Patents by Inventor Jun Etoh
Jun Etoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11664185Abstract: A vibration damping system for a charged particle beam apparatus according to the present invention includes a column through which a charged particle beam passes, a vibration detection unit that detects vibration of the column, a damping mechanism that applies vibration to the column to suppress the vibration of the column, and a control device that controls the damping mechanism. The control device includes a damping gain control unit that amplifies a detection signal of the vibration detection unit with a set amplification factor and outputs an amplified detection signal as a control signal to the damping mechanism, and a saturation suppression unit that adjusts a feedback gain value of the damping gain control unit according to a detection signal of the vibration detection unit, a signal of the damping mechanism, and a maximum output value and a minimum output value of the damping mechanism.Type: GrantFiled: November 29, 2021Date of Patent: May 30, 2023Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Jun Etoh, Hironori Ogawa, Shuichi Nakagawa, Terunobu Funatsu
-
Publication number: 20230035686Abstract: Provided are a vibration-suppressing mechanism that has excellent maintainability and can effectively control vibration of a column, and a charged particle beam device using the same.Type: ApplicationFiled: January 30, 2020Publication date: February 2, 2023Inventors: Hiroki TAKAHASHI, Shuichi NAKAGAWA, Toshihiko SHIMIZU, Kiyoshi YABATA, Hironori OGAWA, Jun ETOH
-
Publication number: 20220208505Abstract: A vibration damping system for a charged particle beam apparatus according to the present invention includes a column through which a charged particle beam passes, a vibration detection unit that detects vibration of the column, a damping mechanism that applies vibration to the column to suppress the vibration of the column, and a control device that controls the damping mechanism. The control device includes a damping gain control unit that amplifies a detection signal of the vibration detection unit with a set amplification factor and outputs an amplified detection signal as a control signal to the damping mechanism, and a saturation suppression unit that adjusts a feedback gain value of the damping gain control unit according to a detection signal of the vibration detection unit, a signal of the damping mechanism, and a maximum output value and a minimum output value of the damping mechanism.Type: ApplicationFiled: November 29, 2021Publication date: June 30, 2022Inventors: Jun ETOH, Hironori OGAWA, Shuichi NAKAGAWA, Terunobu FUNATSU
-
Patent number: 7499340Abstract: A semiconductor memory device formed on a semiconductor chip includes first memory arrays, a plurality of second memory arrays, a first voltage generator, and first bonding pads. The semiconductor chip is divided into first, second and third rectangle regions and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The first memory arrays are formed in the first rectangle region. The second memory arrays are formed in the second rectangle region. The voltage generator and first bonding pads are arranged in the third rectangle region. The first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the second memory arrays.Type: GrantFiled: January 9, 2008Date of Patent: March 3, 2009Assignees: Hitachi, Ltd., Hitachi VLSI Engineering Corp.Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Publication number: 20080205111Abstract: A semiconductor memory device formed on a semiconductor chip includes first memory arrays, a plurality of second memory arrays, a first voltage generator, and first bonding pads. The semiconductor chip is divided into first, second and third rectangle regions and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The first memory arrays are formed in the first rectangle region. The second memory arrays are formed in the second rectangle region. The voltage generator and first bonding pads are arranged in the third rectangle region. The first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the second memory arrays.Type: ApplicationFiled: January 9, 2008Publication date: August 28, 2008Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Patent number: 7345929Abstract: A semiconductor memory device formed on a semiconductor chip includes first memory arrays, a plurality of second memory arrays, a first voltage generator, and first bonding pads. The semiconductor chip is divided into first, second and third rectangle regions and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The first memory arrays are formed in the first rectangle region. The second memory arrays are formed in the second rectangle region. The voltage generator and first bonding pads are arranged in the third rectangle region. The first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the second memory arrays.Type: GrantFiled: March 7, 2007Date of Patent: March 18, 2008Assignees: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd.Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Publication number: 20070242535Abstract: A semiconductor memory device formed on a semiconductor chip includes first memory arrays, a plurality of second memory arrays, a first voltage generator, and first bonding pads. The semiconductor chip is divided into first, second and third rectangle regions and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The first memory arrays are formed in the first rectangle region. The second memory arrays are formed in the second rectangle region. The voltage generator and first bonding pads are arranged in the third rectangle region. The first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the second memory arrays.Type: ApplicationFiled: March 7, 2007Publication date: October 18, 2007Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Patent number: 7203101Abstract: A semiconductor memory device formed on a semiconductor chip comprises a plurality of first memory arrays, a plurality of second memory arrays, a first voltage generator, and a plurality of first bonding pads. The semiconductor chip is divided into a first rectangle region, a second rectangle region, and a third rectangle region and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The plurality of first memory arrays are formed in the first rectangle region. The plurality of second memory arrays are formed in the second rectangle region. The voltage generator and the plurality of first bonding pads are arranged in the third rectangle region. The plurality of first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the plurality of second memory arrays.Type: GrantFiled: January 12, 2006Date of Patent: April 10, 2007Assignees: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd.Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Patent number: 7106643Abstract: Method for manufacturing a memory device, the memory being a memory array with a spare bit line and being provided with a defect recovery scheme featuring a redundancy circuit. The redundancy circuit includes one or more comparing circuits having programmable elements which function as a memory for storing therein a defective address existing in the memory array. The programmable elements of the redundancy circuit can be programmed in accordance with any of a number of different types of defect modes. Each comparing circuit of the redundancy circuit compares information (data) inputted therein, for example, the column and row addresses which may be under the control of an address multiplex system, with that programmed in the programmable elements of the comparing circuit. On the basis of this comparison, an appropriate defect recovery is effected.Type: GrantFiled: May 31, 2005Date of Patent: September 12, 2006Assignee: Renesas Technology Corp.Inventors: Masashi Horiguchi, Jun Etoh, Masakazu Aoki, Kiyoo Itoh
-
Publication number: 20060120125Abstract: A semiconductor memory device formed on a semiconductor chip comprises a plurality of first memory arrays, a plurality of second memory arrays, a first voltage generator, and a plurality of first bonding pads. The semiconductor chip is divided into a first rectangle region, a second rectangle region, and a third rectangle region and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The plurality of first memory arrays are formed in the first rectangle region. The plurality of second memory arrays are formed in the second rectangle region. The voltage generator and the plurality of first bonding pads are arranged in the third rectangle region. The plurality of first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the plurality of second memory arrays.Type: ApplicationFiled: January 12, 2006Publication date: June 8, 2006Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Patent number: 7016236Abstract: A semiconductor memory device formed on a semiconductor chip comprises a plurality of first memory arrays, a plurality of second memory arrays, a first voltage generator, and a plurality of first bonding pads. The semiconductor chip is divided into a first rectangle region, a second rectangle region, and a third rectangle region and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The plurality of first memory arrays are formed in the first rectangle region. The plurality of second memory arrays are formed in the second rectangle region. The voltage generator and the plurality of first bonding pads are arranged in the third rectangle region. The plurality of first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the plurality of second memory arrays.Type: GrantFiled: April 8, 2005Date of Patent: March 21, 2006Assignees: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd.Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Publication number: 20050219922Abstract: Method for manufacturing a memory device, the memory being a memory array with a spare bit line and being provided with a defect recovery scheme featuring a redundancy circuit. The redundancy circuit includes one or more comparing circuits having programmable elements which function as a memory for storing therein a defective address existing in the memory array. The programmable elements of the redundancy circuit can be programmed in accordance with any of a number of different types of defect modes. Each comparing circuit of the redundancy circuit compares information (data) inputted therein, for example, the column and row addresses which may be under the control of an address multiplex system, with that programmed in the programmable elements of the comparing circuit. On the basis of this comparison, an appropriate defect recovery is effected.Type: ApplicationFiled: May 31, 2005Publication date: October 6, 2005Inventors: Masashi Horiguchi, Jun Etoh, Masakazu Aoki, Kiyoo Itoh
-
Publication number: 20050179058Abstract: A semiconductor memory device formed on a semiconductor chip comprises a plurality of first memory arrays, a plurality of second memory arrays, a first voltage generator, and a plurality of first bonding pads. The semiconductor chip is divided into a first rectangle region, a second rectangle region, and a third rectangle region and the third rectangle region is arranged between the first rectangle region and the second rectangle region. The plurality of first memory arrays are formed in the first rectangle region. The plurality of second memory arrays are formed in the second rectangle region. The voltage generator and the plurality of first bonding pads are arranged in the third rectangle region. The plurality of first bonding pads are arranged between the first rectangle region and the voltage generator and no bonding pads are arranged between the voltage generator and the plurality of second memory arrays.Type: ApplicationFiled: April 8, 2005Publication date: August 18, 2005Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Patent number: 6909647Abstract: A semiconductor memory is provided with a defect recovery scheme featuring a redundancy circuit. The memory array in the memory has a plurality of word lines, a plurality of bit lines, a spare bit line, and a plurality of memory cells. The redundancy circuit includes one or more comparing circuits having programmable elements which function as a memory for storing therein a defective address existing in the memory array. The programmable elements of the redundancy circuit can be programmed in accordance with any of a number of different types of defect modes. Each comparing circuit of the redundancy circuit compares information (data) inputted therein, for example, the column and row addresses which may be under the control of an address multiplex system, with that programmed in the programmable elements of the comparing circuit. On the basis of this comparison, an appropriate defect recovery is effected.Type: GrantFiled: March 31, 2004Date of Patent: June 21, 2005Assignee: Renesas Technology Corp.Inventors: Masashi Horiguchi, Jun Etoh, Masakazu Aoki, Kiyoo Itoh
