Patents by Inventor John T. Strom

John T. Strom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Stereoscopic three-dimensional metrology system and method
    Patent number: 7231081
    Abstract: A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: June 12, 2007
    Assignee: Applied Precision, LLC
    Inventors: Donald B. Snow, Raymond H. Kraft, John T. Strom
  • System and method of mitigating effects of component deflection in a probe card analyzer
    Patent number: 7170307
    Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.
    Type: Grant
    Filed: March 12, 2004
    Date of Patent: January 30, 2007
    Assignee: Applied Precision, LLC
    Inventor: John T. Strom
  • Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
    Patent number: 7102368
    Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.
    Type: Grant
    Filed: February 27, 2004
    Date of Patent: September 5, 2006
    Assignee: Applied Precision, LLC
    Inventor: John T. Strom
  • System and method of mitigating effects of component deflection in a probe card analyzer
    Publication number: 20040227533
    Abstract: A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed electrical planarity measurements with fast optical planarity measurements to produce “effectively loaded” planarity measurements.
    Type: Application
    Filed: March 12, 2004
    Publication date: November 18, 2004
    Inventor: John T. Strom
  • Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
    Publication number: 20040227504
    Abstract: By examining scrub mark properties (such as position and size) directly, the performance of a wafer probing process may be evaluated. Scrub mark images are captured, image data measured, and detailed information about the process is extracted through analysis. The information may then be used to troubleshoot, improve, and monitor the probing process.
    Type: Application
    Filed: February 27, 2004
    Publication date: November 18, 2004
    Applicant: Applied Precision, LLC
    Inventor: John T. Strom
  • System and method of measuring probe float
    Publication number: 20040222808
    Abstract: A system and method allow accurate calculation of probe float through optical free-hanging and electrical planarity measurement techniques. In accordance with an examplary embodiment, probe float may be determined by acquiring a free-hanging planarity measurement, obtaining a first electrical contact planarity measurement, and calculating probe float using results of the acquiring and the obtaining operations.
    Type: Application
    Filed: March 15, 2004
    Publication date: November 11, 2004
    Inventors: John T. Strom, Raymond H. Kraft
  • Stereoscopic three-dimensional metrology system and method
    Publication number: 20030142862
    Abstract: A stereoscopic three-dimensional optical metrology system and method accurately measure the location of physical features on a test article in a manner that is fast and robust to surface contour discontinuities. Disclosed embodiments may image a test article from two or more perspectives through a substantially transparent fiducial plate bearing a fiducial marking; camera viewing angles and apparent relative distances between a feature on a test article and one or more fiducials may enable accurate calculation of feature position.
    Type: Application
    Filed: December 18, 2002
    Publication date: July 31, 2003
    Inventors: Donald B. Snow, Raymond H. Kraft, John T. Strom
  • Dual-axis scanning system and method
    Publication number: 20030138139
    Abstract: An image acquisition system and method may employ a non-orthogonal optical axis. The optical axis may be established in such a manner as to position a focal plane of an imaging device in a selected orientation relative to the object space. Such selective positioning and orientation of the focal plane allows the integration of two coordinate axes and enables dual-axis scanning of the object space. In some embodiments, the focal plane may extend throughout the entire depth dimension of the object space.
    Type: Application
    Filed: December 18, 2002
    Publication date: July 24, 2003
    Inventor: John T. Strom