Sample cell for x-ray analyzer

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Description

FIG. 1 is a first perspective view of a sample cell for x-ray analyzer comprising the new design;

FIG. 2 is second perspective view thereof;

FIG. 3 is a front side elevational view thereof, the rear side elevational view being a mirror image thereof;

FIG. 4 is a right side elevational view thereof, the left side elevational view being a mirror image thereof;

FIG. 5 is a top view thereof; and,

FIG. 6 is a bottom view thereof.

The broken lines in the drawing views are included for the purpose of illustrating portions of the sample cell for x-ray analyzer that form no part of the claimed design.

Claims

The ornamental design for a sample cell for x-ray analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
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D616093 May 18, 2010 Kawamura
Other references
  • Office Action for U.S. Appl. No. 29/298,204, dated Apr. 28, 2009.
  • Office Action for U.S. Appl. No. 29/298,204, dated Oct. 15, 2009.
Patent History
Patent number: D628709
Type: Grant
Filed: Apr 8, 2010
Date of Patent: Dec 7, 2010
Assignee: X-Ray Optical Systems, Inc. (East Greenbush, NY)
Inventors: John H. Burdett, Jr. (Charlton, NY), Daniel L. Dunham (Averill Park, NY), James B. Quinn (Ravena, NY)
Primary Examiner: T. Chase Nelson
Assistant Examiner: Anhdao Doan
Attorney: Heslin Rothenberg Farley & Mesiti P.C.
Application Number: 29/359,297
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)