Abstract: A novel trace cache design and organization to efficiently store and retrieve multi-path traces. A goal is to design a trace cache, which is capable of storing multi-path traces without significant duplication in the traces. Furthermore, the effective access latency of these traces is reduced.

Abstract: A write filter cache system for protecting a microprocessor core from soft errors and method thereof are provided. In one aspect, data coming from a processor core to be written in primary cache memory, for instance, L1 cache memory system, is buffered in a write filter cache placed between the primary cache memory and the processor core. The data from the write filter is move to the main cache memory only if it is verified that main thread's data is soft error free, for instance, by comparing the main thread's data with that of its redundant thread. The main cache memory only keeps clean data associated with accepted checkpoints.

Abstract: This invention pertains to apparatus, method and a computer program stored on a computer readable medium. The computer program includes instructions for use with an instruction unit having a code page, and has computer program code for partitioning the code page into at least two sections for storing in a first section thereof a plurality of instruction words and, in association with at least one instruction word, for storing in a second section thereof an extension to each instruction word in the first section. The computer program further includes computer program code for setting a state of at least one page table entry bit for indicating, on a code page by code page basis, whether the code page is partitioned into the first and second sections for storing instruction words and their extensions, or whether the code page is comprised instead of a single section storing only instruction words.

Abstract: Block placement within each device-containing layer is optimized under the constraint of a simultaneous optimization of interlayer connectivity between the device-containing layer and immediately adjacent device-containing layers. For each functional block within the device-containing layer, lateral heat flow is calculated to laterally adjacent functional blocks. If the lateral heat flow is less than a threshold value for a pair of adjacent functional blocks, placement of the functional blocks and/or interlayer interconnect structure array therebetween or modification of the interlayer interconnect structure array is performed. This routine is repeated for all adjacent pairs of functional blocks in each of the device-containing layers. Subsequently, block placement within each device-containing layer may be optimized under the constraint of a simultaneous optimization of interlayer connectivity across all device-containing layers.

Abstract: A computer implemented method, apparatus, and computer usable program code for preventing soft error accumulation. A number of cycles between references to a register are counted. Instructions are injected that reference the register for preventing soft error accumulation in response to a determination that the number of cycles is greater than a threshold.

Abstract: Mechanisms for modeling system level effects of soft errors are provided. Mechanisms are provided for integrating device-level and component-level soft error rate (SER) analysis mechanisms with micro-architecture level performance analysis tools during a concept phase of the IC design to thereby generate a SER analysis tool. A first SER profile for the IC design is generated by applying the SER analysis tool to the IC design. At a later phase of the IC design, detailed information about SER vulnerabilities of logic and storage elements within the IC design are obtained and the first SER profile is refined based on the detailed information about SER vulnerabilities to thereby generate a second SER profile for the IC design. Modifications to the IC design are made at one or more phases of the IC design based on one of the first SER profile or the second SER profile.

Abstract: Base semiconductor chips, each comprising a plurality of chiplets, are manufactured and tested. For a base semiconductor chip having at least one non-functional chiplet, at least one repair semiconductor chiplet, which provides the same functionality as one of the at least one non-functional chiplet is designed to provide, is vertically stacked. The at least one repair semiconductor chiplet provides the functionality that the at least one non-functional chiplet is designed to provide to the base semiconductor chip. A functional multi-chip assembly is formed, which provides the same functionality as a base semiconductor chip in which all chiplets are functional. In case a first attempt to repair the base semiconductor chip by stacking repair semiconductor chips is unsuccessful, additional repair semiconductor chips may be subsequently stacked to fully repair the base semiconductor chip.

Abstract: A cache memory that may include a content addressable memory, random access memory (CAMRAM) cache and method for managing a cache to reduce cache energy consumption. A cache buffer receives incoming data and buffers a storage array. The cache buffer holds a number of most recently accessed data blocks. In any access, cache buffer locations are checked before checking the storage array.

Abstract: A method and on-chip controller for enhancing semiconductor chip process variability and lifetime reliability through a three-dimensional (3D) integration applied to electronic packaging. Also provided is an on-chip reliability/variability controller arrangement for implementing the inventive method.

Abstract: A method of enhancing semiconductor chip process variability and lifetime reliability through a three-dimensional (3D) integration applied to electronic packaging. Also provided is an arrangement for implementing the inventive method.

