Patents by Inventor John Donohue
John Donohue has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 12140559Abstract: Various cell analysis systems of the present teachings can measure the electrical and metabolic activity of single, living cells with subcellular addressability and simultaneous data acquisition for between about 10 cells to about 500,000 cells in a single analysis. Various sensor array devices of the present teachings can have sensor arrays with between 20 million to 660 million ChemFET sensors built into a massively paralleled array and can provide for simultaneous measurement of cells with data acquisition rates in the kilohertz (kHz) range. As various ChemFET sensor arrays of the present teachings can detect chemical analytes as well detect changes in cell membrane potential, various cell analysis systems of the present teachings also provide for the controlled chemical and electrical interrogation of cells.Type: GrantFiled: December 22, 2022Date of Patent: November 12, 2024Assignee: Life Technologies CorporationInventors: Wolfgang Hinz, John Donohue, Daniel Beacham
-
Patent number: 12050196Abstract: A method for correcting nucleotide incorporation signals for fluid potential effects or disturbances arising in nucleic acid sequencing-by-synthesis includes: disposing a plurality of template polynucleotide strands in a plurality of defined spaces disposed on a sensor array, the template polynucleotide strands having a sequencing primer and a polymerase bound therewith; exposing the template polynucleotide strands to a series of flows of nucleotide species flowed through a fluid manifold, the fluid manifold comprising passages for flowing nucleotide species and a branch passage for flowing a solution, the branch passage comprising a reference electrode and a sensing electrode; obtaining a plurality of nucleotide incorporation signals corresponding to the plurality of defined spaces, the nucleotide incorporation signals having a signal intensity related to a number of nucleotide incorporations; and correcting at least some of the plurality of nucleotide incorporation signals for fluid potential effects or disType: GrantFiled: October 12, 2021Date of Patent: July 30, 2024Assignee: Life Technologies CorporationInventors: Chiu Tai Andrew Wong, Todd Rearick, John Donohue
-
Publication number: 20230123796Abstract: A coated optical component includes an optical component and a conformal coating. The optical component is crystalline calcium fluoride and the conformal coating is an atomic layer deposition (ALD) coating in contact with a surface of the optical component. The ALD coating includes a metal fluoride ALD coating having a metal different from calcium. The ALD coating can include other metal oxide or metalloid oxide ALD coating layers. The method for making the coated optical component includes depositing an atomic layer deposition (ALD) coating on a surface of the optical component, where the ALD coating can be a metalloid oxide, a metal oxide, a metal fluoride having a metal that is different from calcium, or combinations of these. Sulfur hexafluoride is used as a fluorine source in the ALD process.Type: ApplicationFiled: October 13, 2022Publication date: April 20, 2023Inventors: Donald Erwin Allen, Gerald Philip Cox, Keith John Donohue, Ming-Huang Huang, Hoon Kim, Jue Wang
-
Patent number: 11567036Abstract: Various cell analysis systems of the present teachings can measure the electrical and metabolic activity of single, living cells with subcellular addressability and simultaneous data acquisition for between about 10 cells to about 500,000 cells in a single analysis. Various sensor array devices of the present teachings can have sensor arrays with between 20 million to 660 million ChemFET sensors built into a massively paralleled array and can provide for simultaneous measurement of cells with data acquisition rates in the kilohertz (kHz) range. As various ChemFET sensor arrays of the present teachings can detect chemical analytes as well detect changes in cell membrane potential, various cell analysis systems of the present teachings also provide for the controlled chemical and electrical interrogation of cells.Type: GrantFiled: September 11, 2019Date of Patent: January 31, 2023Assignee: Life Technologies CorporationInventors: Wolfgang Hinz, John Donohue, Daniel Beacham
-
Publication number: 20220065890Abstract: Various embodiments of a fluidic system of the present teachings are configured to execute a sequence of fluidic operations over the course of a next generation sequencing analysis for the sequential delivery of various solutions used over the course of analysis to a multilane sensor device. Exemplary fluidic operations include washing, priming and nucleotide reagent delivery through a fluidic multiplexer block that is configured to provide independent fluid distribution to each lane of a multilane sensor device used for detection during an analysis. Accordingly, any number or combination of lanes can be used during an analysis, so that during an analysis one lane in any position can be used singly during a run, all four lanes can be used simultaneously during a run, or any combination of lanes can be used simultaneously during a run.Type: ApplicationFiled: November 12, 2021Publication date: March 3, 2022Inventors: Albert L. Carrillo, John Donohue
