Patents by Inventor Juichiro Ukon

Juichiro Ukon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10753843
    Abstract: Provided is a gel particle measuring apparatus for detecting scattered light generated by light irradiation at a production start time point of a gel particle, and performing measurement promptly and accurately while suppressing attenuation of the scattered light in a solvent in which the phenomenon occurs.
    Type: Grant
    Filed: December 26, 2016
    Date of Patent: August 25, 2020
    Assignee: PROJECT KBF CO., LTD.
    Inventors: Toru Obata, Juichiro Ukon
  • Patent number: 10359366
    Abstract: It is problematic to provide a substrate for surface enhanced Raman scattering spectroscopy capable of being incorporated and used as a detector of a flow system such as a liquid chromatographic device, and a surface enhanced Raman scattering spectroscopy device and a liquid chromatographic device using same. The above problem is solved by providing a substrate body, pores formed penetrating said substrate body, and particles arranged on an exposed surface of said substrate body not to close the pores, and by an analyte being passed through said particles in-between and said pores.
    Type: Grant
    Filed: August 11, 2014
    Date of Patent: July 23, 2019
    Assignee: UKON Craft Science Ltd.
    Inventor: Juichiro Ukon
  • Publication number: 20190017915
    Abstract: Provided is a gel particle measuring apparatus for detecting scattered light generated by light irradiation at a production start time point of a gel particle, and performing measurement promptly and accurately while suppressing attenuation of the scattered light in a solvent in which the phenomenon occurs.
    Type: Application
    Filed: December 26, 2016
    Publication date: January 17, 2019
    Applicant: PROJECT KBF CO., LTD.
    Inventors: Toru OBATA, Juichiro UKON
  • Publication number: 20160109369
    Abstract: It is problematic to provide a substrate for surface enhanced Raman scattering spectroscopy capable of being incorporated and used as a detector of a flow system such as a liquid chromatographic device, and a surface enhanced Raman scattering spectroscopy device and a liquid chromatographic device using same. The above problem is solved by providing a substrate body, pores formed penetrating said substrate body, and particles arranged on an exposed surface of said substrate body not to close the pores, and by an analyte being passed through said particles in-between and said pores.
    Type: Application
    Filed: August 11, 2014
    Publication date: April 21, 2016
    Inventor: Juichiro Ukon
  • Patent number: 9116116
    Abstract: Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (2); a wavelength selection element (3) for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (2); an optical detection means (5) for detecting the intensity of light red out from the wavelength selection element (3); and a drive current control means (6) for increasing or decreasing the drive current of the laser light source (2) near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means (5) has a peak value.
    Type: Grant
    Filed: March 27, 2009
    Date of Patent: August 25, 2015
    Assignee: HORIBA, LTD.
    Inventors: Juichiro Ukon, Takuya Ido, Susumu Mimura
  • Publication number: 20140340675
    Abstract: A method and an apparatus for discriminating a cardiac tissue using Raman scattering are provided which enable a noninvasive discrimination of the cardiac tissue to be accurately performed. The discrimination method includes: a step of irradiating a sample containing a cardiac tissue with excitation light; a step of detecting Raman scattering light from the sample; an analysis step of analyzing the detected Raman scattering light by a multivariate analysis using as an index, Raman scattering spectra which are specific to at least a living myocardial tissue, a necrotic myocardial tissue, a granulation tissue and a fibrotic tissue, respectively; and a step of discriminating the cardiac tissue in accordance with analysis results obtained in the analysis step.
    Type: Application
    Filed: May 15, 2014
    Publication date: November 20, 2014
    Applicants: KYOTO PREFECTURAL PUBLIC UNIVERSITY CORPORATION, The Graduate School for the Creation of New Photonics Industries, HORIBA, Ltd.
    Inventors: Tetsuro Takamatsu, Yoshinori Harada, Takeo Minamikawa, Nanae Muranishi, Katsuhiro Ishii, Juichiro Ukon, Junichi Aoyama
  • Publication number: 20140183380
    Abstract: A measurement unit used in an analyzing apparatus for measuring concentrations of component gases in a sample gas comprises a light emitting unit configured to emit a measurement light to the sample gas, a light receiving unit configured to receive the measurement light on a light receiving plane, a purge air introducing unit configured to introduce a purge air into a vicinity of at least one of the light emitting unit and the light receiving unit, and a condensing lens arranged in an optical path of the measurement light from the light emitting unit to the light receiving unit, the condensing lens being configured to condense the measurement light within the light receiving plane of the light receiving unit, a propagation path of the measurement light being varied by a thermal lens effect caused by a temperature difference between the sample gas and the purge air.
    Type: Application
    Filed: May 17, 2012
    Publication date: July 3, 2014
    Applicant: HORIBA, LTD.
