Patents by Inventor Jong Baek

Jong Baek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120038873
    Abstract: A liquid crystal display device, including a first substrate, a thin-film transistor on the first substrate and including a gate electrode, a gate insulating layer, an active layer, and source and drain electrodes, an organic insulating layer on the thin-film transistor, a first electrode layer on the organic insulating layer, the first electrode layer extending between respective portions of the organic insulating layer to contact the source and drain electrode, a black layer on the first electrode layer and the organic insulating layer, a liquid crystal layer on the black layer, a second electrode layer on the liquid crystal layer, and a second substrate on the second electrode layer. The liquid crystal may include a cholesteric liquid crystal layer or a polymer network liquid crystal (PNLC).
    Type: Application
    Filed: March 28, 2011
    Publication date: February 16, 2012
    Inventors: Jae-Hyun Kim, Won-Sang Park, Jae-Ik Lim, Jong-In Baek, Gee-Bum Kim, Yong-Seok Yeo
  • Patent number: 8053173
    Abstract: A novel multi-functional linear siloxane compound, a siloxane polymer prepared from the siloxane compound, and a process for forming a dielectric film by using the siloxane polymer. The linear siloxane polymer has enhanced mechanical properties (e.g., modulus), superior thermal stability, a low carbon content and a low hygroscopicity and is prepared by the homopolymerization of the linear siloxane compound or the copolymerization of the linear siloxane compound with another monomer. A dielectric film can be produced by heat-curing a coating solution containing the siloxane polymer which is highly reactive. The siloxane polymer prepared from the siloxane compound not only has satisfactory mechanical properties, thermal stability and crack resistance, but also exhibits a low hygroscopicity and excellent compatibility with pore-forming materials, which leads to a low dielectric constant.
    Type: Grant
    Filed: July 15, 2009
    Date of Patent: November 8, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jae Jun Lee, Jong Baek Seon, Hyun Dam Jeong, Jin Heong Yim, Hyeon Jin Shin
  • Publication number: 20110256485
    Abstract: An etchant composition that allows simplification and optimization of semiconductor manufacturing process is presented, along with a method of patterning a conductive layer using the etchant and a method of manufacturing a flat panel display using the etchant. The etchant includes nitric acid, phosphoric acid, acetic acid, and an acetate compound in addition to water.
    Type: Application
    Filed: June 23, 2011
    Publication date: October 20, 2011
    Inventors: Bong-Kyun KIM, Hong-Sick Park, Jong-Hyun Choung, Sun-Young Hong, Ji-Sun Lee, Byeong-Jin Lee, Kui-Jong Baek, Tai-Hyung Rhee, Yong-Sung Song
  • Publication number: 20110233539
    Abstract: Oxide thin film, electronic devices including the oxide thin film and methods of manufacturing the oxide thin film, the methods including (A) applying an oxide precursor solution comprising at least one of zinc (Zn), indium (In) and tin (Sn) on a substrate, (B) heat-treating the oxide precursor solution to form an oxide layer, and (C) repeating the steps (A) and (B) to form a plurality of the oxide layers.
    Type: Application
    Filed: March 28, 2011
    Publication date: September 29, 2011
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Jong-Baek Seon, Myung-Kwan Ryu, Kyung-Bae Park, Sang-Yoon Lee, Bon-Won Koo
  • Publication number: 20110227064
    Abstract: Thin film transistors including a semiconductor channel disposed between a drain electrode and a source electrode; and a gate insulating layer disposed between the semiconductor channel and a gate electrode wherein the semiconductor channel includes a first metal oxide, the gate insulating layer includes a second metal oxide, and at least one metal of the second metal oxide is the same as at least one metal of the first metal oxide, methods of manufacturing thin film transistors, and semiconductor device including thin film transistors.
    Type: Application
    Filed: March 22, 2011
    Publication date: September 22, 2011
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Kyung-Bae Park, Myung-Kwan Ryu, Jong-Baek Seon, Sang-Yoon Lee, Bon-Won Koo
  • Patent number: 7989361
    Abstract: This invention pertains to a composition for a dielectric thin film, which is capable of being subjected to a low-temperature process. Specifically, the invention is directed to a metal oxide dielectric thin film formed using the composition, a preparation method thereof, a transistor device comprising the dielectric thin film, and an electronic device comprising the transistor device. The electronic device to which the dielectric thin film has been applied exhibits excellent electrical properties, thereby satisfying both a low operating voltage and a high charge mobility.
    Type: Grant
    Filed: July 31, 2007
    Date of Patent: August 2, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jong Baek Seon, Hyun Dam Jeong, Sang Yoon Lee
  • Patent number: 7985982
    Abstract: An etchant composition that allows simplification and optimization of semiconductor manufacturing process is presented, along with a method of patterning a conductive layer using the etchant and a method of manufacturing a flat panel display using the etchant. The etchant includes nitric acid, phosphoric acid, acetic acid, and an acetate compound in addition to water.
