Abstract: A method for providing an overview image of an object that is arranged in a sample plane and includes generating a light sheet, capturing detection light coming from the sample plane, imaging the captured detection light by means of a detector in a detection plane in the form of image data of at least one captured image, wherein the captured image extends in an image plane that is inclined with respect to the sample plane, capturing a number of images of at least one region of the object, in the form of an inclined stack, and transforming the inclined stack to a normalized Z-stack, in which image data of the captured images are assigned with correct orientation with respect to the reference axis. A maximum intensity projection in the normalized Z-stack, wherein a resulting overview image is generated by way of selected image points being imaged as a virtual projection into a projection plane that is parallel to the image plane of the detector.

Abstract: An optical arrangement for light beam shaping for a light microscope has a first and a second liquid crystal region or lifting micromirror region, each of which has a plurality of independently switchable liquid crystal elements or mirrors with which a phase of incident light is changeable in a settable manner, an input-/output-coupling polarization beam splitter, a polarization beam splitter arranged between the input-/output-coupling polarization beam splitter and the liquid crystal regions or lifting micromirror regions such that the polarization beam splitter separates the light coming from the input-/output-coupling polarization beam splitter in a polarization-dependent manner into a first partial beam, which is directed to the first liquid crystal region or lifting micromirror region, and into a second partial beam, which is directed to the second liquid crystal region or lifting micromirror region, and that the polarization beam splitter combines the two partial beams returning from the liquid crystal

Abstract: A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.

Abstract: A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.

Abstract: An optical lens for use in a media feed device, having a first lens surface and a second lens surface, wherein the first lens is provided to be facing an object to be observed and the second lens surface is provided to be facing away from the object to be observed. At least one channel opening onto the first lens surface is present, wherein the channel runs through the optical lens and at least one section of a media line is formed in the channel. The channel or, if a plurality of channels are formed, at least one of the present channels opens up outside a highest point in vertical alignment of the first lens surface.

Abstract: An arrangement, for light sheet microscopy, including: a sample vessel, for receiving a medium containing a sample, oriented with respect to a plane reference surface; illumination optics with an illumination objective for illuminating the sample with a light sheet; and detection optics with a detection objective. The optical axis of the illumination objective and the light sheet lies in a plane which forms a nonzero illumination angle with the normal of the reference surface. The detection objective has an optical axis that forms a nonzero detection angle with the normal of the reference surface. The arrangement also includes a separating-layer system for separating the sample-containing medium from the illumination and detection objectives. The separating-layer system contacts the medium with an interface parallel to the reference surface. The illumination angle and detection angle are predetermined based on numerical apertures of the detection objective and of the illumination objective, respectively.

Abstract: A microscope, in particular according to any of the preceding claims, consisting of an illuminating device, comprising an illumination light source and an illumination beam path for illuminating the specimen with a light sheet, a detection device for detecting light emitted by the specimen, and an imaging optical unit, which images the specimen via an imaging objective in an imaging beam path at least partly onto the detection device, wherein the light sheet is essentially planar at the focus of the imaging objective or in a defined plane in proximity of the geometrical focus of the imaging objective, and wherein the imaging objective has an optical axis, which intersects the plane of the light sheet at an angle that is different from zero, preferably perpendicularly, wherein an amplitude and/or phase filter is provided in the illumination beam path, said filter acting as a sine spatial filter in that it limits the illumination light in at least one spatial direction by filtering the spatial frequencies that

Abstract: An arrangement and method for supplying immersion media and a method for setting optical parameters of a medium, includes a media supply unit for the controlled supply of a medium or of a mixture into a contact region between an optical lens and a specimen slide, on which a specimen may be arranged. An image capture unit is provided for capturing image data on the basis of detection radiation from the object space along a detection beam path extending through the contact region. An evaluation unit is provided to establish current image parameters on the basis of captured image data, to compare said current image parameters to intended image parameters and to establish a desired mixing ratio of at least two components of the medium depending on the comparison.

Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Abstract: An arrangement for light sheet microscopy including: a sample vessel, for receiving a medium containing sample, having a covering and being oriented with respect to a planar reference surface; illumination optics with an illumination objective for illuminating the sample with a light sheet; and detection optics with a detection objective. The optical axis of the illumination objective and the light sheet lies in a plane that forms a nonzero illumination angle with the normal of the reference surface. The optical axis of the detection objective forms a nonzero detection angle with the normal of the reference surface. A bulge is formed at the covering for receiving the sample. The bulge has inner and outer interfaces. The optical axes of the illumination objective and detection objective form a minimal angle with the normals of the interfaces at least in the region where the optical axes pass through the interfaces.

