Abstract: Systems, processes, and structures provide near-field transmit power measurement for MIMO wireless devices (DUT), such as for any of product development, product verification, and/or production testing. A test signal, such as comprising a pulse train signal, is provided to a MIMO device under test (DUT), wherein portions of the test signal controllably steered and sequentially transmitted from each of the device antennas, to one or more test antennas that are positioned in close proximity to the MIMO DUT. The near-field power of the received test signals is measured, to quickly and efficiently determine if one or more data streams of the MIMO DUT has a problem.

Abstract: Systems, processes, and structures provide near-field transmit power measurement for MIMO wireless devices (DUT), such as for any of product development, product verification, and/or production testing. A test signal, such as comprising a pulse train signal, is provided to a MIMO device under test (DUT), wherein portions of the test signal controllably steered and sequentially transmitted from each of the device antennas, to one or more test antennas that are positioned in close proximity to the MIMO DUT. The near-field power of the received test signals is measured, to quickly and efficiently determine if one or more data streams of the MIMO DUT has a problem.

Abstract: A receiver is provided that receives signals from a device under test (DUT) for one or more modes of operation. For each mode, the system detects beacon transmission signals from the DUT, and counts the number of beacons for a period of time. If the count is not consistent with an expected count, e.g. a stored value, the system may preferably provide an output to indicate that there is a problem with the DUT. If the count is consistent with the expected count, the system may preferably perform further testing for other modes of operation. If the count output of the DUT is consistent with expected counts over each of the operation modes, the system may provide an indication that the DUT has passed the beacon tests.

Abstract: Systems, processes, and structures allow enhanced near-field testing of the uplink and/or downlink performance of MIMO wireless devices (DUT), such as for any of product development, product verification, and/or production testing. Signal channels may preferably be emulated to test the performance of a device under test (DUT) over a range of simulated distances, within a near-field test environment. An enhanced process provides automated testing of a DUT over a wireless network, e.g. such as but not limited to a WLAN. The enhanced MIMO channel emulator may preferably be operated over a high dynamic range.

Abstract: Antenna designs are disclosed that exhibit both high bandwidth and efficiency. A first aspect of the invention concerns the form factor of the antenna; a second aspect of the invention concerns the ease with which the antenna is manufactured; and a third aspect concerns the superior performance exhibits by the antenna across a large bandwidth.