-
Patent number: 11169111Abstract: A method for correcting nucleotide incorporation signals for fluid potential effects or disturbances arising in nucleic acid sequencing-by-synthesis includes: disposing a plurality of template polynucleotide strands in a plurality of defined spaces disposed on a sensor array, the template polynucleotide strands having a sequencing primer and a polymerase bound therewith; exposing the template polynucleotide strands to a series of flows of nucleotide species flowed through a fluid manifold, the fluid manifold comprising passages for flowing nucleotide species and a branch passage for flowing a solution, the branch passage comprising a reference electrode and a sensing electrode; obtaining a plurality of nucleotide incorporation signals corresponding to the plurality of defined spaces, the nucleotide incorporation signals having a signal intensity related to a number of nucleotide incorporations; and correcting at least some of the plurality of nucleotide incorporation signals for fluid potential effects or disType: GrantFiled: March 22, 2019Date of Patent: November 9, 2021Assignee: Life Technologies CorporationInventors: Chiu Tai Andrew Wong, Todd Rearick, John Donohue
-
Publication number: 20200088676Abstract: Various cell analysis systems of the present teachings can measure the electrical and metabolic activity of single, living cells with subcellular addressability and simultaneous data acquisition for between about 10 cells to about 500,000 cells in a single analysis. Various sensor array devices of the present teachings can have sensor arrays with between 20 million to 660 million ChemFET sensors built into a massively paralleled array and can provide for simultaneous measurement of cells with data acquisition rates in the kilohertz (kHz) range. As various ChemFET sensor arrays of the present teachings can detect chemical analytes as well detect changes in cell membrane potential, various cell analysis systems of the present teachings also provide for the controlled chemical and electrical interrogation of cells.Type: ApplicationFiled: September 11, 2019Publication date: March 19, 2020Inventors: Wolfgang Hinz, John Donohue, Daniel Beacham
-
Patent number: 10416112Abstract: A method for correcting nucleotide incorporation signals for fluid potential effects or disturbances arising in nucleic acid sequencing-by-synthesis includes: disposing a plurality of template polynucleotide strands in a plurality of defined spaces disposed on a sensor array, the template polynucleotide strands having a sequencing primer and a polymerase bound therewith; exposing the template polynucleotide strands to a series of flows of nucleotide species flowed through a fluid manifold, the fluid manifold comprising passages for flowing nucleotide species and a branch passage for flowing a solution, the branch passage comprising a reference electrode and a sensing electrode; obtaining a plurality of nucleotide incorporation signals corresponding to the plurality of defined spaces, the nucleotide incorporation signals having a signal intensity related to a number of nucleotide incorporations; and correcting at least some of the plurality of nucleotide incorporation signals for fluid potential effects or disType: GrantFiled: September 14, 2015Date of Patent: September 17, 2019Assignee: LIFE TECHNOLOGIES CORPORATIONInventors: Chiu Tai Andrew Wong, Todd Rearick, John Donohue
-
Patent number: 9832679Abstract: A window regulator for improving the performance of communications networks is described. In a communications network, data is sent downstream from a sender to a receiver, and acknowledgements are sent back upstream. When data is received at the receiver, the data is placed in a buffer and an acknowledgement of receipt may be sent. If no acknowledgement is received by a sender after a certain period of time, the sender retransmits the data. The receiver communicates how much data the receiver is willing to receive at any given time by sending an advertised window to the sender. The window regulator sets the size of the advertised window based on measurements of capacity in the network to improve the amount and rate of data sent downstream while avoiding loss of data and subsequent retransmissions.Type: GrantFiled: June 9, 2015Date of Patent: November 28, 2017Assignee: Citrix Systems, Inc.Inventors: William M. Turner, John Donohue
-
Patent number: 9435733Abstract: A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the optical signal, a beam splitter, a reference detector in optical communication with the beam splitter and configured to measure a characteristic of the optical signal, a specimen irradiated with the optical signal, a reflectance detector in optical communication with the specimen via the beam splitter and configured to measure an optical characteristic of the optical signal reflected by the specimen, a multiplexer in communication with at least one of the reference detector, specimen, and reflectance detector, and a processor in communication with at least one of the reference detector, specimen, and reflectance detector via the multiplexer and configured to calculate at least one characteristic of the specimen.Type: GrantFiled: May 20, 2014Date of Patent: September 6, 2016Assignee: NEWPORT CORPORATIONInventors: Razvan Ciocan, John Donohue, Arkady Feldman, Zhuoyun Li
