Abstract: A method of evaluating an article includes measuring a feature of the article using a defect detection device. A set of data points is recorded representing the first feature and the set of data points is analyzed. The analyzing includes constructing a filtered curve by constructing a raw curve by listing the set of data points, constructing a first meanline curve, and finding a first difference between the raw curve and the first meanline curve. The analyzing also includes constructing a reversal curve by calculating a second derivative of a meanline curve constructed from the set of data points. The method also includes deciding the acceptability of the feature of the article.

Abstract: A method is provided for inspecting a device comprising a plurality of bristles. During this method, image data provided from an electronic optical sensor is received. The image data is indicative of an image of at least a portion of the bristles. A bristle configuration (e.g., an angle) of at least one of the bristles (e.g., an average bristle) in the image is determined by processing the image data with a computer processor.

Abstract: A method is provided for inspecting a device comprising a plurality of bristles. During this method, image data provided from an electronic optical sensor is received. The image data is indicative of an image of at least a portion of the bristles. A bristle configuration (e.g., an angle) of at least one of the bristles (e.g.

Abstract: A method of manufacturing an article having a first component that mates with a second component is provided. The method includes: producing a first component having a first mating feature; measuring the dimensions of the first mating feature and creating a profile representative of the measured dimensions; and producing a second component having a second mating feature that mates with the first mating feature, wherein the second mating feature is produced using the profile.

Abstract: A system includes a laser-line imaging subsystem to measure a feature. The laser-line imaging subsystem includes a laser to project a laser-line, and a digital video camera mounted at an angle with respect to an axis of said laser to obtain an optical image of the laser-line. A control subsystem is operable to compute three-dimensional coordinate points via triangulation of an intersection between the laser-line and the optical image of the laser-line, the three-dimensional coordinate points data used by the control subsystem to calculate predictive airflow through the workpiece with respect to the volume of the machined holes.

Abstract: A method of evaluating an article includes measuring a feature of the article using a defect detection device. A set of data points is recorded representing the first feature and the set of data points is analyzed. The analyzing includes constructing a filtered curve by constructing a raw curve by listing the set of data points, constructing a first meanline curve, and finding a first difference between the raw curve and the first meanline curve. The analyzing also includes constructing a reversal curve by calculating a second derivative of a meanline curve constructed from the set of data points. The method also includes deciding the acceptability of the feature of the article.

Abstract: An optical height gauge including a housing, a mounting bar coupled to, and maintained partially in, the housing, a mounting bracket connected to the mounting bar, the mounting bracket including at least one light source holder, a camera mount connected to the mounting bracket, and a tilt bar connected to the mounting bracket and contacting the mounting bar.

Abstract: An optical height gauge including a housing, a mounting bar coupled to, and maintained partially in, the housing, a mounting bracket connected to the mounting bar, the mounting bracket including at least one light source holder, a camera mount connected to the mounting bracket, and a tilt bar connected to the mounting bracket and contacting the mounting bar.

Abstract: Inspecting features of an object including measuring features of the master part that represents a desired nominal dimensions to obtain a preliminary set of dimensional data. The preliminary set of data becomes a master data set. The same master part is measured on a second machine to obtain another set of data on the master part. The two data sets are compared and correction data is generated representing differences between the different data sets for the same master part measured on different machines. Subsequent parts are then measured on the second machine to obtain measurement data that is corrected based on the correction data. The application of the correction information provides for the use of 5-axis machines within a desired measurement capability.

Abstract: A testing apparatus may include a stand having an aperture and a platform adjacent to the aperture, a clamp adjacent to the platform and configured to hold a coupon, and an actuator within the aperture. The actuator is configured to impart a first force on the platform and the coupon at a specified frequency. The testing apparatus may also include a displacement sensor adjacent to the stand and configured to measure a displacement of the coupon and circuitry connected to the actuator and the displacement sensor with the circuitry configured to collect data from the actuator and the displacement sensor.

Abstract: A testing apparatus may include a stand having an aperture and a platform adjacent to the aperture, a clamp adjacent to the platform and configured to hold a coupon, and an actuator within the aperture. The actuator is configured to impart a first force on the platform and the coupon at a specified frequency. The testing apparatus may also include a displacement sensor adjacent to the stand and configured to measure a displacement of the coupon and circuitry connected to the actuator and the displacement sensor with the circuitry configured to collect data from the actuator and the displacement sensor.

Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.

Abstract: A system includes a machining subsystem to machine features and an laser-line imaging subsystem to measure said features.

Abstract: A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.

Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.

Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.

Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.

Abstract: An apparatus for measuring a workpiece includes a capacitance probe mounted to a probe housing and a non-conductive spacer. The capacitance probe includes a probe tip with a sensor surface that emits an electric field. The non-conductive spacer extends between a probe contact surface and a workpiece contact surface. The probe contact surface covers the sensor surface, and the workpiece contact surface contacts the workpiece during the measuring of the radius.

Abstract: An apparatus for measuring a workpiece includes a capacitance probe mounted to a probe housing and a non-conductive spacer. The capacitance probe includes a probe tip with a sensor surface that emits an electric field. The non-conductive spacer extends between a probe contact surface and a workpiece contact surface. The probe contact surface covers the sensor surface, and the workpiece contact surface contacts the workpiece during the measuring of the radius.

Abstract: A calibration artifact for an inspection system is provided. The calibration artifact comprises a base adapted for placement within a holding fixture of an inspection system during calibration, a sphere operatively connected to the base, and a light source operatively connected to the base. The base, the sphere, and the light source are removable from the inspection system after calibration.