    Type: Grant
    Filed: February 24, 2009
    Date of Patent: July 26, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Bong-Kyun Kim, Hong-Sick Park, Jong-Hyun Choung, Sun-Young Hong, Ji-Sun Lee, Byeong-Jin Lee, Kui-Jong Baek, Tai-Hyung Rhee, Yong-Sung Song
  • Publication number: 20110142188
    Abstract: Disclosed is an apparatus for removing a thermal sleeve from a cold leg of a reactor coolant system, which removes an unintentionally separated thermal sleeve without pipe cutting, preventing invasion of impurities into pipes and achieving reliable pipe re-welding. The apparatus includes a sleeve removal tool including a corn head formed at a shaft, a pressure plate below the corn head to maximize hydraulic pressure inside a safety injection pipe, a spring connected to the pressure plate to keep the pressure plate unfolded, and a guide wheel to guide the sleeve removal tool into the safety injection pipe, a horizontal movement carrier including bodies connected to each other by a link, a seating rod for seating of the sleeve removal tool, and moving wheels for movement of the horizontal movement carrier, and a vertical movement carrier including first and second anti-separation bars to prevent separation of the horizontal movement carrier.
    Type: Application
    Filed: April 14, 2010
    Publication date: June 16, 2011
    Applicant: KPS CO., LTD.
    Inventors: Won Jong BAEK, Sung Ho JANG, Bum Suk LEE, Ki Tae SONG
  • Publication number: 20110142187
    Abstract: Disclosed is a method for removing a thermal sleeve from a cold leg of a reactor coolant system, which enables removal of an unintentionally separated thermal sleeve without implementation of a pipe cutting operation, preventing invasion of impurities into pipes and securing reliability in repetitious welding of the pipes. In particular, the method enables a remote operation and an underwater operation using wire ropes, thus being capable of minimizing a negative effect on workers due to radiation exposure.
    Type: Application
    Filed: March 11, 2010
    Publication date: June 16, 2011
    Applicant: KPS CO., LTD.
    Inventors: Won Jong BAEK, Sung Ho JANG, Bum Suk LEE
  • Patent number: 7951765
    Abstract: The present invention relates to a photoresist stripper composition for removing the photoresist in the manufacturing process of the semiconductor device. More particularly, the photoresist stripper composition comprises 3-20 wt % of hydrazine hydrate or amine compound; 20˜40 wt % of polar solvent; 0.01-3 wt % of corrosion inhibitor selected from the group consisting of imidazoline derivative, sulfide derivative, sulfoxide derivative, aromatic compound or aromatic compound with hydroxyl group; 0.01-5 wt % of monoalcohol compound of C2-C10; and 40-70 wt % of deionized water. The photoresist stripper composition for manufacturing the semiconductor can remove the photoresist film thermoset by hard bake, dry etching, ashing or ion implantation and denatured by the metallic by-product etched from the bottom metallic film in said process at low temperature easily and quickly, and minimize the corrosion of the bottom metallic wiring in the removing process of the photoresist.
    Type: Grant
    Filed: August 5, 2006
    Date of Patent: May 31, 2011
    Assignee: Techno Semichem Co., Ltd.
    Inventors: Hyun Tak Kim, Seong Hwan Park, Jung Hun Lim, Sung Bae Kim, Chan Jin Jeong, Kui Jong Baek
  • Publication number: 20110113088
    Abstract: A method and an apparatus for providing a remote user interface (UI) service are provided. The method includes receiving an event message including a uniform resource locator (URL) for accessing a UI resource from a remote UI server device; obtaining the UI resource from the remote UI server device using the URL; receiving text input for controlling the remote UI server device using the UI resource; and transmitting the text to the remote UI server device.
    Type: Application
    Filed: April 29, 2010
    Publication date: May 12, 2011
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Ju-hee SEO, Young-chul SOHN, Jong-baek KIM
  • Publication number: 20110045741
    Abstract: Disclosed is a chemical-mechanical polishing composition used in a process for chemical-mechanical polishing of silicon oxide layer having severe unevenness with large step-height. The composition includes abrasive particles of metal oxide; and at least one compound(s) selected from the group consisting of amino alcohols, hydroxycarboxylic acid having at least 3 of the total number of carboxylic acid group(s) and hydroxyl group(s) or their salts, or a mixture thereof. A polymeric organic acid, a preservative, a lubricant and a surfactant may be further contained. The composition shortens the vapor-deposition time of a layer to be polished, saves the raw material to be vapor-deposited, shortens the chemical-mechanical polishing time, and saves the slurry employed.
    Type: Application
    Filed: April 28, 2006
    Publication date: February 24, 2011
    Applicant: TECHNO SEMICHEM CO., LTD.
    Inventors: Jung-Ryul Ahn, Jong-Kwan Park, Seok-Ju Kim, Eun-Il Jeong, Deok-Su Han, Hyu-Bum Park, Kui-Jong Baek, Tae-Kyeong Lee
  • Patent number: 7879951
    Abstract: An organic insulator composition according to example embodiments may include an organic insulating polymer and an epoxy-based crosslinking agent. The epoxy-based crosslinking agent may have an alkyl group or a fluorine-based side chain. The organic insulator composition may be used to form an organic insulating layer having increased chemical resistance. The organic insulating layer may be used in an organic thin film transistor as a gate insulating layer. Consequently, the occurrence of hysteresis may be reduced or prevented during the operation of the organic thin film transistor, thus resulting in relatively homogeneous properties.
