Patents by Inventor John E. P. Syka

John E. P. Syka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8198580
    Abstract: A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies.
    Type: Grant
    Filed: February 22, 2010
    Date of Patent: June 12, 2012
    Assignee: Thermo Finnigan LLC
    Inventors: Jae C. Schwartz, John E. P. Syka, Scott T. Quarmby
  • Patent number: 8168943
    Abstract: Methods and apparatus for data-dependent mass spectrometric MS/MS or MSn analysis are disclosed. The methods may include determination of the charge state of an ion species of interest, followed by automated selection of a dissociation type (e.g., CAD, ETD, or ETD followed by a non-dissociative charge reduction or collisional activation) based at least partially on the determined charge state. The ion species of interest is then dissociated in accordance with the selected dissociation type, and an MS/MS or MSn spectrum of the resultant product ions may be acquired.
    Type: Grant
    Filed: August 27, 2007
    Date of Patent: May 1, 2012
    Assignee: Thermo Finnigan LLC
    Inventors: Jae C. Schwartz, John E. P. Syka, Andreas F. R. Huhmer, Joshua J. Coon
  • Publication number: 20110143451
    Abstract: A method is disclosed for operating a chemical ionization-type (CI-type) source to generate reagent ions for mass spectrometry experiments, such as electron transfer dissociation (ETD) reagent ions. The method includes periodically reversing current flow in the thermionic filament employed to produce the electron stream. Periodic reversal of the filament current avoids or reduces the problem of carbonaceous growth formation associated with prior art reagent ion sources.
    Type: Application
    Filed: December 14, 2010
    Publication date: June 16, 2011
    Inventors: John E. P. SYKA, Scott T. Quarmby
  • Patent number: 7928373
    Abstract: Ions in a predefined narrow mass to charge ratio range are isolated in an ion trap by adjusting the field and using ejection frequency waveform(s). The ejection waveforms have frequency components in a first and a second dimension, and, are applied across electrodes aligned along a first and a second dimension. Thus the mass-to-charge ratio isolation window is controlled and has an improved resolution without increasing the number of frequency components.
    Type: Grant
    Filed: March 2, 2007
    Date of Patent: April 19, 2011
    Assignee: Thermo Finnigan LLC
    Inventors: Scott T. Quarmby, Jae C. Schwartz, John E. P. Syka
  • Publication number: 20100148063
    Abstract: A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies.
    Type: Application
    Filed: February 22, 2010
    Publication date: June 17, 2010
    Inventors: Jae C. SCHWARTZ, John E.P. Syka, Scott T. Quarmby
  • Patent number: 7692142
    Abstract: A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies.
    Type: Grant
    Filed: December 13, 2006
    Date of Patent: April 6, 2010
    Assignee: Thermo Finnigan LLC
    Inventors: Jae C. Schwartz, John E. P. Syka, Scott T. Quarmby
  • Patent number: 7456396
    Abstract: Ions in a predefined narrow mass to charge ratio range are isolated in an ion trap by adjusting the field and using ejection frequency waveform(s). Thus the mass-to-charge ratio isolation window is controlled and has an improved resolution without increasing the number of frequency components.
    Type: Grant
    Filed: August 19, 2004
    Date of Patent: November 25, 2008
    Assignee: Thermo Finnigan LLC
    Inventors: Scott T. Quarmby, Jae C. Schwartz, John E. P. Syka
  • Publication number: 20080142705
    Abstract: A dual ion trap mass analyzer includes adjacently positioned first and second two-dimensional ion traps respectively maintained at relatively high and low pressures. Functions favoring high pressure (cooling and fragmentation) may be performed in the first trap, and functions favoring low pressure (isolation and analytical scanning) may be performed in the second trap. Ions may be transferred between the first and second trap through a plate lens having a small aperture that presents a pumping restriction and allows different pressures to be maintained in the two traps. The differential-pressure environment of the dual ion trap mass analyzer facilitates the use of high-resolution analytical scan modes without sacrificing ion capture and fragmentation efficiencies.
