Patents by Inventor Jose Arno

Jose Arno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040018746
    Abstract: A thermopile-based detector for monitoring and/or controlling semiconductor processes, and a method of monitoring and/or controlling semiconductor processes using thermopile-based sensing of conditions in and/or affecting such processes.
    Type: Application
    Filed: July 18, 2003
    Publication date: January 29, 2004
    Inventor: Jose Arno
  • Patent number: 6620256
    Abstract: An improved, non-plasma, static method for removing accumulated films and solid residues from interior surfaces of processing chambers used in thermal or plasma CVD treatment processes. The method includes introducing a reactive substance into a processing chamber while adjusting the pressure within the processing chamber to a predetermined level. The flow of the reactive substance into the processing chamber is terminated and the reactive substance is retained in the processing chamber to react with solid residues and form reaction products, following which the reaction products are subsequently removed from the processing chamber. Advantageously, terminating the flow of reactive substance into the processing chamber results in etching action that more effectively utilizes the cleaning agent and generates less hazardous materials.
    Type: Grant
    Filed: November 8, 2000
    Date of Patent: September 16, 2003
    Assignee: Advanced Technology Materials, Inc.
    Inventors: Jose Arno, Luping Wang, Glenn M. Tom
  • Patent number: 6617175
    Abstract: A thermopile-based detector for monitoring and/or controlling semiconductor processes, and a method of monitoring and/or controlling semiconductor processes using thermopile-based sensing of conditions in and/or affecting such processes.
    Type: Grant
    Filed: May 8, 2002
    Date of Patent: September 9, 2003
    Assignee: Advanced Technology Materials, Inc.
    Inventor: Jose Arno
  • Publication number: 20030136265
    Abstract: A method and apparatus for abatement of effluent from a CVD process using a source reagent having a metal organic loosely bound to a organic or organomettalic molecule such that upon exposure to heat such bond is readily cleavable , e.g., copper deposition process involving the formation of films on a substrate by metalorganic chemical vapor deposition (CVD) utilizing a precursor composition for such film formation. The abatement process in specific embodiments facilitates high efficiency abatement of effluents from copper deposition processes utilizing Cu(hfac)TMVS as a copper source reagent.
    Type: Application
    Filed: February 5, 2003
    Publication date: July 24, 2003
    Inventors: Mark Holst, Ray Dubois, Jose Arno, Rebecca Faller, Glenn Tom
  • Publication number: 20030056726
    Abstract: Apparatus and method for abatement of effluent from multi-component metal oxides deposited by CVD processes using metal source reagent liquid solutions which comprise at least one metal coordination complex including a metal to which is coordinatively bound at least one ligand in a stable complex and a suitable solvent medium for that metal coordination complex e.g., a metalorganic chemical vapor deposition (MOCVD) process for forming barium strontium titanate (BST) thin films on substrates. The effluent is sorptively treated to remove precursor species and MOCVD process by-products from the effluent. An endpoint detector such as a quartz microbalance detector may be employed to detect incipient breakthrough conditions in the sorptive treatment unit.
    Type: Application
    Filed: October 23, 2002
    Publication date: March 27, 2003
    Inventors: Mark Holst, Rebecca Faller, Glenn Tom, Jose Arno, Ray Dubois
  • Patent number: 6537353
    Abstract: A method and apparatus for abatement of effluent from a CVD process using a source reagent having a metal organic loosely bound to a organic or organomettalic molecule such that upon exposure to heat such bond is readily cleavable, e.g., copper deposition process involving the formation of films on a substrate by metalorganic chemical vapor deposition (CVD) utilizing a precursor composition for such film formation. The abatement process in specific embodiments facilitates high efficiency abatement of effluents from copper deposition processes utilizing Cu(hfac)TMVS as a copper source reagent.
    Type: Grant
    Filed: April 6, 2001
    Date of Patent: March 25, 2003
    Assignee: Advanced Technology Materials, Inc.
    Inventors: Mark Holst, Ray Dubois, Jose Arno, Rebecca Faller, Glenn Tom
  • Patent number: 6500487
    Abstract: Apparatus and method for abatement of effluent from multi-component metal oxides deposited by CVD processes using metal source reagent liquid solutions which comprise at least one metal coordination complex including a metal to which is coordinatively bound at least one ligand in a stable complex and a suitable solvent medium for that metal coordination complex e.g., a metalorganic chemical vapor deposition (MOCVD) process for forming barium strontium titanate (BST) thin films on substrates. The effluent is sorptively treated to remove precursor species and MOCVD process by-products from the effluent. An endpoint detector such as a quartz microbalance detector may be employed to detect incipient breakthrough conditions in the sorptive treatment unit.
    Type: Grant
    Filed: October 18, 1999
    Date of Patent: December 31, 2002
    Assignee: Advanced Technology Materials, Inc
    Inventors: Mark Holst, Rebecca Faller, Glenn Tom, Jose Arno, Ray Dubois
  • Publication number: 20020094380
    Abstract: A method and apparatus for abatement of effluent from a CVD process using a source reagent having a metal organic loosely bound to a organic or organomettalic molecule such that upon exposure to heat such bond is readily cleavable, e.g., copper deposition process involving the formation of films on a substrate by metalorganic chemical vapor deposition (CVD) utilizing a precursor composition for such film formation. The abatement process in specific embodiments facilitates high efficiency abatement of effluents from copper deposition processes utilizing Cu(hfac)TMVS as a copper source reagent.
    Type: Application
    Filed: April 6, 2001
    Publication date: July 18, 2002
    Applicant: Advanced Technology Materials, Inc.
    Inventors: Mark Holst, Ray Dubois, Jose Arno, Rebecca Faller, Glenn Tom
  • Patent number: 6391385
    Abstract: A method and apparatus for abatement of effluent from a CVD process using a source reagent having a metal organic loosely bound to a organic or organomettalic molecule such that upon exposure to heat such bond is readily cleavable, e.g., copper deposition process involving the formation of films on a substrate by metalorganic chemical vapor deposition (CVD) utilizing a precursor composition for such film formation. The abatement process in specific embodiments facilitates high efficiency abatement of effluents from copper deposition processes utilizing Cu(hfac)TMVS as a copper source reagent.
    Type: Grant
    Filed: October 18, 1999
    Date of Patent: May 21, 2002
    Assignee: Advanced Technology Materials, Inc.
    Inventors: Mark Holst, Ray Dubois, Jose Arno, Rebecca Faller, Glenn Tom