Abstract: A hardware based method for determining when to migrate cache lines to the cache bank closest to the requesting processor to avoid remote access penalty for future requests. In a preferred embodiment, decay counters are enhanced and used in determining the cost of retaining a line as opposed to replacing it while not losing the data. In one embodiment, a minimization of off-chip communication is sought; this may be particularly useful in a CMP environment.

Abstract: A system and method for projecting reliability includes a module, such as a chip, which includes workload inputs, which account for activity on the chip. A reliability module interacts with the chip to determine a reliability measurement for the chip based upon the workload inputs such that functions of the chip are altered based upon the reliability measurement. The reliability measurements are employed to rate or improve chip designs or calculate a reliability measure in real-time.

Abstract: A pipeline system and method includes a plurality of operational stages. The stages include a pointer register stage which stores pointer information and updates, and a rename and dependence checking stage located downstream of the pointer register stage, which renames registers and determines if dependencies exist. A functional unit provides pointer information updates to the pointer register stage such that pointer information is processed and updated to the pointer register stage before or in parallel with the register dependency checking.

Abstract: A system and method for projecting reliability to manage system functions includes an activity module which determines activity in the system. A reliability module interacts with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the system. A management module manages actions of the system based upon the reliability measurement input from the reliability module. This may be to provide corrective action, to reallocate resources, increase reliability of the module, etc.

Abstract: A computer implemented method, apparatus, and computer usable program code for preventing soft error accumulation. A number of cycles between references to a register are counted. Instructions are injected that reference the register for preventing soft error accumulation in response to a determination that the number of cycles is greater than a threshold.

Abstract: A method of predicting the lifetime reliability of an integrated circuit device with respect to one or more failure mechanisms includes breaking down the integrated circuit device into structures; breaking down each structure into elements and devices; evaluating each device to determine whether the device is vulnerable to the failure mechanisms and eliminating devices determined not to be vulnerable; estimating, for each determined vulnerable device, the impact of a failure of the device on the functionality of the specific element associated therewith, and classifying the failure into a fatal failure or a non-fatal failure, wherein a fatal failure causes the element employing the given device to fail; determining, for those devices whose failures are fatal, an effective stress degree and/or time; determining one or more of a failure rate and a probability of fatal failure for the devices, and aggregating the same across the structures and the failure mechanisms.

Abstract: A method of predicting the lifetime reliability of an integrated circuit device with respect to one or more failure mechanisms includes breaking down the integrated circuit device into structures; breaking down each structure into elements and devices; evaluating each device to determine whether the device is vulnerable to the failure mechanisms and eliminating devices determined not to be vulnerable; estimating, for each determined vulnerable device, the impact of a failure of the device on the functionality of the specific element associated therewith, and classifying the failure into a fatal failure or a non-fatal failure, wherein a fatal failure causes the element employing the given device to fail; determining, for those devices whose failures are fatal, an effective stress degree and/or time; determining one or more of a failure rate and a probability of fatal failure for the devices, and aggregating the same across the structures and the failure mechanisms.

Abstract: A computer implemented method, apparatus, and computer usable program code for preventing soft error accumulation. A number of cycles between references to a register are counted. Instructions are injected that reference the register for preventing soft error accumulation in response to a determination that the number of cycles is greater than a threshold.

Abstract: A method and apparatus for storing non-critical processor information without imposing significant costs on a processor design is disclosed. Transient data are stored in the processor-local cache hierarchy. An additional control bit forms part of cache addresses, where addresses having the control bit set are designated as “transient storage addresses.” Transient storage addresses are not written back to external main memory and, when evicted from the last level of cache, are discarded. Preferably, transient storage addresses are “privileged” in that they are either not accessible to software or only accessible to supervisory or administrator-level software having appropriate permissions. A number of management functions/instructions are provided to allow administrator/supervisor software to manage and/or modify the behavior of transient cache storage.

Abstract: A hardware based method for determining when to migrate cache lines to the cache bank closest to the requesting processor to avoid remote access penalty for future requests. In a preferred embodiment, decay counters are enhanced and used in determining the cost of retaining a line as opposed to replacing it while not losing the data. In one embodiment, a minimization of off-chip communication is sought; this may be particularly useful in a CMP environment.