    Type: Application
    Filed: December 13, 2006
    Publication date: June 19, 2008
    Inventors: Jae C. Schwartz, John E.P. Syka, Scott T. Quarmby
  • Patent number: 7145139
    Abstract: Methods and apparatus for trapping or guiding ions. Ions are introduced into an ion trap or ion guide. The ion trap or ion guide includes a first set of electrodes and a second set of electrodes. The first set of electrodes defines a first portion of an ion channel to trap or guide the introduced ions. Periodic voltages are applied to electrodes in the first set of electrodes to generate a first oscillating electric potential that radially confines the ions in the ion channel, and periodic voltages are applied to electrodes in the second set of electrodes to generate a second oscillating electric potential that axially confines the ions in the ion channel.
    Type: Grant
    Filed: March 31, 2006
    Date of Patent: December 5, 2006
    Assignee: Thermo Finnigan LLC
    Inventor: John E. P. Syka
  • Patent number: 7026613
    Abstract: Methods and apparatus for trapping or guiding ions. Ions are introduced into an ion trap or ion guide. The ion trap or ion guide includes a first set of electrodes and a second set of electrodes. The first set of electrodes defines a first portion of an ion channel to trap or guide the introduced ions. Periodic voltages are applied to electrodes in the first set of electrodes to generate a first oscillating electric potential that radially confines the ions in the ion channel, and periodic voltages are applied to electrodes in the second set of electrodes to generate a second oscillating electric potential that axially confines the ions in the ion channel.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: April 11, 2006
    Assignee: Thermo Finnigan LLC
    Inventor: John E. P. Syka
  • Patent number: 6987261
    Abstract: Method and apparatus of controlling an ion population to be analyzed in a mass analyzer. Ions are accumulated for an injection time interval determined as a function of an ion accumulation rate and a predetermined desired population of ions. The accumulation rate represents a flow rate of ions from a source of ions into an ion accumulator. Ions derived from the accumulated ions are introduced into the mass analyzer for analysis.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: January 17, 2006
    Assignee: Thermo Finnigan LLC
    Inventors: Stevan Horning, Robert Malek, John E. P. Syka, Andreas Wieghaus
  • Patent number: 6844547
    Abstract: A circuit is described for applying RF and AC voltages to the elements or electrodes of an ion trap or ion guide. The circuit includes an RF transformer having a primary winding and a secondary winding. The secondary winding includes at least two filars. A broadband transformer adapted to be connected to a source of AC voltage applies AC voltage across the low-voltage end of two of the filars. Another broadband transformer connected to the filars at the high-voltage end provides a combined RF and AC output for application to selected electrodes. Also described is a circuit employing a multi-filar RF transformer and broadband transformers for applying RF and AC voltages to spaced rods of a linear ion trap. Also described is a circuit employing a multi-filar RF transformer and broadband transformers for applying RF and AC voltages to the electrodes in each section of a linear ion trap of the type having a center section and end sections, and different DC voltages to the electrodes in the end sections.
    Type: Grant
    Filed: February 3, 2003
    Date of Patent: January 18, 2005
    Assignee: Thermo Finnigan LLC
    Inventor: John E. P. Syka
  • Publication number: 20040217272
    Abstract: Method and apparatus of controlling an ion population to be analyzed in a mass analyzer. Ions are accumulated for an injection time interval determined as a function of an ion accumulation rate and a predetermined desired population of ions. The accumulation rate represents a flow rate of ions from a source of ions into an ion accumulator. Ions derived from the accumulated ions are introduced into the mass analyzer for analysis.
    Type: Application
    Filed: January 23, 2004
    Publication date: November 4, 2004
    Inventors: Stevan Horning, Robert Malek, John E. P. Syka, Andreas Weighaus
  • Publication number: 20030173524
    Abstract: A circuit is described for applying RF and AC voltages to the elements or electrodes of an ion trap or ion guide. The circuit includes an RF transformer having a primary winding and a secondary winding. The secondary winding includes at least two filars. A broadband transformer adapted to be connected to a source of AC voltage applies AC voltage across the low-voltage end of two of the filars. Another broadband transformer connected to the filars at the high-voltage end provides a combined RF and AC output for application to selected electrodes. Also described is a circuit employing a multi-filar RF transformer and broadband transformers for applying RF and AC voltages to spaced rods of a linear ion trap. Also described is a circuit employing a multi-filar RF transformer and broadband transformers for applying RF and AC voltages to the electrodes in each section of a linear ion trap of the type having a center section and end sections, and different DC voltages to the electrodes in the end sections.
