Patents by Inventor John H. Burdett
John H. Burdett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10256002Abstract: A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.Type: GrantFiled: October 26, 2016Date of Patent: April 9, 2019Assignee: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu Chen, Rory D. Delaney, John H. Burdett, Kai Xin
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Patent number: 9633753Abstract: A mobile transport and shielding apparatus, which holds an x-ray analyzer for transport between operating sites, and also serves as a shielded, operational station for holding the x-ray analyzer during operation thereof. The x-ray analyzer is removably insertable into the apparatus and is operable either within the mobile transport and shielding apparatus, or outside of the apparatus. The apparatus may provide means to control, power, cool, and/or charge the x-ray analyzer during operation of the analyzer; and also means to transport the analyzer (e.g., a handle).Type: GrantFiled: May 9, 2016Date of Patent: April 25, 2017Assignee: X-RAY OPTICAL SYSTEMS, INC.Inventors: Steven M. Pomerantz, John H. Burdett, Rory D. Delaney
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Publication number: 20170110212Abstract: A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.Type: ApplicationFiled: October 26, 2016Publication date: April 20, 2017Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu CHEN, Rory D. DELANEY, John H. BURDETT, Kai XIN
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Publication number: 20160260514Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: ApplicationFiled: May 16, 2016Publication date: September 8, 2016Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu CHEN, David M. GIBSON, Walter M. GIBSON, Adam BAILEY, R. Scott SEMKEN, Kai XIN, John H. BURDETT, JR.
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Publication number: 20160254068Abstract: A mobile transport and shielding apparatus, which holds an x-ray analyzer for transport between operating sites, and also serves as a shielded, operational station for holding the x-ray analyzer during operation thereof. The x-ray analyzer is removably insertable into the apparatus and is operable either within the mobile transport and shielding apparatus, or outside of the apparatus. The apparatus may provide means to control, power, cool, and/or charge the x-ray analyzer during operation of the analyzer; and also means to transport the analyzer (e.g., a handle).Type: ApplicationFiled: May 9, 2016Publication date: September 1, 2016Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Steven M. POMERANTZ, John H. BURDETT, Rory D. DELANEY
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Patent number: 9360440Abstract: A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.Type: GrantFiled: March 13, 2014Date of Patent: June 7, 2016Assignee: X-RAY OPTICAL SYSTEMS, INC.Inventors: George Allen, John H. Burdett, Jr., Zewu Chen, Leslie Johnson
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Patent number: 9343193Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: GrantFiled: June 1, 2015Date of Patent: May 17, 2016Assignee: X-RAY OPTICAL SYSTEMS, INCInventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett, Jr.
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Patent number: 9335280Abstract: A mobile transport and shielding apparatus, which holds an x-ray analyzer for transport between operating sites, and also serves as a shielded, operational station for holding the x-ray analyzer during operation thereof. The x-ray analyzer is removably insertable into the apparatus and is operable either within the mobile transport and shielding apparatus, or outside of the apparatus. The apparatus may provide means to control, power, cool, and/or charge the x-ray analyzer during operation of the analyzer; and also means to transport the analyzer (e.g., a handle).Type: GrantFiled: October 3, 2012Date of Patent: May 10, 2016Assignee: X-RAY OPTICAL SYSTEMS, INC.Inventors: Steven M. Pomerantz, John H. Burdett, Rory D. Delaney
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Publication number: 20150262722Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: ApplicationFiled: June 1, 2015Publication date: September 17, 2015Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu CHEN, David M. GIBSON, Walter M. GIBSON, Adam BAILEY, R. Scott SEMKEN, Kai XIN, John H. BURDETT, Jr.
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Patent number: 9048001Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: GrantFiled: October 11, 2013Date of Patent: June 2, 2015Assignee: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett, Jr.
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Publication number: 20140328468Abstract: A mobile transport and shielding apparatus, which holds an x-ray analyzer for transport between operating sites, and also serves as a shielded, operational station for holding the x-ray analyzer during operation thereof. The x-ray analyzer is removably insertable into the apparatus and is operable either within the mobile transport and shielding apparatus, or outside of the apparatus. The apparatus may provide means to control, power, cool, and/or charge the x-ray analyzer during operation of the analyzer; and also means to transport the analyzer (e.g., a handle).Type: ApplicationFiled: October 3, 2012Publication date: November 6, 2014Inventors: Steven M. Pomerantz, John H. Burdett, Rory D. Delaney
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Publication number: 20140294157Abstract: A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.Type: ApplicationFiled: October 25, 2012Publication date: October 2, 2014Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu Chen, Rory D. Delaney, John H. Burdett, Kai Xin
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Publication number: 20140270063Abstract: A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.Type: ApplicationFiled: March 13, 2014Publication date: September 18, 2014Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: George ALLEN, John H. BURDETT, JR., Zewu CHEN, Leslie JOHNSON
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Publication number: 20140105363Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: ApplicationFiled: October 11, 2013Publication date: April 17, 2014Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu CHEN, David M. GIBSON, Walter M. GIBSON, Adam BAILEY, R. Scott SEMKEN, Kai XIN, John H. BURDETT, JR.
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Patent number: 8559597Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: GrantFiled: March 3, 2009Date of Patent: October 15, 2013Assignee: X-Ray Optical Systems, Inc.Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett
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Publication number: 20110170666Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.Type: ApplicationFiled: March 3, 2009Publication date: July 14, 2011Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: Zewu Chen, David M. Gibson, Walter M. Gibson, Adam Bailey, R. Scott Semken, Kai Xin, John H. Burdett
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Patent number: 7738630Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.Type: GrantFiled: March 4, 2009Date of Patent: June 15, 2010Assignee: X-Ray Optical Systems, Inc.Inventors: John H. Burdett, Jr., Adam Bailey, Zewu Chen, R. Scott Semken, Kai Xin
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Patent number: 7729471Abstract: A sample cell for an analysis instrument, having an outer body forming a sample reservoir therein; a directional fill valve disposed in an upper end of the outer body and forming an upper end of the sample reservoir, the fill valve for accepting a sample during filling, and preventing sample leakage while providing venting after filling; and a film covering a lower end of the outer body, and forming a bottom end of the sample reservoir, the film for presenting the sample to an analysis focal spot of the analysis instrument. The disclosed sample cell is especially suited for an x-ray analysis engine having a focal spot requiring alignment with the sample in the sample cell. At least one x-ray optic may be disposed in an excitation and/or detection path, requiring alignment to the focal spot, in e.g., a WDXRF or EDXRF system.Type: GrantFiled: November 26, 2008Date of Patent: June 1, 2010Assignee: X-Ray Optical Systems, Inc.Inventors: John H. Burdett, Jr., Daniel L. Dunham, James B. Quinn
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Publication number: 20090225948Abstract: An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.Type: ApplicationFiled: March 4, 2009Publication date: September 10, 2009Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: John H. BURDETT, JR., Adam BAILEY, Zewu CHEN, R. Scott SEMKEN, Kai XIN
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Patent number: D628709Type: GrantFiled: April 8, 2010Date of Patent: December 7, 2010Assignee: X-Ray Optical Systems, Inc.Inventors: John H. Burdett, Jr., Daniel L. Dunham, James B. Quinn