Patents by Inventor John E. P. Syka

John E. P. Syka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fourtier transform quadrupole mass spectrometer and method
    Patent number: 4755670
    Abstract: A quadrupole mass spectrometer in which a sample to be analyzed is ionized in a two or three dimensional electrostatic trapping field, and the ions in the range of the mass-to-charge ratios to be analyzed are excited at their characteristic frequencies of motion. The excited ions generate image currents which are detected and processed to provide a mass spectrum.
    Type: Grant
    Filed: October 1, 1986
    Date of Patent: July 5, 1988
    Assignee: Finnigan Corporation
    Inventors: John E. P. Syka, William J. Fies, Jr.
  • Method of isolating a single mass in a quadrupole ion trap
    Patent number: 4749860
    Abstract: Method of isolating ions of selected mass in a quadrupole ion trap of the type including a ring electrode and end caps in which RF and AC voltages are applied to the ring electrode and end caps and scanned to trap a single ion of interest.
    Type: Grant
    Filed: June 5, 1986
    Date of Patent: June 7, 1988
    Assignee: Finnigan Corporation
    Inventors: Paul E. Kelley, George C. Stafford, Jr., John E. P. Syka
  • Method of operating ion trap detector in MS/MS mode
    Patent number: 4736101
    Abstract: A simple and economical method of mass analyzing a sample by means of a quadrupole ion trap mass spectrometer in an MS/MS mode comprises the steps of forming ions within a trap structure, changing the RF and DC voltages in such a way that the ions with mass-to-charge ratios within a desired range will be and remain trapped within the trap structure, dissociating such ions into fragments by collisions and increasing the field intensity again so that the generated fragments will become unstable and exit the trap volume sequentially to be detected. A supplementary AC field may be applied additionally to provide various scan modes as well as dissociate the ions.
    Type: Grant
    Filed: August 11, 1987
    Date of Patent: April 5, 1988
    Assignee: Finnigan Corporation
    Inventors: John E. P. Syka, John N. Louris, Paul E. Kelley, George C. Stafford, Walter E. Reynolds
  • Method of operating quadrupole ion trap chemical ionization mass spectrometry
    Patent number: 4686367
    Abstract: The method of performing chemical ionization and mass analysis with a quadrupole ion trap.
    Type: Grant
    Filed: September 6, 1985
    Date of Patent: August 11, 1987
    Assignee: Finnigan Corporation
    Inventors: John N. Louris, John E. P. Syka, Paul E. Kelley
  • Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap
    Patent number: 4650999
    Abstract: The method of operating a quadrupole ion trap in which the mass range of interest is analyzed in segments by trapping ions of successive mass ranges within the segments whereby the operating parameters for each segment may be selected to improve sensitivity and resolution.
    Type: Grant
    Filed: October 22, 1984
    Date of Patent: March 17, 1987
    Assignee: Finnigan Corporation
    Inventors: William J. Fies, Jr., Paul E. Kelley, Walter E. Reynolds, George C. Stafford, Jr., John E. P. Syka