    Type: Grant
    Filed: July 17, 2008
    Date of Patent: February 1, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Eun Kyung Lee, Joo Young Kim, Jong Baek Seon
  • Patent number: 7851372
    Abstract: In one aspect, a composition is provided which is capable of removing an insulation material which includes at least one of a low-k material and a passivation material. The composition of this aspect includes about 5 to about 40 percent by weight of a fluorine compound, about 0.01 to about 20 percent by weight of a first oxidizing agent, about 10 to about 50 percent by weight of a second oxidizing agent, and a remaining water.
    Type: Grant
    Filed: October 2, 2006
    Date of Patent: December 14, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong-Min Kang, Kui-Jong Baek, Woong Hahn, Chun-Deuk Lee, Jung-Hun Lim, Young-Nam Kim, Hyun-Joon Kim
  • Publication number: 20100258793
    Abstract: A solution composition for forming an oxide thin film may include a first compound including zinc, a second compound including indium, and a third compound including magnesium or hafnium, and an electronic device may include an oxide semiconductor including zinc, indium, and magnesium. The zinc and hafnium may be included at an atomic ratio of about 1:0.01 to about 1:1.
    Type: Application
    Filed: April 9, 2010
    Publication date: October 14, 2010
    Inventors: Jong-Baek Seon, Hyun-Jae Kim, Sang-Yoon Lee, Myung-Kwan Ryu, Hyun-Soo Shin, Kyung-Bae Park, Woong-Hee Jeong, Gun-Hee Kim, Byung-Du Ahn
  • Publication number: 20100217981
    Abstract: Provided is a method of performing secured communication. In the method, a secured communication request for performing secured communication is received from the second device, a security key required for the secured communication is randomly generated and output, and a plurality of pieces of data encrypted using the security key are transmitted and received to and from the second device.
    Type: Application
    Filed: September 3, 2009
    Publication date: August 26, 2010
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Ho JIN, Young-chul SOHN, Jong-baek KIM, Il-joo KIM
  • Publication number: 20100210069
    Abstract: Disclosed is a solution composition for forming a thin film transistor including a zinc-containing compound, an indium-containing compound, and a compound including at least one metal or metalloid selected from the group consisting of hafnium (Hf), magnesium (Mg), tantalum (Ta), cerium (Ce), lanthanum (La), silicon (Si), germanium (Ge), vanadium (V), niobium (Nb), and yttrium (Y). A method of forming a thin film by using the solution composition, and a method of manufacturing thin film transistor including the thin film are also disclosed.
    Type: Application
    Filed: February 12, 2010
    Publication date: August 19, 2010
    Inventors: Jong-Baek Seon, Sang-Yoon Lee, Jeong-il Park, Myung-Kwan Ryu, Kyung-Bae Park
  • Patent number: 7750176
    Abstract: A multi-functional cyclic siloxane compound (A), a siloxane-based (co)polymer prepared from the compound (A), or compound (A) and at least one of a Si monomer having organic bridges (B), an acyclic alkoxy silane monomer (C), and a linear siloxane monomer (D); and a process for preparing a dielectric film using the polymer. The siloxane compound of the present invention is highly reactive, so the polymer prepared from the compound is excellent in mechanical properties, thermal stability and crack resistance, and has a low dielectric constant resulting from compatibility with conventional pore-generating materials. Furthermore, a low content of carbon and high content of SiO2 enhance its applicability to the process of producing a semiconductor, wherein it finds great use as a dielectric film.
    Type: Grant
    Filed: June 29, 2009
    Date of Patent: July 6, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyeon Jin Shin, Hyun Dam Jeong, Jong Baek Seon, Sang Kook Mah, Jin Heong Yim, Jae Jun Lee, Kwang Hee Lee, Jung Bae Kim
  • Publication number: 20100148229
    Abstract: An insulating resin composition is provided. The insulating resin composition includes (A) a silicon-based polymer having either primary or secondary amine groups or both, (B) an organometallic compound, and (C) a solvent. The physicochemical properties of the insulating resin composition are maintained during processing steps for the fabrication of a semiconductor device. Therefore, the use of the insulating resin composition prevents deterioration of the characteristics of the semiconductor device arising from defects, spots, aggregates, and the like, in an insulating film and reduces the hysteresis of the semiconductor device to improve the characteristics of the semiconductor device.
    Type: Application
    Filed: July 29, 2009
    Publication date: June 17, 2010
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Eun Jeong JEONG, Jong Baek SEON
  • Publication number: 20100096634
    Abstract: Provided may be a panel structure, a display device including the panel structure, and methods of manufacturing the panel structure and the display device. Via holes for connecting elements of the panel structure may be formed by performing one process. For example, via holes for connecting a transistor and a conductive layer spaced apart from the transistor may be formed by performing only one process.
    Type: Application
    Filed: October 8, 2009
    Publication date: April 22, 2010
    Inventors: Kyung-bae Park, Myung-kwan Ryu, Kee-chan Park, Jong-baek Seon