-
Patent number: 6898130Abstract: A semiconductor memory device, in which peripheral circuits are arranged in a cross area of a semiconductor chip composed of the longitudinal center portions and the transverse center portions, and in which memory arrays are arranged in the four regions which are divided by the cross area. This structure in which the peripheral circuits are arranged at the center portion of the chip permits the longest signal transition paths to be shortened to about one half of the chip size to speed up the DRAM which is intended to have a large storage capacity.Type: GrantFiled: October 14, 2003Date of Patent: May 24, 2005Assignees: Hitachi, Ltd., Hitachi VLSI Engineering Corp.Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Publication number: 20040240259Abstract: Herein disclosed is a semiconductor memory device, in which peripheral circuits are arranged in a cross area of a semiconductor chip composed of the longitudinal center portions and the transverse center portions, and in which memory arrays are arranged in the four regions which are divided by the cross area. Thanks to this structure in which the peripheral circuits are arranged at the center portion of the chip, the longest signal transmission paths can be shortened to about one half of the chip size to speed up the DRAM which is intended to have a large storage capacity.Type: ApplicationFiled: October 14, 2003Publication date: December 2, 2004Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Publication number: 20040184329Abstract: A semiconductor memory is provided with a defect recovery scheme featuring a redundancy circuit. The memory array in the memory has a plurality of word lines, a plurality of bit lines, a spare bit line, and a plurality of memory cells. The redundancy circuit includes one or more comparing circuits having programmable elements which function as a memory for storing therein a defective address existing in the memory array. The programmable elements of the redundancy circuit can be programmed in accordance with any of a number of different types of defect modes. Each comparing circuit of the redundancy circuit compares information (data) inputted therein, for example, the column and row addresses which may be under the control of an address multiplex system, with that programmed in the programmable elements of the comparing circuit. On the basis of this comparison, an appropriate defect recovery is effected.Type: ApplicationFiled: March 31, 2004Publication date: September 23, 2004Inventors: Masashi Horiguchi, Jun Etoh, Masakazu Aoki, Kiyoo Itoh
-
Patent number: 6754114Abstract: A semiconductor memory is provided with a defect recovery scheme featuring a redundancy circuit. The memory array in the memory has a plurality of word lines, a plurality of bit lines, a spare bit line, and a plurality of memory cells. The redundancy circuit includes one or more comparing circuits having programmable elements which function as a memory for storing therein a defective address existing in the memory array. The programmable elements of the redundancy circuit can be programmed in accordance with any of a number of different types of defect modes. Each comparing circuit of the redundancy circuit compares information (data) inputted therein, for example, the column and row addresses which may be under the control of an address multiplex system, with that programmed in the programmable elements of the comparing circuit. On the basis of this comparison, an appropriate defect recovery is effected.Type: GrantFiled: March 31, 2003Date of Patent: June 22, 2004Assignee: Renesas Technology Corp.Inventors: Masashi Horiguchi, Jun Etoh, Masakazu Aoki, Kiyoo Itoh
-
Patent number: 6657901Abstract: A semiconductor memory device, in which peripheral circuits are arranged in a cross area of a semiconductor chip composed of the longitudinal center portions and the transverse center portions, and in which memory arrays are arranged in the four regions which are divided by the cross area. A benefit of this structure in which the peripheral circuits are arranged at the center portion of the chip, is that the longest signal transmission paths can be shortened to about one half of the chip size to speed up the DRAM which is intended to have a large storage capacity.Type: GrantFiled: September 26, 2002Date of Patent: December 2, 2003Assignees: Hitachi, Ltd., Hitachi VLSI Engineering Corp.Inventors: Kazuhiko Kajigaya, Kazuyuki Miyazawa, Manabu Tsunozaki, Kazuyoshi Oshima, Takashi Yamazaki, Yuji Sakai, Jiro Sawada, Yasunori Yamaguchi, Tetsurou Matsumoto, Shinji Udo, Hiroshi Yoshioka, Hirokazu Saito, Mitsuhiro Takano, Makoto Morino, Sinichi Miyatake, Eiji Miyamoto, Yasuhiro Kasama, Akira Endo, Ryoichi Hori, Jun Etoh, Masashi Horiguchi, Shinichi Ikenaga, Atsushi Kumata
-
Patent number: RE40132Abstract: Disclosed is a one-chip ULSI which can carry out the fixed operation in a wide range of power supply voltage (1 V to 5.5 V). This one-chip ULSI is composed of a voltage converter circuit(s) which serves to a fixed internal voltage for a wide range of power supply voltage, an input/output buffer which can be adapted to several input/output levels, a dynamid RAM(s) which can operate at a power supply voltage of 2 V or less, etc. This one-chip ULSI can be applied to compact and portable electronic devices such as a lap-top type personal computer, an electronic pocket note book, a solid-state camera, etc.Type: GrantFiled: May 25, 2001Date of Patent: March 4, 2008Assignee: Elpida Memory, Inc.Inventors: Jun Etoh, Yoshinobu Nakagome