    Inventors: Juichiro Ukon, Takuya Ido, Toshikazu Ohnishi, Toshiyuki Tsujimoto
  • Patent number: 8704174
    Abstract: In situ monitoring of a degradation level of refined oil during use is provided. An excitation light irradiation unit varies intensity of excitation light to irradiate the excitation light onto the refined oil with a resulting fluorescence. A fluorescence intensity detection unit detects the intensity of fluorescence generated by the irradiation of the excitation light, and a time lag characteristic calculation unit calculates a time lag characteristic of a fluorescence intensity variation with respect to the intensity variation of the excitation light. A degradation index value acquisition unit provides to a predetermined correlation between a degradation index value indicating a degradation level of the refined oil and the time lag characteristic is used to acquire a degradation index value from a time lag characteristic calculated in the time lag characteristic calculation unit to determine the current degradation status of the oil.
    Type: Grant
    Filed: December 22, 2010
    Date of Patent: April 22, 2014
    Assignee: Horiba, Ltd.
    Inventors: Juichiro Ukon, Toshiyuki Tsujimoto
  • Publication number: 20110155925
    Abstract: In situ monitoring of a degradation level of refined oil during use is provided. An excitation light irradiation part varies intensity of excitation light to irradiate the excitation light onto the refined oil with a resulting fluorescence. A fluorescence intensity detection part detects the intensity of fluorescence generated by the irradiation of the excitation light, and a time lag characteristic calculation part calculates a time lag characteristic of a fluorescence intensity variation with respect to the intensity variation of the excitation light. A degradation index value acquisition part provides to a predetermined correlation between a degradation index value indicating a degradation level of the refined oil and the time lag characteristic is used to acquire a degradation index value from a time lag characteristic calculated in the time lag characteristic calculation part t determine the current degradation status of the oil.
    Type: Application
    Filed: December 22, 2010
    Publication date: June 30, 2011
    Inventors: Juichiro Ukon, Toshiyuki Tsujimoto
  • Publication number: 20110019183
    Abstract: Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (2); a wavelength selection element (3) for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (2); an optical detection means (5) for detecting the intensity of light red out from the wavelength selection element (3); and a drive current control means (6) for increasing or decreasing the drive current of the laser light source (2) near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means (5) has a peak value.
    Type: Application
    Filed: March 27, 2009
    Publication date: January 27, 2011
    Applicant: HORIBA, LTD.
    Inventors: Juichiro Ukon, Takuya Ido, Susumu Mimura
  • Patent number: 6943879
    Abstract: A method for monitoring and/or controlling the positioning and/or condition of a plasma in a plasma spectrometer, which comprises: acquiring image data of the plasma through a video-camera (7), and a) displaying on a display device (10) a plasma image from the acquired image data; and/or b) storing the image data in a computer unit (9). Application to inductively coupled high frequency plasma optical emission and mass spectrometers.
    Type: Grant
    Filed: November 9, 2001
    Date of Patent: September 13, 2005
    Assignee: Jobin Yvon, S.A.
    Inventors: Juichiro Ukon, Yves Danthez
  • Publication number: 20040247483
    Abstract: The present invention discloses a system for analyzing elements contained in a sample in very slight amounts, such as C, S, O, N, H and the like in materials, such as steel and ceramics. An element analyzer can gasify the sample elements in an appropriate gas, such as oxygen gas in a high-frequency heating furnace or an electric resistant furnace. Resulting gas can be introduced into a mass spectrometer to permit a quantitative analysis of the sample elements. A metal sample can be levitated and heated and melted with induction current for producing the resultant gas for introduction to a mass spectrometer.
    Type: Application
    Filed: July 24, 2003
    Publication date: December 9, 2004
    Inventors: Takeshi Uemura, Akihiro Hirano, Juichiro Ukon
  • Publication number: 20040227941
    Abstract: A particle size distribution analyzer is provided which is capable of analysis with improved precision by canceling noise superimposed on scattering light information obtained from a test sample containing test particles to be analyzed.
    Type: Application
    Filed: February 19, 2004
    Publication date: November 18, 2004
    Inventors: Tetsuji Yamaguchi, Juichiro Ukon, Makoto Umezawa
  • Patent number: 6627155
    Abstract: The present invention discloses a system for analyzing elements contained in a sample in very slight amounts, such as C, S, O, N, H and the like in materials, such as steel and ceramics. An element analyzer can gasify the sample elements in an appropriate gas, such as oxygen gas in a high-frequency heating furnace or an electric resistant furnace. Resulting gas can be introduced into a mass spectrometer to permit a quantitative analysis of the sample elements. A metal sample can be levitated and heated and melted with induction current for producing the resultant gas for introduction to a mass spectrometer.
