Patents by Inventor Juichiro Ukon

Juichiro Ukon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5521845
    Abstract: An analytical system capable of analyzing data by means of an analytical machine or tool and providing that analytical data to a computer for processing is provided. A protocol conversion radio machine is provided corresponding to each analytical machine and tool to be controlled and data can be communicated in a wireless manner between the analytical machine and tool and a plurality of computers. The protocol conversion radio machines cannot only mutually communicate with the plurality of computers but also can give and receive control signals to assist in the accumulation and transmission of analytical data between the computers and the analytical machines and tools.
    Type: Grant
    Filed: September 24, 1993
    Date of Patent: May 28, 1996
    Assignee: Horiba, Ltd.
    Inventors: Juichiro Ukon, Toshihide Sakai, Yasuhiro Nishikata
  • Patent number: 5428443
    Abstract: A particle-size distribution measuring apparatus and method is provided for suspending a sample containing particles in a fluid and introducing the suspended particles into a sample cell. The sample cell is illuminated with light from a laser source and the diffracted light from the particles is measured by an optical detector array. A computer circuit is capable of computing a plurality of graphs of particle-size distribution in repetitive measurement over a predetermined time period. A video display discloses the plurality of graphs in a juxtapositioned arrangement or stacked arrangement to enable the observer to distinguish between any variations in adjacent graphs.
    Type: Grant
    Filed: October 8, 1993
    Date of Patent: June 27, 1995
    Assignee: Horiba, Ltd.
    Inventors: Hiroyuki Kitamura, Yoshiaki Togawa, Juichiro Ukon
  • Patent number: 5301007
    Abstract: A microscopic spectrometer having a separate optical path for masking light from a sample for spectrometric measurements. In the preferred embodiment, a beam splitter is disposed behind an object lens to form two branched optical paths. One of the optical paths is provided with masks at a point of focus along the path, allowing part of the image to be masked. The second optical path allows optical throughput and observation of the entire image. These two optical paths are rejoined, and a final image is obtained for visual inspection by synthesizing the two optical paths.
    Type: Grant
    Filed: October 31, 1990
    Date of Patent: April 5, 1994
    Assignee: Horiba Ltd.
    Inventor: Juichiro Ukon
  • Patent number: 5278413
    Abstract: An infrared microscopic spectrometer includes an optical system which allows for a shifting of the optical path interactive with a sample from a sample transmissive optical path to an optical path through an ATR crystal using ATR analysis. In the shown embodiment, the shift in the optical path is in a direction perpendicular to a transmissive optical axis, at least along a portion of the shift adjacent to the transmissive optical axis. The shift is undertaken by a moving means which moves the collecting element providing the infrared rays. A sample-holding structure allows the ATR crystal to be rotated or detachably removed, as necessary.
    Type: Grant
    Filed: January 13, 1992
    Date of Patent: January 11, 1994
    Assignee: Horiba, Ltd.
    Inventors: Tetsuji Yamaguchi, Juichiro Ukon, Kazuyuki Ikemoto
  • Patent number: 5241362
    Abstract: A microscopic spectrometer is disclosed wherein a sample can be irradiated with light from a first light source and either transmitted or reflected through the sample to a spectrometrical measuring system. A half mirror can be detachably provided in the optical system to form two branched optical paths. A second light source can be positioned to irradiate the sample 2 with light through a masking system. The half mirror can transmit the image of the masking system to superimpose it upon the sample and a composite image can then be reflected from the half mirror onto a branched optical path to be observed by the operator. The operator can adjust the actual positions of the masks assembly, while, at the same time, see the entire field of view of the specimen to therefore define in an easy and convenient manner the portion of the specimen to be tested. The respective half mirror and second light source can then be removed prior to performing a spectrometric measurement.
    Type: Grant
    Filed: December 26, 1991
    Date of Patent: August 31, 1993
    Assignee: Horiba Ltd.
    Inventors: Juichiro Ukon, Yasushi Nakata
  • Patent number: 5229611
    Abstract: An infrared microscope spectrometer is used to carry out attenuated total reflection (ATR) analysis of a sample. Either the collecting element assembly or focusing element assembly is mounted for selected movement with respect to the other so as to permit alignment of the output beam from the focusing assembly with the optical axis of the spectrometer, whenever an ATR crystal with sample is placed between the collecting and focusing assemblies.
    Type: Grant
    Filed: January 17, 1992
    Date of Patent: July 20, 1993
    Assignee: Horiba, Ltd.
    Inventor: Juichiro Ukon
  • Patent number: 5159405
    Abstract: A swinging member multibeam interferometer for use in a Fourier Transform spectrometer has a pair of mirrors mounted on the swinging member in spaced-apart opposition with the planes of the mirrors being at right angles to the plane of the swinging member. The mirrors may be flat and parallel, flat and skewed with respect to each other, or chevron-shaped with the ends being closer than the middle or the ends being further apart than the middle. A beam splitter directs a reflected beam to one of the pair of mirrors and a transmitted beam to the other of the pair of mirrors. A pair of fixed mirrors reflect both the reflected beam and the transmitted beam back to the mirror pair and a detector. The swinging member is controllably moved by a driving device having a lever connected to a shaft with a piezoelectric ceramic pile supporting said shaft. Contracting and expanding the piezoelectric ceramic pile by electrically energizing means moves the lever and the shaft which is connected to the swinging member.
    Type: Grant
    Filed: October 24, 1990
    Date of Patent: October 27, 1992
    Assignee: Horiba, Ltd.
    Inventor: Juichiro Ukon
  • Patent number: 5136422
    Abstract: An optical system for a microscopic spectrometer includes an objective, an inverse placed telescope for relaying the image formed by the objective towards a detecting element, and an optical element for focusing the relayed image onto the detecting element. In the preferred embodiments, the inverse placed telescope is disposed after the image plane of a Cassegrain objective, and a paraboloid mirror collects the relayed light from the inverse placed telescope to be focused into an image on the detecting element. The inverse placed telescope has a smaller shading coefficient than the Cassegrain objective, and the size of the image of the pupil of the Cassegrain objective is smaller than the diameter of the secondary mirror of the inverse placed telescope. The image of the shaded diameter in the preferred embodiment, which is caused by the secondary mirror of the Cassegrain objective, is greater than the shading diameter caused by the inverse placed telescope itself.
    Type: Grant
    Filed: October 31, 1990
    Date of Patent: August 4, 1992
    Assignee: Horiba, Ltd.
    Inventor: Juichiro Ukon