-
Patent number: 9059934Abstract: A window regulator for improving the performance of communications networks is described. In a communications network, data is sent downstream from a sender to a receiver, and acknowledgements are sent back upstream. When data is received at the receiver, the data is placed in a buffer and an acknowledgement of receipt may be sent. If no acknowledgement is received by a sender after a certain period of time, the sender retransmits the data. The receiver communicates how much data the receiver is willing to receive at any given time by sending an advertised window to the sender. The window regulator sets the size of the advertised window based on measurements of capacity in the network to improve the amount and rate of data sent downstream while avoiding loss of data and subsequent retransmissions.Type: GrantFiled: February 24, 2012Date of Patent: June 16, 2015Assignee: Citrix Systems, Inc.Inventors: William M. Turner, John Donohue
-
Publication number: 20140252242Abstract: A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the optical signal, a beam splitter, a reference detector in optical communication with the beam splitter and configured to measure a characteristic of the optical signal, a specimen irradiated with the optical signal, a reflectance detector in optical communication with the specimen via the beam splitter and configured to measure an optical characteristic of the optical signal reflected by the specimen, a multiplexer in communication with at least one of the reference detector, specimen, and reflectance detector, and a processor in communication with at least one of the reference detector, specimen, and reflectance detector via the multiplexer and configured to calculate at least one characteristic of the specimen.Type: ApplicationFiled: May 20, 2014Publication date: September 11, 2014Applicant: NEWPORT CORPORATIONInventors: Razvan Ciocan, John Donohue, Arkady Feldman, Zhuoyun Li
-
Patent number: 8736825Abstract: A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the optical signal, a beam splitter, a reference detector in optical communication with the beam splitter and configured to measure a characteristic of the optical signal, a specimen irradiated with the optical signal, a reflectance detector in optical communication with the specimen via the beam splitter and configured to measure an optical characteristic of the optical signal reflected by the specimen, a multiplexer in communication with at least one of the reference detector, specimen, and reflectance detector, and a processor in communication with at least one of the reference detector, specimen, and reflectance detector via the multiplexer and configured to calculate at least one characteristic of the specimen.Type: GrantFiled: September 16, 2011Date of Patent: May 27, 2014Assignee: Newport CorporationInventors: Razvan Ciocan, John Donohue, Arkady Feldman, Zhuoyun Li
-
Publication number: 20140021335Abstract: The disclosure relates to a photodetector system including a multi-junction detector having a first junction configured to generate a first current when irradiated with a first optical radiation component within a first spectral range, and at least a second junction configured to generate a second current when irradiated with a second optical radiation component within a second spectral range that is different than the first spectral range. The photodetector system also comprises a microprocessor adapted to generate a first indication related to a first characteristic of the first optical radiation component based on the first current, and generate a second indication related to a second characteristic of the second optical radiation component based on the second current.Type: ApplicationFiled: August 31, 2011Publication date: January 23, 2014Applicant: NEWPORT CORPORATIONInventors: Razvan Ciocan, Domenic Assalone, John Donohue, Dae Han, Zhuoyun Li
-
Publication number: 20120010854Abstract: A system for measuring a characteristic of a solar cell is disclosed and includes a light source irradiating an optical signal having a spectral range from about 100 nm to about 3000 nm, a wavelength selector configured to selectively narrow the spectral range of the optical signal, a beam splitter, a reference detector in optical communication with the beam splitter and configured to measure a characteristic of the optical signal, a specimen irradiated with the optical signal, a reflectance detector in optical communication with the specimen via the beam splitter and configured to measure an optical characteristic of the optical signal reflected by the specimen, a multiplexer in communication with at least one of the reference detector, specimen, and reflectance detector, and a processor in communication with at least one of the reference detector, specimen, and reflectance detector via the multiplexer and configured to calculate at least one characteristic of the specimen.Type: ApplicationFiled: September 16, 2011Publication date: January 12, 2012Applicant: NEWPORT CORPORATIONInventors: Razvan Ciocan, John Donohue, Arkady Feldman, Zhuoyun Li