    Type: Grant
    Filed: June 9, 1999
    Date of Patent: September 30, 2003
    Assignee: Horiba, Ltd.
    Inventors: Takeshi Uemura, Akihiro Hirano, Juichiro Ukon
  • Publication number: 20020071117
    Abstract: A method for monitoring and/or controlling the positioning and/or condition of a plasma in a plasma spectrometer, which comprises:
    Type: Application
    Filed: November 9, 2001
    Publication date: June 13, 2002
    Inventors: Juichiro Ukon, Yves Danthez
  • Publication number: 20010050332
    Abstract: An imaging device and method, as well as a spectroscopy system. The imaging device includes a line-column matrix (1) of photodetectors (4), each of the photodetectors having a CMOS-type pixel (2) and a amplifier (3) with a gain. It also comprises gain control elements, capable of fixing the gains individually for each of the photodetectors. The imaging device is useful in spectroscopy, in particular for atomic emission.
    Type: Application
    Filed: June 13, 2001
    Publication date: December 13, 2001
    Applicant: JOBIN YVON S.A.
    Inventor: Juichiro Ukon
  • Patent number: 5886347
    Abstract: An analytical method capable of easily, rapidly, and accurately determining concentrations of a multi-component aqueous solution. Near-infrared spectra of a standard solution containing k components of known concentrations are measured n times within a range of 1,500 to 1,850 nm. A loading matrix of p columns by m rows and an intermediate matrix of k columns by m rows for an appointed factor number m are obtained from a response matrix of p columns by n rows consisting of p absorbance values of the respective spectra in a calibration stage and p absorbance values of a near-infrared spectrum within a wavelength range of 1,500 to 1,850 nm of a test liquid. The test liquid contains k components including pure water of unknown concentrations. The concentrations of the k components are determined from a group of absorbance values and the loading and intermediate matrices obtained in the calibration stage by a matrix operation in an prediction stage.
    Type: Grant
    Filed: July 13, 1995
    Date of Patent: March 23, 1999
    Assignee: Horiba, Ltd.
    Inventors: Masaru Inoue, Juichiro Ukon, Issei Yokoyama, Takashi Hagiwara
  • Patent number: 5870193
    Abstract: An infrared spectrometer disperses a radiation ray from a catalyst which has been exposed to a gas for evaluation to adsorb adsorbates thereon, and outputs spectral data in accordance with a wavenumber of the radiation ray to a computer storing reference data. The computer normalizes the spectral data and the reference data, and then, it calculates a product of the normalized spectral data and the reference data. Thereafter, a function of the product is differentiated with respect to the wavenumber to obtain a differential function. Accordingly, a specified wavenumber for which the differential function is zero is determined, so that the common peak of the spectral data and the reference data at the specified wavenumber is accurately determined.
    Type: Grant
    Filed: October 6, 1997
    Date of Patent: February 9, 1999
    Assignees: Nippon Soken, Inc., Horiba, Ltd.
    Inventors: Atsuhiro Sumiya, Itsuhei Ogata, Tsukasa Satake, Juichiro Ukon
  • Patent number: 5745369
    Abstract: A method and apparatus of determining peak positions in a spectrum of data includes providing a spectrum of energy to a sample and measuring the spectrum of energy after contact with the sample to provide a range of spectrum data representative of the sample. The spectrum data is then subjected to a differential calculus operation of an even number to provide a differential spectrum data. The spectrum data and differential spectrum data are combined whereby the characteristics of the components in the sample are enhanced. The combined data is then analyzed so that the components in the sample can be identified.
    Type: Grant
    Filed: May 30, 1995
    Date of Patent: April 28, 1998
    Assignee: Horiba Ltd.
    Inventor: Juichiro Ukon
  • Patent number: 5710627
    Abstract: A wavelength-scanning mechanism for a spectrometer utilizes an eccentric disc cam driven by a pulse motor to pivot a diffraction grating with a contact bar fixed thereto. A light source supplies light to the mechanism with a first concave spherical mirror reflecting light to the diffraction grating and reflecting light reflected by the diffraction grating to a zero-order light detector. A second concave spherical mirror reflects light diffracted by the diffraction grating to a diffracted light detector. A controller receives information from the light detectors and controls the pulse motor. At least one cam follower is mounted on the cam at a position eccentric from the rotational axis thereof and slidably contacts the contact bar. Alternatively, the diffraction grating has two contact bars fixed thereto, and the cam follower is pivoted between the contact bars.
    Type: Grant
    Filed: June 1, 1995
    Date of Patent: January 20, 1998
    Assignee: Horiba Ltd.
    Inventors: Masaru Inoue, Juichiro Ukon