Abstract: An integrated circuit includes a logic circuit block that includes a first adaptive logic module configurable to store a first state of a first signal received from a device-under-test in a first register, a second adaptive logic module configurable to store a second state of a second signal in a second register during a user mode of the integrated circuit simultaneously with the first state of the first signal being stored in the first register, and a third adaptive logic module configurable to store a third state of the first signal in a third register. The first and the third states of the first signal are stored for consecutive clock cycles in the first register and the third register. The logic circuit block is configurable to scan out the second state in the second register and the third state in the third register.

Abstract: A system may include a host processor, a coprocessor for accelerating tasks received from the host processor, and one or more memory dies mounted to the coprocessor. The coprocessor and the memory die may be part of an integrated circuit package. The memory die may convey configuration bit streams to one or more logic sectors in programmable circuitry of the coprocessor over through-silicon vias. Each logic sector may include one or more data registers that are loaded with configuration data from the memory die. Multiple data registers may be loaded with configuration data simultaneously. The configuration data may be loaded onto an array of configuration memory cells using the data registers. Multiple data registers may be pipelined to allow simultaneous loading of configuration data into multiple sub-arrays of the array of configuration memory cells.

Abstract: An integrated circuit device may cache configuration data to enable rapid configuration from fabric cache memory. The integrated circuit device may include programmable logic fabric having configuration memory and programmable logic elements controlled by the configuration memory, and sector-aligned memory apart from the programmable logic fabric. A first sector of the configuration memory may be programmed with first configuration data. The sector-aligned memory may include a first sector of sector-aligned memory that may cache the first configuration data while the configuration memory is programmed with the first configuration data a first time. A second sector of sector-aligned memory may cache second configuration data for a second sector of the configuration memory in parallel while the first sector of sector-aligned memory caches the first configuration data for the first sector of the configuration memory.

Abstract: An integrated circuit device may include programmable logic fabric on a first integrated circuit die and sector-aligned memory on a second integrated circuit die to enable large amounts of data to be rapidly processed by a sector of programmable logic of the programmable logic device. The programmable logic fabric may include a first and second sectors. The first sector may be programmed with a circuit design that operates on a first set of data. The sector-aligned memory may include a first sector of sector-aligned memory directly accessible by the first sector of programmable logic fabric and a second sector of sector-aligned memory directly accessible by the second sector of programmable logic fabric. The first sector of sector-aligned memory may store the first set of data.

Abstract: An integrated circuit device may include programmable logic fabric disposed on a first integrated circuit die and having configuration memory. The integrated circuit device may also include a base die that may provide memory and/or operating supporting circuitry. The first die and the second die may be coupled using a high-speed parallel interface. The interface may employ microbumps. The first die and the second die may also include controllers for the interface.

Abstract: Programmable integrated circuits may be used to perform hardware emulation of an application-specific integrated circuit (ASIC) design. The ASIC design may be loaded onto the programmable integrated circuit as a device under test (DUT). During hardware emulation operations, an emulation host may be used to coordinate testing of the DUT on the programmable device. In particular, the programmable device may include configurable memory elements such as lookup-table random-access memory (LUTRAM) elements that are operable in a LUT mode and a memory mode. An emulation controller may be used to dynamically assert a global emulation request signal, which forces each LUTRAM element that belong to the DUT in the LUT mode, thereby allowing the emulation host to readily access their internal states without having to perform partial reconfiguration.

Abstract: Systems and methods for non-destructive readback and writeback of an integrated circuit system are provided. Such a system may include an adaptive logic element including a first register pair. The first register pair may include a first register operating at a first frequency and a second register operating at a second frequency. The second frequency may be equal to or lower than the first frequency. The second register may store data from the first register. The adaptive logic element may also include a first clock providing a first clock signal to the first register and a second clock providing a second clock signal. The adaptive logic element may also include a multiplexer that may select the first clock signal or the second clock signal as a clock source for the second register.

Abstract: An integrated circuit device may include programmable logic fabric disposed on a first integrated circuit die and having configuration memory. The integrated circuit device may also include a base die that may provide memory and/or operating supporting circuitry. The first die and the second die may be coupled using a high-speed parallel interface. The interface may employ microbumps. The first die and the second die may also include controllers for the interface.

Abstract: An integrated circuit device may include programmable logic fabric disposed on a first integrated circuit die and having configuration memory. The integrated circuit device may also include a base die that may provide memory and/or operating supporting circuitry. The first die and the second die may be coupled using a high-speed parallel interface. The interface may employ microbumps. The first die and the second die may also include controllers for the interface.

Abstract: A prioritized error detection schedule may be generated using computer-aided-design (CAD) tools that receive specifications of critical regions within an array of configuration random access memory (CRAM) cells on an integrated circuit. Each of the specified critical regions may be provided a respective criticality weight. The proportion of indices in a prioritized error detection schedule that prescribe error detection for a given critical region may be based on the criticality weight of the given critical region. A prioritized error detection schedule may prescribe more frequent error correction for critical regions with higher criticality weights relative to critical regions with lower criticality weights. Addressing circuitry on the integrated circuit may be used to read out data from critical regions of CRAM in the order prescribed by the prioritized error detection schedule and check the read out CRAM data for errors.

Abstract: Systems and methods are provided herein for implementing a programmable integrated circuit device that enables high-speed FPGA boot-up through a significant reduction of configuration time. By enabling high-speed FPGA boot-up, the programmable integrated circuit device will be able to accommodate applications that require faster boot-up time than conventional programmable integrated circuit devices are able to accommodate. In order to enable high-speed boot-up, dedicated address registers are implemented for each data line segment of a data line, which in turn significantly reduces configuration random access memory (CRAM) write time (e.g., by a factor of at least two).

