Patents by Inventor Joon Shim

Joon Shim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080107322
    Abstract: A method, machine-readable storage medium embodying computer-readable code and automated system for assaying or monitoring the extent of joint or bone deformity reported by a summarized score that may include joint space narrowing, bone erosion and periarticular osteoporosis in a joint-degenerative or joint-damaging disease in a subject are disclosed. From a digitized image of one of the subject's straight bone terminated with a joint such as fingers, coordinates of right and left bone contours of a selected middle or proximal phalange are determined, and these coordinates are in turn used to determine the coordinates of a minimum width in the middle region of the phalange and one or more apices in a region adjacent at least one side of a joint of the selected phalange. These latter coordinates are used in selecting a reference joint contour representing normal-bone contour for that phalange, or the contour of the patient phalange from an earlier x-ray image.
    Type: Application
    Filed: October 9, 2007
    Publication date: May 8, 2008
    Inventors: Xiaoli Bi, Joon Shim
  • Patent number: 7280683
    Abstract: A method, machine-readable storage medium embodying computer-readable code and automated system for assaying or monitoring the extent of joint or bone deformity reported by a summarized score that may include joint space narrowing, bone erosion and periarticular osteoporosis in a joint-degenerative or joint-damaging disease in a subject are disclosed. From a digitized image of one of the subject's straight bone terminated with a joint such as fingers, coordinates of right and left bone contours of a selected middle or proximal phalange are determined, and these coordinates are in turn used to determine the coordinates of a minimum width in the middle region of the phalange and one or more apices in a region adjacent at least one side of a joint of the selected phalange. These latter coordinates are used in selecting a reference joint contour representing normal-bone contour for that phalange, or the contour of the patient phalange from an earlier x-ray image.
    Type: Grant
    Filed: July 22, 2003
    Date of Patent: October 9, 2007
    Assignee: Compumed, Inc.
    Inventors: Xiaoli Bi, Joon Shim
  • Publication number: 20060251950
    Abstract: A direct methanol fuel cell is described. The DMFC uses a solid electrolyte that prevents methanol crossover. Optional chemical barriers may be employed to prevent CO2 contamination of the electrolyte.
    Type: Application
    Filed: April 26, 2006
    Publication date: November 9, 2006
    Inventors: Friedrich Prinz, Turgut Gur, Joon Shim
  • Publication number: 20060160301
    Abstract: Disclosed are: (i) a method for fabricating a MIM capacitor in a semiconductor device, which can produce a MIM capacitor in fewer process steps; and (ii) a semiconductor device in which a MIM capacitor having a larger capacitance relative to conventional approaches is formed. The method comprises the steps of: (a) forming a capping layer, a bottom metal layer, a dielectric layer and a top metal layer above a semiconductor substrate in successive order; (b) forming a photoresist pattern on the top metal layer, the photoresist pattern masking a region to form the MIM capacitor; and (c) etching the top metal layer, the dielectric layer and the bottom metal layer in successive order using the photoresist pattern as a mask, thus forming the MIM capacitor including a top electrode, a dielectric insulator and a bottom electrode of which side walls are substantially collinear and have sidewalls that are substantially perpendicular to the capping layer.
    Type: Application
    Filed: December 15, 2005
    Publication date: July 20, 2006
    Inventor: Joon Shim
  • Publication number: 20060063308
    Abstract: A method to clean a dual damascene structure includes forming a photoresist pattern on an interlayer dielectric; forming a dual damascene structure by etching the interlayer dielectric using the photoresist pattern as an etch mask; removing the photoresist pattern by an ashing process; and cleaning the dual damascene structure with a cleaning solution mixture that includes a first solution for removing polymer (that may be formed during the etching of the interlayer dielectric) and photoresist residue, and a second solution for removing native oxide (that may be formed on the bottom of the dual damascene structure). The first solution may include an organic solution further including hydroxylamine, and the second solution includes an HF solution or buffered HF solution. The cleaning step may also use an additive that has metal corrosion resistance.
    Type: Application
    Filed: September 19, 2005
    Publication date: March 23, 2006
    Inventor: Joon Shim
  • Publication number: 20050142864
    Abstract: Methods for forming a copper interconnect of a semiconductor device are disclosed. A disclosed method comprises forming a lower metal interconnect; sequentially depositing a capping layer, a first insulating layer, and a second insulating layer on the lower metal interconnect; forming a via hole by etching the first insulating layer and the second insulating layer; forming a trench and terraces by etching the second insulating layer; and exposing at least a portion of the top surface of the lower metal interconnect by etching the capping layer.
    Type: Application
    Filed: December 30, 2004
    Publication date: June 30, 2005
    Inventor: Joon Shim
  • Publication number: 20050112899
    Abstract: Methods and apparatus for cleaning a semiconductor device are disclosed. A disclosed method comprises forming a capping layer on top of a substrate including a bottom interconnect layer; depositing and patterning an insulating layer on the capping layer to form a damascene structure; etching a portion of the capping layer exposed by the damascene structure; and (d) removing polymers and copper impurities due to the etching by using a HF vapor gas.
    Type: Application
    Filed: August 13, 2004
    Publication date: May 26, 2005
    Inventor: Joon Shim
  • Publication number: 20040234116
    Abstract: A method, machine-readable code and automated system for assaying or monitoring the extent of joint or bone deformity reported by a summarized score that may include joint space narrowing, bone erosion and periarticular osteoporosis in a joint-degenerative or joint-damaging disease in a subject are disclosed. From a digitized image of one of the subject's straight bone terminated with a joint such as fingers, coordinates of right and left bone contours of a selected middle or proximal phalange are determined, and these coordinates are in turn used to determine the coordinates of a minimum width in the middle region of the phalange and one or more apices in a region adjacent at least one side of a joint of the selected phalange. These latter coordinates are used in selecting a reference joint contour representing normal-bone contour for that phalange, or the contour of the patient phalange from an earlier x-ray image.
    Type: Application
    Filed: July 22, 2003
    Publication date: November 25, 2004
    Inventors: Xiaoli Bi, Joon Shim