Patents by Inventor Jovan Jovanovic
Jovan Jovanovic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20210364549Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: ApplicationFiled: August 2, 2021Publication date: November 25, 2021Applicant: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
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Patent number: 11112429Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: July 15, 2019Date of Patent: September 7, 2021Assignee: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
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Publication number: 20210025935Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: September 29, 2020Publication date: January 28, 2021Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 10852347Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: September 4, 2018Date of Patent: December 1, 2020Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20200256917Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: ApplicationFiled: April 23, 2020Publication date: August 13, 2020Applicant: Aehr Test SystemsInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Publication number: 20200233026Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: March 26, 2020Publication date: July 23, 2020Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Patent number: 10677843Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: GrantFiled: December 17, 2015Date of Patent: June 9, 2020Assignee: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Patent number: 10649022Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: February 27, 2018Date of Patent: May 12, 2020Assignee: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Publication number: 20200027799Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: ApplicationFiled: September 19, 2019Publication date: January 23, 2020Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
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Publication number: 20190339303Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: ApplicationFiled: July 15, 2019Publication date: November 7, 2019Applicant: Aehr Test SystemsInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
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Patent number: 10466292Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: GrantFiled: January 6, 2017Date of Patent: November 5, 2019Assignee: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
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Patent number: 10401385Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: December 12, 2017Date of Patent: September 3, 2019Assignee: Aehr Test SystemsInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
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Publication number: 20190065834Abstract: An apparatus has a processor and a network interface circuit connected to the processor to provide connectivity to a network. A memory is connected to the processor and the network interface circuit. The memory stores instructions executed by the processor to receive a digital image. Facial templates are created for faces in the digital image. The facial templates are compared to a user facial template collection to selectively identify matches between the facial templates and stored user facial templates in the user facial template collection. Image distribution criteria for the matches is evaluated. The digital image is sent to the network for distribution to selective client device in accordance with the image distribution criteria. New facial templates from the digital image that do not correspond to stored user facial templates in the user facial template collection are uploaded to a server via the network.Type: ApplicationFiled: August 22, 2018Publication date: February 28, 2019Applicant: Incode Technologies, Inc.Inventors: Ricardo Amper, Aleksei Golunov, Jovan Jovanovic, Erick Camacho
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Publication number: 20180372792Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: September 4, 2018Publication date: December 27, 2018Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 10094872Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: March 3, 2016Date of Patent: October 9, 2018Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20180252762Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: February 27, 2018Publication date: September 6, 2018Applicant: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
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Publication number: 20180113150Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: ApplicationFiled: December 12, 2017Publication date: April 26, 2018Applicant: Aehr Test SystemsInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
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Patent number: 9880197Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: March 8, 2017Date of Patent: January 30, 2018Assignee: Aehr Test SystemsInventors: Scott E. Lindsey, Junyje Yeh, Jovan Jovanovic, Seang P. Malathong
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Patent number: D850309Type: GrantFiled: July 27, 2017Date of Patent: June 4, 2019Assignee: Aehr Test SystemsInventors: Jovan Jovanovic, Scott E. Lindsey, Steven C. Steps, David S. Hendrickson
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Patent number: D875579Type: GrantFiled: April 8, 2019Date of Patent: February 18, 2020Assignee: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Scott E. Lindsey, Steven C. Steps, David S. Hendrickson