Abstract: An example method of trimming a voltage reference in an integrated circuit (IC) includes at a first temperature, sequencing through a first plurality of trim codes for a reference circuit of the voltage reference configured to generate a proportional-to-temperature current and a corresponding first control voltage, and a complementary-to-temperature current and a corresponding second control voltage. The method further includes measuring a voltage output of the voltage reference for each of the first plurality of trim codes to obtain first voltage output values. The method further includes at a second temperature, sequencing through a second plurality of trim codes for the reference circuit. The method further includes measuring the voltage output of the voltage reference for each of the second plurality of trim codes to obtain second voltage output values. The method further includes selecting a trim code for the reference circuit based on the first voltage output values and the second voltage output values.

Abstract: An integrated circuit includes a reference voltage circuit. The reference voltage circuit includes a bipolar junction transistor (BJT) configured to receive a first current during a first phase of a clock cycle to generate a first base-emitter junction voltage, and receive a second current during a second phase of the clock cycle to generate a second base-emitter junction voltage. The reference voltage circuit includes a switched capacitor circuit configured to provide a reference voltage associated with the first base-emitter junction voltage and the second base-emitter junction voltage.

Abstract: A circuit for implementing a multifunction output generator is described. The circuit comprises an amplifier circuit having a first input and a second input; a voltage generator coupled at a first node to a first input of the amplifier circuit; a controllable current source configured to provide a variable current to the first node; and a switching circuit enabling the operation of the amplifier circuit in a first mode for sensing a temperature and a second mode for providing a reference voltage. A method of implementing a multifunction output generator is described.

Abstract: An integrated circuit includes a reference voltage circuit. The reference voltage circuit includes a bipolar junction transistor (BJT) configured to receive a first current during a first phase of a clock cycle to generate a first base-emitter junction voltage, and receive a second current during a second phase of the clock cycle to generate a second base-emitter junction voltage. The reference voltage circuit includes a switched capacitor circuit configured to provide a reference voltage associated with the first base-emitter junction voltage and the second base-emitter junction voltage.

Abstract: The disclosed IC includes a load circuit and a temperature sensor circuit. The temperature sensor circuit measures temperature of the IC and stores temperature data in a register. An SEL mitigation circuit monitors the IC for a temperature change indicative of an SEL. A temperature change greater than a threshold over a time interval is indicative of an SEL. The SEL mitigation circuit is configured to reduce voltage applied to the IC to a voltage level that clears an SEL in the IC in response to a temperature change exceeding the threshold and to increase voltage applied to the load circuit after the reduction in voltage.

Abstract: A system configured for detecting electrical overstress events within an integrated circuit includes a comparator configured to determine whether a monitored voltage level of a monitored signal exceeds an overstress reference voltage level. The overstress reference voltage level is a predetermined amount of voltage above a nominal voltage level for the monitored signal. The system further includes a write circuit coupled to an output of the comparator. The write circuit is configured to indicate an occurrence of an electrical overstress event within the integrated circuit responsive to the comparator determining that the monitored voltage level exceeds the overstress reference voltage level.

Abstract: Various example implementations are directed to circuits and methods for generating a clock signal. According to an example embodiment, a circuit arrangement includes a relaxation oscillator configured to output a clock signal. The clock signal has an oscillation frequency dependent on a reference current provided to the relaxation oscillator, an operating temperature of the relaxation oscillator, and a supply voltage used to power the relaxation oscillator. The circuit arrangement also includes a current source coupled to the relaxation oscillator and configured to generate the reference current. The current source is configured to adjust the reference current, in response to a change in one or more of the temperature of the relaxation oscillator and the supply voltage, to inhibit change in the oscillation frequency of the clock signal.

Abstract: In an example, an apparatus includes an analog switch having an n-type metal oxide semiconductor (NMOS) circuit in parallel with a p-type metal oxide semiconductor (PMOS) circuit between a switch input and a switch output. The analog switch is responsive to an enable signal that determines switch state thereof. The NMOS circuit includes a switch N-channel transistor coupled to a buffer N-channel transistor, a gate of the switch N-channel transistor coupled to the enable signal and a gate of the buffer N-channel transistor coupled to a modulated N-channel gate voltage. The PMOS circuit including a switch P-channel transistor coupled to a buffer P-channel transistor, a gate of the switch P-channel transistor coupled to a complement of the enable signal and a gate of the buffer P-channel transistor coupled to a modulated P-channel gate voltage.

Abstract: In an example implementation, an integrated circuit (IC) includes: a plurality of transistors disposed in a plurality of locations on a die of the IC; conductors coupled to terminals of each of the plurality of transistors; a digital-to-analog converter (DAC), coupled to the conductors, to drive voltage signals to the plurality of transistors in response to a digital input; and an analog-to-digital converter (ADC), coupled to at least a portion of the conductors, to generate samples in response to current signals induced in the plurality of transistors in response to the voltage signals, the samples being indicative of at least one electrostatic characteristic for the plurality of transistors.

