam, which is fed via a microscope optic to a specimen and scans the latter. In order to correct the imaging defect of the microscope optic, said defect is determined and a correction value is determined therefrom. This correction value is used for influencing control signals which control the impinging of the light beam on the specimen.

Abstract: A scanning microscope having a light source that emits illuminating light for illumination of a specimen, having at least one first detector for detection of the detected light proceeding from the specimen, having an objective being arranged in both an illumination beam path and a detection beam path, and having a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path, is disclosed.

Abstract: An apparatus for positioning an optical component (1) in a beam path (2), preferably in the beam path of a microscope, in particular of a confocal scanning microscope, multiple optical components (1) being arranged in aligned fashion in a mount (3), is characterized in that the mount (3), as a magazine carriage (3), is guided in a guide block (5) that is positioned in the beam path (2) and has an opening (4) for the beam path (2).

Abstract: A method and system for compensating intensity fluctuations of an illumination system in a confocal microscope comprise a first and a second analog-to-digital converters for digitizing a first electrical signal corresponding to the light reflected from a specimen, and for digitizing a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to a first and a second look up tables carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look up table for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.

Abstract: An apparatus for selecting and detecting at least one spectral region of a spectrally spread light beam, preferably in the beam path of a confocal scanning microscope, the spread light beam being focussable in a focal line, is characterized, for non-overlapping detection of the spectrally spread light beam of the selected spectral regions in the context of an increased number of detectors and an error-tolerant arrangement, in that there is arranged in the spread light beam an optical component which reflects and/or refracts the light beam to a detector and whose optically effective region becomes smaller or larger along the surface, so that by orientation of the component with respect to the focal line and the resulting superposition of the focal line and surface, the spectral region arriving at the detector is definable.

Abstract: A TV camera for microscopic or macroscopic imaging is characterized by a confocal lens with a laser light source (1), a scanner (2), a detector (3) and an electronic control unit (4), for using confocal characteristics in the most compact possible format.

Abstract: The invention discloses a method and system for processing scan signals from a confocal microscope. The confocal microscope comprises an illumination source and a scanning device with a scanning mirror system. A control and processing unit is provided, which unit uses a plurality of programmable devices for the real time processing of digital signals. The control and processing unit has at least three input ports and one output port. A first detector generates analog signals corresponding to the light reflected from a specimen within the microscope and a second detector generates analog signals corresponding to the intensity of the light from the illumination source. In addition, a position signal of the scanning laser beam is provided to the control and processing unit. Analog-to-digital converters receive the analog signals, generate digital signals and provide the digital signals to the input ports of the control and processing unit.

Abstract: An overload protection to avoid damage to optical components (3) by excessive light power from a light source (2), especially to protect a glass fiber system used to transmit laser light (5), has a beam splitter out (4) in the beam path (6) between the light source (2) and the optical component (3) to couple out a small portion of the light, a detector (7) to detect the light intensity of the light coupled out, an electronic evaluation unit (8) to compare the detected light intensity with a presettable maximum value, and a filter or other element (9) to reduce the light power or to cut off the light incident on the optical component (3) in case the maximum value is exceeded.

Abstract: In order to extend the life of the laser light source and to reduce the operating costs, a method for operating a laser light source, in particular for scanning in a confocal scanning laser microscope, the laser light source being supplied with electricity via a power pack, is one wherein the laser light source is operated with the requisite power essentially only during the working beam time, preferably during the data acquisition. When a pulsed laser light source is used, the working beam time, in particular the data acquisition, is essentially synchronized with the emission cycle of the laser light source.

Abstract: The present invention discloses a light source for illumination in scanning microscopy, and a scanning microscope. The light source and the scanning microscope contain an electromagnetic energy source that emits light of one wavelength, and a means 5 for spatially dividing the light into at least two partial light beams. An intermediate element for wavelength modification is provided in at least one partial light beam.

Abstract: The present invention discloses a method and an arrangement for scanning microscopic specimens (15) with a scanning device. The microscopic specimen (15) is displaceable on a specimen stage (35) in at least two spatial directions. A light beam (3) scans the specimen (15) within a defined scan field (52) by way of a scanning module (7), and the light (17) proceeding from the specimen is detected. A PC (34) is also provided for analysis and calculation. The scan field (52) is defined in such a way that it incompletely encompasses a specimen region that is to be examined. Means (23, 31) are provided which displace the specimen stage (35) in such a way that the entire specimen region of interest can be covered by the plurality of resulting scan fields (521, 522, . . . 52n). The data of the individual scan fields (521, 522, . . . 52n) detected from the specimen region being examined are assembled in the PC (34) into an overall image.

Abstract: A laser scanning microscope, preferably a confocal laser scanning microscope, and a method for reference correction for a laser scanning microscope, in particular for a confocal laser scanning microscope, having an illumination beam path extending between a laser light source and a specimen, and a detection beam path extending between the specimen and a detection device, is characterized, for error correction with at least one reference beam path used for reference measurement, in that reference light can be coupled out of the illumination beam path into the reference beam path, and that the reference light is qualitatively and/or quantitatively detectable by a detection device.

Abstract: An apparatus for measuring the lifetime of an excited state in a specimen is disclosed. The apparatus comprises an electromagnetic energy source (1) that emits light (3) of one wavelength. Also provided are a means (5) for dividing the light (3) into at least a first and a second partial light beam (7, 9) and an intermediate element (23) in at least one partial light beam to influence the transit time.

Abstract: An arrangement for visual and quantitative three-dimensional examination of specimens, having a stereomicroscope (2). The stereomicroscope defines a first and a second observation beam path (4, 5), by way of which a specimen (6) to be examined can be visually observed. A confocal scanning device (1) is connected to the stereomicroscope (1) in such a way that a scanning beam path (3) defined by the confocal scanning device (1) scans the specimen (6) that is to be examined and in that context acquires data for a three-dimensional visual depiction of the specimen (6).

Abstract: A scanning microscope is disclosed, through which a sample (14) can be illuminated and detected. An illumination pinhole and a detection pinhole (10, 16) are respectively arranged in the illumination beam path and in the detection beam path (8, 15), an optical component (4), which generates at least to some extent spectrally broadened illumination light, is provided in the illumination beam path (8). A polarization-independent and wavelength-independent beam splitter (11) is arranged in a fixed position in the illumination beam path and the detection beam path (8, 15).

Abstract: An optical arrangement having a light source, preferably a laser, for generating a light beam (1); at least one acoustooptical deflection device (3) for the light beam (1); and a correction device for correcting beam aberrations produced by the deflection device (3) is configured, in the interest of flexible and reliable correction of aberrations occurring because of the deflection, in such a way that the correction device comprises an adaptive optical system (2). Also described is a method for the deflection of light beams (1) with a light source, preferably a laser, for generating a light beam (1); at least one acoustooptical deflection device (3) for the light beam (1); and a correction device for correcting beam aberrations produced by the deflection device (3), in which an adaptive optical system (2) is used as the correction device.