Patents by Inventor Joseph D. Drescher

Joseph D. Drescher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110267451
    Abstract: A method and system are provided for inspecting a plurality of target features arrayed in spaced arrangement on a surface of a target object, such as but not limited to inspection of the location of cooling air holes in the surface of a turbine blade or vane.
    Type: Application
    Filed: May 3, 2010
    Publication date: November 3, 2011
    Applicant: United Technologies Corporation
    Inventors: Joseph D. Drescher, Jesse R. Boyer, Robert E. Erickson, Erik M. Pedersen
  • Patent number: 7869026
    Abstract: A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.
    Type: Grant
    Filed: December 21, 2007
    Date of Patent: January 11, 2011
    Assignee: United Technologies Corp.
    Inventors: Jesse R. Boyer, Jeffry K. Pearson, Randall W. Joyner, Joseph D Drescher
  • Publication number: 20090161122
    Abstract: A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.
    Type: Application
    Filed: December 21, 2007
    Publication date: June 25, 2009
    Applicant: UNITED TECHNOLOGIES CORP.
    Inventors: Jesse R. Boyer, Jeffry K. Pearson, Randall W. Joyner, Joseph D. Drescher
  • Patent number: 7191535
    Abstract: To enable the on-machine measurement of selected features of a workpiece formed on a live spindle lathe with a positioning rotary table, both the machine itself and the electronic touch probe used to conduct the measurements are calibrated. The accuracy of the machine itself is measured and calculated by including the measured errors not only in the x and z linear axes, but also in the y linear axis. Calibration of the touch probe is made by determining a correction factor which is obtained by the touch probe measurement of an artifact whose dimensions are precisely known by other means. This correction factor is then made to the nominal measurements made by the touch probe on the selected features of the workpiece to be measured, to obtain the actual dimensions thereof. Adjustments are also made to compensate for the differences in radial positions between the workpiece and the artifact.
    Type: Grant
    Filed: February 28, 2005
    Date of Patent: March 20, 2007
    Assignee: United Technologies Corporation
    Inventors: Anton Banks, Joseph D. Drescher, Christian Jesse
  • Patent number: 7036236
    Abstract: A method for certifying and calibrating a multi-axis coordinate measuring machine includes the steps of loading a check standard into a means for holding of the multi-axis coordinate measuring machine; measuring a virtual location of each of a plurality of apertures of the check standard within a virtual coordinate system using a touch probe of the multi-axis coordinate measuring machine; measuring an actual location of each of the apertures and simultaneously verifying the accuracy of the virtual coordinate system of the check standard using an optical probe of the multi-axis coordinate measuring machine; and calculating a deviation between the actual location of each of the apertures and a virtual location of each of the apertures of the virtual coordinate system.
    Type: Grant
    Filed: April 7, 2005
    Date of Patent: May 2, 2006
    Assignee: United Technologies Corporation
    Inventors: Joseph D. Drescher, Jesse R. Boyer
  • Patent number: 7025385
    Abstract: A coupling connects a first member and a second member. The first member has a first interlocking member extending radially outward from an outer circumferential surface of an axial end. The second member includes a second interlocking member extending radially inward from an inner circumferential surface of an axial end. The axial end of the first member is inserted into the axial end of the second member, such that the first interlocking member is inserted past the second interlocking member. The first and second members are then rotated relative to one another to a locked angular orientation, in which the first interlocking member is interlocked with the second interlocking member to prevent relative axial movement of the first and second members. A key is then inserted into a keyway in the first and second members to lock the angular orientation, thereby coupling the first and second members to one another.
    Type: Grant
    Filed: September 3, 2003
    Date of Patent: April 11, 2006
    Assignee: United Technologies Corporation
    Inventor: Joseph D. Drescher