Abstract: Devices for isolating an input from an output are disclosed. For example, a device includes a first p-type metal oxide semiconductor transistor and a first circuit. A source of the first p-type metal oxide semiconductor transistor is connected to an input of the device. The first circuit is for delivering a signal on the input of the device to a gate of the first p-type metal oxide semiconductor transistor when an enable signal is deactivated and for delivering a ground voltage to the gate of the first p-type metal oxide semiconductor transistor when the enable signal is activated.

Abstract: A circuit for implementing a charge/discharge switch in an integrated circuit is described. The circuit comprises a supply bias path coupled to a first node, wherein the supply bias path provides a charging bias current to the first node; a charge transistor connected between the first node and a first terminal of a capacitor; a charge switch coupled between the first node and a ground potential, wherein the charge switch enables charging of the capacitor by way of the first node; a discharge transistor connected between the first terminal of the capacitor and a second node; a discharge switch coupled between the second node and a reference voltage, wherein the discharge switch enables discharging of the capacitor by way of the second node; and a ground bias path coupled between the second node and ground, wherein the ground bias path provides a discharging bias current to the second node. A method of implementing a charge/discharge switch in an integrated circuit is also described.

Abstract: Devices for isolating an input from an output are disclosed. For example, a device includes a first p-type metal oxide semiconductor transistor and a first circuit. A source of the first p-type metal oxide semiconductor transistor is connected to an input of the device. The first circuit is for delivering a signal on the input of the device to a gate of the first p-type metal oxide semiconductor transistor when an enable signal is deactivated and for delivering a ground voltage to the gate of the first p-type metal oxide semiconductor transistor when the enable signal is activated.

Abstract: An apparatus relating generally to digital-to-analog conversion is disclosed. In such an apparatus, a digital-to-analog converter (“DAC”) device includes a source DAC and a sink DAC selectively coupled to one another. The source DAC provides a first bias to the sink DAC in a sink mode, and the sink DAC provides a second bias to the source DAC in a source mode.

Abstract: A circuit includes an amplifier including a differential input stage including a first input terminal and a second input terminal. The circuit further includes a differential input line coupled to the first input terminal and the second input terminal, and shielding at least partially encompassing the differential input line. The shielding is connected to a node of the differential input stage of the amplifier.

Abstract: An A/D converter including a folding stage and a plurality of conversion stages is described. The folding stage determines a sub-range in which an input analog voltage falls and adjusts the input analog voltage by a folding voltage offset corresponding to the determined sub-ranges to produce a residue voltage. Each following converter stage determines a voltage range in which the residue voltage falls. The converter stage multiplies the residue voltage by a factor of N to produce an intermediate voltage. The conversion stage selects a cyclic voltage offset corresponding to the sub-ranges in which the residue voltage falls and adjusts the intermediate voltage by the cyclic voltage offset to produce a new residue voltage.

Abstract: An integrated circuit includes a pass gate having an input and an output. An NMOS pass transistor is connected between the input and the output. The drain of the NMOS pass transistor is connected to the input and the source of the NMOS pass transistor is connected to a node between the source of the NMOS transistor and the output of the pass gate. A current clamp is connected between the node and a current sink so as to conduct current to the current sink when the node reaches a threshold value.

Abstract: Method and apparatus for interpolation of signals from a delay line is described. An input signal is obtained from which progressively delayed input signals are generated from the input signal. Two of the progressively delayed input signals are accessed and interpolated to provide a phase-adjusted signal.

Abstract: Method and apparatus for a system monitor embedded in a programmable logic device are described. The system monitor includes a dynamic reconfiguration port interface for configuring or reconfiguring the system monitor during operation thereof. The system monitor includes an analog-to-digital converter which is reconfigurable responsive to input via a dynamic reconfiguration port.

Abstract: Method and apparatus for a system monitor embedded in a programmable logic device are described. The system monitor includes a dynamic reconfiguration port interface for configuring or reconfiguring the system monitor during operation thereof. The system monitor includes an analog-to-digital converter which is reconfigurable responsive to input via a dynamic reconfiguration port.

Abstract: Method and apparatus for a system monitor (20) embedded in a programmable logic device (10, 50, 60) are described. The system monitor (20) includes a dynamic reconfiguration port interface (205) for configuring or reconfiguring the system monitor (20) during operation thereof. The system monitor (20) includes an analog-to-digital converter (200) which is reconfigurable responsive to input via a dynamic reconfiguration port (201).