Layout of contacts

- Aehr Test Systems
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Description

FIG. 1 is a top plan view of a layout of contacts according to our design; and,

FIG. 2 is a side elevation view of the layout of contacts of our design.

Claims

The ornamental design of a layout of contacts, as shown and described.

Referenced Cited
U.S. Patent Documents
D810706 February 20, 2018 Soyano
Patent History
Patent number: D850309
Type: Grant
Filed: Jul 27, 2017
Date of Patent: Jun 4, 2019
Assignee: Aehr Test Systems (Fremont, CA)
Inventors: Jovan Jovanovic (Santa Clara, CA), Scott E. Lindsey (Brentwood, CA), Steven C. Steps (Saratoga, CA), David S. Hendrickson (San Jose, CA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/612,040