-
Patent number: 7972483Abstract: A method for material processing utilizing a material processing system to perform a process. The method performs a process (510), measures a scan of data (520), and transforms the data scan (530) into a signature (540) including at least one spatial component. The scan of data (530) can include a process performance parameter such as an etch rate, an etch selectivity, a deposition rate, a film property, etc. The signature (540) can be stored (550), and compared with either a previously acquired signature or with an ideal signature (560). If at least one spatial component substantially deviates from the reference spatial component, then a process fault has potentially occurred. If the cumulative deviation of all spatial components or a select group of components substantially deviates from a reference set of spatial components, then a process fault has potentially occurred.Type: GrantFiled: December 31, 2002Date of Patent: July 5, 2011Assignee: Tokyo Electron LimitedInventors: John Donohue, Hongyu Yue
-
Patent number: 7557591Abstract: The present invention describes a system and method for monitoring a material film within a plasma processing device. The system includes a plasma reactor formed by a reactor wall and an electrode, a RF generator to couple electrical energy to the electrode, an electrical measurement device for measuring an electrical property of the plasma processing device, and a controller coupled to the electrical measurement device and programmed to determine a state of a film on the reactor wall based on the measured electrical property.Type: GrantFiled: March 28, 2003Date of Patent: July 7, 2009Assignee: Tokyo Electron LimitedInventor: John Donohue
-
Publication number: 20060231526Abstract: The present invention describes a system and method for monitoring a material film within a plasma processing device. The plasma processing device comprises a plasma reactor formed by a reactor wall and an electrode, a RF generator to couple electrical energy to the electrode, an impedance match network to maximize the transfer of electrical energy from the RF generator to the plasma through the electrode, and an electrical measurement device for measuring an electrical property of the plasma processing device. The present invention further provides a method of monitoring the state of the wall film comprising the steps of energizing the electrode by coupling electrical energy from the RF generator through the impedance match network to the electrode and forming a plasma, measuring an electrical property between the RF generator and the electrode, and determining a state of the film on the reactor wall, wherein the determining includes correlating an electrical property with the state of the wall film.Type: ApplicationFiled: March 28, 2003Publication date: October 19, 2006Inventor: John Donohue
-
Publication number: 20050118812Abstract: A method for material processing utilizing a material processing system (1) to perform a process. The method a process, measures a scan of data, and transforms the data scan into a signature including at least one spatial component. The scan of data can include a process performance parameter (14) such as an etch rate, an etch selectivity, a deposition rate, a film property, etc. A relationship can be determined between the measured signature and a set of at least one controllable process parameter (12) using multivariate analysis, and this relationship can be utilized to improve the scan of data corresponding to a process performance parameter. For example, utilizing this relationship to minimize the spatial components of the scan of data can affect an improvement in the process uniformity.Type: ApplicationFiled: December 31, 2002Publication date: June 2, 2005Applicant: TOKYO ELECRON LIMITEDInventors: John Donohue, Hongyu Yue
-
Publication number: 20050115824Abstract: A method for material processing utilizing a material processing system to perform a process. The method performs a process (510), measures a scan of data (520), and transforms the data scan (530) into a signature (540) including at least one spatial component. The scan of data (530) can include a process performance parameter such as an etch rate, an etch selectivity, a deposition rate, a film property, etc. The signature (540) can be stored (550), and compared with either a previously acquired signature or with an ideal signature (560). If at least one spatial component substantially deivates from the reference spatial component, then a process fault has potentially occurred. If the cumulative deviation of all spatial components or a select group of components substantially deviates from a reference set of spatial components, then a process fault has potentially occurred.Type: ApplicationFiled: December 31, 2002Publication date: June 2, 2005Inventors: John Donohue, Hongyu Yue