Abstract: An integrated circuit configured to execute multiple operations in parallel is provided. The integrated circuit may be organized into multiple logic sectors. Two or more groups of logic sectors may be executed in an interleaved fashion, where successive groups of logic sectors are activated after a predetermined amount of delay. The integrated circuit may include an array of memory cells. Rows of the memory cells may be accessed in an interleaving manner, where successive rows of memory cells are selected after a predetermined amount of delay. Operating groups of circuit components using an interleaving scheme can help improve operational efficiency while reducing power supply noise without having to increase die area for on-die decoupling capacitance.

Abstract: An integrated circuit device may cache configuration data to enable rapid configuration from fabric cache memory. The integrated circuit device may include programmable logic fabric having configuration memory and programmable logic elements controlled by the configuration memory, and sector-aligned memory apart from the programmable logic fabric. A first sector of the configuration memory may be programmed with first configuration data. The sector-aligned memory may include a first sector of sector-aligned memory that may cache the first configuration data while the configuration memory is programmed with the first configuration data a first time. A second sector of sector-aligned memory may cache second configuration data for a second sector of the configuration memory in parallel while the first sector of sector-aligned memory caches the first configuration data for the first sector of the configuration memory.

Abstract: An integrated circuit device may include programmable logic fabric on a first integrated circuit die and sector-aligned memory on a second integrated circuit die to enable large amounts of data to be rapidly processed by a sector of programmable logic of the programmable logic device. The programmable logic fabric may include a first and second sectors. The first sector may be programmed with a circuit design that operates on a first set of data. The sector-aligned memory may include a first sector of sector-aligned memory directly accessible by the first sector of programmable logic fabric and a second sector of sector-aligned memory directly accessible by the second sector of programmable logic fabric. The first sector of sector-aligned memory may store the first set of data.

Abstract: An integrated circuit configured to execute multiple operations in parallel is provided. The integrated circuit may be organized into multiple logic sectors. Two or more groups of logic sectors may be executed in an interleaved fashion, where successive groups of logic sectors are activated after a predetermined amount of delay. The integrated circuit may include an array of memory cells. Rows of the memory cells may be accessed in an interleaving manner, where successive rows of memory cells are selected after a predetermined amount of delay. Operating groups of circuit components using an interleaving scheme can help improve operational efficiency while reducing power supply noise without having to increase die area for on-die decoupling capacitance.

Abstract: Systems and methods are provided herein for implementing a programmable integrated circuit device that enables high-speed FPGA boot-up through a significant reduction of configuration time. By enabling high-speed FPGA boot-up, the programmable integrated circuit device will be able to accommodate applications that require faster boot-up time than conventional programmable integrated circuit devices are able to accommodate. In order to enable high-speed boot-up, dedicated address registers are implemented for each data line segment of a data line, which in turn significantly reduces configuration random access memory (CRAM) write time (e.g., by a factor of at least two).

Abstract: Programmable integrated circuits may be used to perform hardware emulation of an application-specific integrated circuit (ASIC) design. The ASIC design may be loaded onto the programmable integrated circuit as a device under test (DUT). During hardware emulation operations, an emulation host may be used to coordinate testing of the DUT on the programmable device. In particular, the programmable device may include configurable memory elements such as lookup-table random-access memory (LUTRAM) elements that are operable in a LUT mode and a memory mode. An emulation controller may be used to dynamically assert a global emulation request signal, which forces each LUTRAM element that belong to the DUT in the LUT mode, thereby allowing the emulation host to readily access their internal states without having to perform partial reconfiguration.

Abstract: A prioritized error detection schedule may be generated using computer-aided-design (CAD) tools that receive specifications of critical regions within an array of configuration random access memory (CRAM) cells on an integrated circuit. Each of the specified critical regions may be provided a respective criticality weight. The proportion of indices in a prioritized error detection schedule that prescribe error detection for a given critical region may be based on the criticality weight of the given critical region. A prioritized error detection schedule may prescribe more frequent error correction for critical regions with higher criticality weights relative to critical regions with lower criticality weights. Addressing circuitry on the integrated circuit may be used to read out data from critical regions of CRAM in the order prescribed by the prioritized error detection schedule and check the read out CRAM data for errors.

Abstract: A host processor may utilize a coprocessor to accelerate the performance of a task. Upon receiving a acceleration request from the host processor, the coprocessor may identify and select an available logic sector within the coprocessor that can be used to perform a task associated with the acceleration request. In some cases, the selected logic sector may not be configured to perform the task, in which case the selected logic sector may be reconfigured. The configuration bit stream used to reconfigure the selected logic sector to perform the task may be retrieved from a stacked memory die mounted on the coprocessor, or, if the configuration bit stream is not stored in the stacked memory die, the configuration bit stream may be retrieved from an external memory through the host processor. Load balancing may be performed to dynamically allocate additional logic sectors to time-critical tasks.

Abstract: A system may include a host processor, a coprocessor for accelerating tasks received from the host processor, and one or more memory dies mounted to the coprocessor. The coprocessor and the memory die may be part of an integrated circuit package. The memory die may convey configuration bit streams to one or more logic sectors in programmable circuitry of the coprocessor over through-silicon vias. Each logic sector may include one or more data registers that are loaded with configuration data from the memory die. Multiple data registers may be loaded with configuration data simultaneously. The configuration data may be loaded onto an array of configuration memory cells using the data registers. Multiple data registers may be pipelined to allow simultaneous loading of configuration data into multiple sub-arrays of the array of configuration memory cells.