Abstract: An assistive fine positioning support device for positioning and/or holding a test probe tip (the test probe tip being distanced from the probing head). The support device includes at least one positionable support member having a first support end and a second support end. A tip adapter at the first support end is for connecting the test probe tip to the at least one positionable support member, the tip adapter being in direct contact with the test probe tip. The second support end having means for holding and securing to a surface supporting an electrical component to be probed.

Abstract: A locater tool for positioning a support device for supporting a test probe head or a test probe tip, the locater tool including a template, means for indicating a support device position associated with the template, and means for indicating an achievable probing zone on a surface having connection points when the support device is in the support device position. The locater tool may be a device-attachable locater tool or a pre-positioning locater tool.

Abstract: A locater tool for positioning a support device for supporting a test probe head or a test probe tip, the locater tool including a template, means for indicating a support device position associated with the template, and means for indicating an achievable probing zone on a surface having connection points when the support device is in the support device position. The locater tool may be a device-attachable locater tool or a pre-positioning locater tool.

Abstract: A conductive connector includes a flexible-deflectable extension having a probing end and a head connection end. A conductive transmission path extends between the probing end and the head connection end. A pogo-rotational-action pin is electrically connected to the transmission path at the head connection end of the flexible-deflectable extension.

Abstract: A conductive connector includes a flexible-deflectable extension having a probing end and a head connection end. A conductive transmission path extends between the probing end and the head connection end. A pogo-rotational-action pin is electrically connected to the transmission path at the head connection end of the flexible-deflectable extension.

Abstract: A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe head. The lossy dielectric device preferably includes a lossy dielectric material contained within a container. The container is positionable and securable substantially adjacent the transmission path to improve the curve of a frequency response. Preferably, the container is insulative, puncture resistant, and thin. In some preferred embodiments, a temporary or permanent connection mechanism is also included.

Abstract: A conductive connector includes a bendable, shape retainable extension having a first end and a second end. The first end is integral with the probing head. The test point connector is integral with said second end. The test point connector is for making electrical contact with testing points. The present invention may be part of a probing system. The present invention may also include a method for using the conductive connector.

Abstract: A modular active test probe and removable tip module therefor. Within the scope of the invention, there is a probe tip module comprising a first probe tip adapted for probing a circuit under test to receive a signal therefrom. The probe tip module includes an amplifier having a first input solidly connected to the probe tip, an output connected to an output connector, and a housing for supporting the probe tip, the amplifier, and the output connector. A probe body is cooperatively adapted with the housing for repeatably removably receiving at least the output connector.

Abstract: Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the probe stage may receive multiple analog or digital signals from a device under test (DUT). In some embodiments, the probe stage may include probe pins with integrated series resistance to control signal loading, and an equalizer to shape the signal path's frequency response. The amplification stage may provide a virtual ground reference for a termination impedance that may match the transmission line's impedance and may connect in series with a feedback impedance. In one example, a minimally invasive probe head may facilitate measurement of multiple channels of a high speed data bus with minimal signal distortion and/or attenuation.

Abstract: Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the probe stage may receive multiple analog or digital signals from a device under test (DUT). In some embodiments, the probe stage may include probe pins with integrated series resistance to control signal loading, and an equalizer to shape the signal path's frequency response. The amplification stage may provide a virtual ground reference for a termination impedance that may match the transmission line's impedance and may connect in series with a feedback impedance. In one example, a minimally invasive probe head may facilitate measurement of multiple channels of a high speed data bus with minimal signal distortion and/or attenuation.

Abstract: A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe tip has a probing end for probing electronic circuitry and a connection end for interfacing with a probing head. The resistive conducting material forms at least one path through the encapsulating material from the probing end to the connection end. The resistive conducting material may be a plurality of longitudinally-extending resistive/conductive members or a plurality of particulate resistive/conductive members.

Abstract: A guide for tip to transmission path contact includes a guide insulator having at least one passageway defined therein. Each passageway has a tip passageway end and a transmission path passageway end. The tip passageway end is suitable for at least partially accommodating the tip of a probing head. The transmission path passageway end is suitable for at least partially accommodating a transmission path of a circuit board component. The tip contacts a transmission path through a passageway when the transmission path is positioned in the transmission path passageway end and the tip is positioned within the tip passageway end.

Abstract: A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe head. The lossy dielectric device preferably includes a lossy dielectric material contained within a container. The container is positionable and securable substantially adjacent the transmission path to improve the curve of a frequency response. Preferably, the container is insulative, puncture resistant, and thin. In some preferred embodiments, a temporary or permanent connection mechanism is also included.

Abstract: A lossy dielectric device dissipates, absorbs, and/or dampens electric fields. The lossy dielectric device may be used with any transmission path, such as a transmission line or resistor in a probe head. The lossy dielectric device preferably includes a lossy dielectric material contained within a container. The container is positionable and securable substantially adjacent the transmission path to improve the curve of a frequency response. Preferably, the container is insulative, puncture resistant, and thin. In some preferred embodiments, a temporary or permanent connection mechanism is also included.

Abstract: A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe tip has a probing end for probing electronic circuitry and a connection end for interfacing with a probing head. The resistive conducting material forms at least one path through the encapsulating material from the probing end to the connection end. The resistive conducting material may be a plurality of longitudinally-extending resistive/conductive members or a plurality of particulate resistive/conductive members.

Abstract: A method of detecting title fraud utilizes an electronic database in which is stored information relating to one or more title transactions. Such information includes common addresses of real estate properties, and at least one of a type of title transaction involved, and identifying indicia of parties to the title transactions. The method initiates a title order to a settlement agent for a new title transaction involving settlement services relating to a particular real estate property, and then searches the database for at least one other title transaction involving the same particular property, parties, or other indicia in common with said title order, and for any copendency during a period between the title order initiation and subsequent registration and indexing of the title transaction after the title transaction is completed.

Abstract: A substantially planar (in an x-y plane) probing tip includes a probing tip body and two test point connector projections. The first test point connector projection is movably attached to the body to allow motion therebetween. The second test point connector projection is also attached to the body. The motion actuator actuates motion that the motion translator, in turn, converts to move at least one of the test point connector projection connection ends in a third dimension out of the x-y plane. The probing tip has an open position in which the relative distance between the test point connector projections is relatively large. The probing tip also has a closed position in which the relative distance between the test point connector projections is relatively small. In one alternative preferred embodiment, the second test point connector projection body end is also movably attached to the body to allow motion therebetween.

Abstract: A conductive connector includes a bendable, shape retainable extension having a head connector at one end and a test point connector at the opposite end. The head connector is for connecting the conductive connector to a probing head. The test point connector is for making electrical contact with testing points. The present invention may be part of a probing system that includes a probing head. The present invention may also include a method for using the conductive connector.

Abstract: A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe has a probing end for probing electronic circuitry and a connection end for interfacing with a probing head. The resistive conducting material forms at least one path through the encapsulating material from the probing end to the connection end. The resistive conducting material may be a plurality of longitudinally extending resistive/conductive members or a plurality of particulate resistive/conductive members.

Abstract: A guide for tip to transmission path contact includes a guide insulator with at least one passageway defined therein. The passageway has a tip passageway end and a transmission path passageway end. The guide insulator has an adhesive surface with adhesive associated therewith. The adhesive may be semi-permanent or permanent adhesive. The adhesive is for securing the guide insulator such that the passageway allows access to the transmission path. When not in use, the adhesive may attach the guide insulator to a nonstick surface of a backing surface.