Abstract: The invention relates to an illumination apparatus for a microscope, a microscope and a method for operating the illumination apparatus. The illumination apparatus has a sample space for holding a sample that is to be illuminated, and at least one laser light source. An objective for the directional emission of laser radiation of a first wavelength along a first optical axis that is directed into the sample space, and with a cover of the sample space by which the sample space is delimited at least on one of its sides. The cover further has a layer that is either impenetrable for the laser radiation over a blocking angle range of the illumination angle and is transmissive for radiation of a second wavelength over a transmitted light angle range, or has a controllable layer that, in a first control state, is transparent for radiation of the second wavelength and, in a second control state, is impenetrable for the laser radiation of the first wavelength.

Abstract: An arrangement for TIRF microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier in a specimen plane via an illumination beam path. An optical axis of the illumination objective includes an illumination angle that differs from zero with the normal of the specimen plane. A detection optical unit with a detection objective in a detection beam path includes a detection angle that differs from zero between an optical axis thereof and the normal of the specimen plane. A transition element between the specimen carrier and both objectives is arranged both in the illumination beam path and in the detection beam path. The transition element corrects aberrations that arise on account of the passage through media with different refractive indices of radiation to be detected and/or radiation for illuminating the specimen.

Abstract: Method for calibrating a phase mask in a beam path of an optical device with the steps: the phase mask is actuated successively with different patterns of grey levels, wherein a first grey level of a first quantity of segments remains constant and a second grey level of a second quantity of segments is varied from one pattern to the next, light of the optical device impinges on the phase mask, at least one part of the total intensity of the light in the beam path is measured downstream of the phase mask for the different patterns, and a characteristic of the measured intensity is obtained in dependence on the second grey level, a relationship between the second grey level and a phase shift, being imprinted by the phase mask, is obtained from the characteristic and an actuation of the phase mask is calibrated based on the obtained relationship.

Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Abstract: A method for providing an overview image of an object that is arranged in a sample plane and includes generating a light sheet, capturing detection light coming from the sample plane, imaging the captured detection light by means of a detector in a detection plane in the form of image data of at least one captured image, wherein the captured image extends in an image plane that is inclined with respect to the sample plane, capturing a number of images of at least one region of the object, in the form of an inclined stack, and transforming the inclined stack to a normalized Z-stack, in which image data of the captured images are assigned with correct orientation with respect to the reference axis. A maximum intensity projection in the normalized Z-stack, wherein a resulting overview image is generated by way of selected image points being imaged as a virtual projection into a projection plane that is parallel to the image plane of the detector.

Abstract: A method for adjusting a specimen holder in the beam path of a microscope, in which at least one beam of an illumination radiation is directed onto the specimen holder; a component of the illumination radiation reflected by the specimen holder is captured by means of a detector and measurement values of the captured illumination radiation are ascertained. A current actual manner of positioning of the specimen holder in relation to the beam path is established depending on the measurement values; the established actual manner of positioning is compared to an intended manner of positioning, and control commands for modifying the actual manner of positioning are produced, the execution of which causes the specimen holder to be moved into the intended manner of positioning.

Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Abstract: A method for capturing image data and for determining the thickness of a specimen holder in the beam path of a microscope. The specimen holder is transparent to illumination radiation and embodied to receive a specimen. The specimen holder, which has a first side face and a second side face, is arranged in a specimen plane and the first side face and second side face of the specimen holder are aligned parallel to the specimen plane. At least one beam of the illumination radiation is directed onto the aligned specimen holder along a first optical axis at a first illumination angle and at least two measured values of a reflected component of the illumination radiation or at least two measurement values of a detection radiation caused by the illumination radiation are captured. Depending on the at least two captured measurement values, a spacing of the first and second side face in relation to one another in the direction of the Z-axis is established as a thickness.

Abstract: A method for capturing image data and for determining the thickness of a specimen holder in the beam path of a microscope. The specimen holder is transparent to illumination radiation and embodied to receive a specimen. The specimen holder, which has a first side face and a second side face, is arranged in a specimen plane and the first side face and second side face of the specimen holder are aligned parallel to the specimen plane. At least one beam of the illumination radiation is directed onto the aligned specimen holder along a first optical axis at a first illumination angle and at least two measured values of a reflected component of the illumination radiation or at least two measurement values of a detection radiation caused by the illumination radiation are captured. Depending on the at least two captured measurement values, a spacing of the first and second side face in relation to one another in the direction of the Z-axis is established as a thickness.

Abstract: An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen situated on a specimen carrier in a specimen region of a specimen plane via an illumination beam path. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane, in respect of which the specimen carrier is aligned, and the illumination is implemented in the plane. Further, a detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective comprises an illumination correction element arranged in the beam path and/or a detection correction element.