Abstract: A method of making a carbon-metal oxide composite electrode for a supercapacitor includes continuously injecting a carbon material solution into a coagulation solution, where the carbon material solution comprises a carbon source and a liquid, and the coagulation solution comprises a metal nitrate or chloride and an organic solvent. An extruded structure comprising the metal nitrate or chloride interspersed with carbon is formed from the continuous injection. The extruded structure is annealed under conditions sufficient to convert the metal nitrate or chloride to metal oxide. Thus, a composite structure comprising the metal oxide and the carbon is formed, where the metal oxide is uniformly dispersed within the composite structure.

Abstract: An electromagnetic interference (EMI) shielding material comprises a freestanding printed structure including aligned single-walled carbon nanotubes, wherein an alignment direction of the aligned single-walled carbon nanotubes coincides with a parallel direction of the freestanding printed structure, and wherein a property of the freestanding printed structure measured along the parallel direction is at least about 1.5 times as high as the property measured along a perpendicular direction of the freestanding printed structure.

Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.

Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.

Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.

Abstract: A method of making a carbon-metal oxide composite electrode for a supercapacitor includes continuously injecting a carbon material solution into a coagulation solution, where the carbon material solution comprises a carbon source and a liquid, and the coagulation solution comprises a metal nitrate or chloride and an organic solvent. An extruded structure comprising the metal nitrate or chloride interspersed with carbon is formed from the continuous injection. The extruded structure is annealed under conditions sufficient to convert the metal nitrate or chloride to metal oxide. Thus, a composite structure comprising the metal oxide and the carbon is formed, where the metal oxide is uniformly dispersed within the composite structure.

Abstract: A method for reducing the amount of mobile surface molecules present on a substrate surface includes providing a substrate having an area of interest, where the substrate is disposed within a controlled environment (e.g., a UHV environment). In some embodiments, a mask is positioned in a first position over the area of interest. Thereafter, a first deposition of a reactive material from a reactive material source is performed onto a first substrate region. The mask, while in the first position, blocks deposition of the reactive material within the area of interest. The mask may then positioned in a second position over the area of interest. In some embodiments, a second deposition of the reactive material from the reactive material source is performed to circumscribe the area of interest with the reactive material. In various embodiments, mobile surface molecules are captured using the deposited reactive material.

Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.

Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.

Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.

Abstract: Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on a stage and ion milled simultaneously while the stage and mounted probes are tilted at a selected angle relative to the ion source and rotated. The resulting probes are also described. The method provides sets of highly uniform probe tips having controllable properties for stable and accurate scanning probe and electron microscope (EM) measurements.

Abstract: The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires and semiconductors in other forms.

Abstract: A preferred method of the invention separates metallic or charged nanostructures in solution. In preferred embodiments, metal and semiconducting nanostructures are separated in solution with use of a net Lorentz force applied to metallic or conductive nanostructures. In other embodiments, charged nanostructures are separated from other nanostructures in solution. The charge can be applied to semiconducting or insulating nanostructures of a predetermined size by application of appropriate radiation. The method is conducted on dispersed nanostructures suspended in solution in a vessel. The net Lorentz force to metallic, conductive or charged nanostructures within the solution moves the metallic, conductive or charged nanostructures toward a common volume in a portion of the vessel. Extraction of the common volume provides solution with a high ratio of the metallic, conductive or charged nanostructures. The solution left behind has a high ratio of semiconducting or insulating nanostructures.

Abstract: An electrochemical cell is described that includes (a) a first electrode; (b) a second electrode; and (c) a channel contiguous with at least a portion of the first and the second electrodes. When a first liquid is contacted with the first electrode, a second liquid is contacted with the second electrode, and the first and the second liquids flow through the channel, a parallel laminar flow is established between the first and the second liquids. Electronic devices containing such electrochemical cells and methods for their use are also described.

Abstract: The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires and semiconductors in other forms.

Abstract: The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires, and semiconductors in other forms.

Abstract: An electrochemical cell is described that includes (a) a first electrode; (b) a second electrode; and (c) a channel contiguous with at least a portion of the first and the second electrodes. When a first liquid is contacted with the first electrode, a second liquid is contacted with the second electrode, and the first and the second liquids flow through the channel, a parallel laminar flow is established between the first and the second liquids. Electronic devices containing such electrochemical cells and methods for their use are also described.

Abstract: The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires, and semiconductors in other forms.

Abstract: Described are preferred processes for conditioning semiconductor devices with deuterium to improve operating characteristics and decrease depassivation which occurs during the course of device operation. Also described are semiconductor devices which can be prepared by such processes.

Abstract: Semiconductor device annealing process with deuterium at superatmospheric pressures to improve reduction of the effects of hot carrier stress during device operation, and devices produced thereby.