    Type: Application
    Filed: February 3, 2003
    Publication date: September 18, 2003
    Inventor: John E.P. Syka
  • Patent number: 5756996
    Abstract: An external ion source assembly in which ion are formed in an ion volume by the interaction of energetic electrons and gas molecules. The effective energy of the electrons entering the ion volume is controlled by changing the voltage between the electron source (filament) and the ionization volume whereby ions having sufficient energy for ionizing atoms and molecules leave the electron source and enter the ionization volume only during an ionization period. The ion source assembly can be used both for electron impact ionization (EI) and for chemical ionization (CI).
    Type: Grant
    Filed: July 5, 1996
    Date of Patent: May 26, 1998
    Assignee: Finnigan Corporation
    Inventors: Mark E. Bier, John E. P. Syka, Dennis M. Taylor, William J. Fies
  • Patent number: 5420425
    Abstract: The present invention relates generally to an ion trap mass spectrometer for analyzing ions and more particularly to a substantially quadrupole ion trap mass spectrometer with an enlarged ion occupied volume. Described herein are electrode geometries that enlarge the ion occupied volume. Improved ion sensitivities, detection limits and dynamic range should be realized for the same charge density in these devices because the increased ion occupied volume allows for the storage of a greater number of ions. The essence of this invention is that these ion trap geometries may apply all modes of operation of substantially quadrupole ion traps such as the mass selective instability mode, resonance excitation/ejection, and MS.sup.n.
    Type: Grant
    Filed: May 27, 1994
    Date of Patent: May 30, 1995
    Assignee: Finnigan Corporation
    Inventors: Mark E. Bier, John E. P. Syka
  • Patent number: 5182451
    Abstract: A method of mass analyzing a sample including the steps of defining a trap volume with a three-dimensional quadrupole field for trapping ions within a predetermined range of mass-to-charge ratio, forming or injecting ions within the trap volume such that those within the predetermined mass-to-charge ratio range are trapped within the trap volume, applying a supplementary AC field superimposed on the three-dimensional quadrupole field to form combined fields, scanning the combined fields to eject ions of consecutive mass-to-charge ratio from the trap volume for detection characterized in that the supplementary field has an amplitude just sufficient to eject the ions and that the supplementary field has a beta value below 0.891 and that the combined fields are scanned at a rate so that a length of time corresponding to 200 cycles or more of the supplementary AC field passes per consecutive thomson.
    Type: Grant
    Filed: March 12, 1992
    Date of Patent: January 26, 1993
    Assignee: Finnigan Corporation
    Inventors: Jae C. Schwartz, John E. P. Syka, John N. Louris
  • Patent number: 5089703
    Abstract: Apparatus and method for mass analysis with improved resolution in an r.f.-only multipole mass spectrometer by use of a supplemental r.f. field which resonantly renders ions unstable. Further, the r.f. field is frequency modulated and the output signal demodulated for mass analysis.
    Type: Grant
    Filed: May 16, 1991
    Date of Patent: February 18, 1992
    Assignee: Finnigan Corporation
    Inventors: Alan E. Schoen, John E. P. Syka
  • Patent number: 4771172
    Abstract: A method is disclosed for increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode. Prior to mass analysis, a prescan is performed with the ion trap and the ionization and reaction periods are adjusted to produce enough stored product or analyte ions to generate a good signal-to-noise ratio in the detection of trace amounts of analyte, yet not so many analyte ions that resolution in the mass spectrum is lost. A mass analysis scan is then performed with the ion trap using the ionization and reaction periods predetermined during the prescan.
    Type: Grant
    Filed: May 22, 1987
    Date of Patent: September 13, 1988
    Assignee: Finnigan Corporation
    Inventors: Michael Weber-Grabau, Stephen C. Bradshaw, John E. P. Syka
  • Patent number: RE34000
    Abstract: A simple and economical method of mass analyzing a sample by means of a quadrupole ion trap mass spectrometer in an MS/MS mode comprises the steps of forming ions within a trap structure, changing the RF and DC voltages in such a way that the ions with mass-to-charge ratios within a desired range will be and remain trapped within the trap structure, dissociating such ions into fragments by collisions and increasing the field intensity again so that the generated fragments will become unstable and exit the trap volume sequentially to be detected. A supplementary AC field may be applied additionally to provide various scan modes as well as dissociate the ions.
    Type: Grant
    Filed: March 27, 1990
    Date of Patent: July 21, 1992
    Assignee: Finnigan Corporation
    Inventors: John E. P. Syka, John N. Louris, Paul E. Kelley, George C. Stafford, Walter E. Reynolds