Patents by Inventor Jun Qian

Jun Qian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110281501
    Abstract: A substrate having a plurality of zones is polished and spectra are measured. For each zone, a first linear function fits a sequence of index values associated with reference spectra that best match the measured spectra. A projected time at which a reference zone will reach the target index value is determined based on the first linear function, and for at least one adjustable zone, a polishing parameter adjustment is calculated such that the adjustable zone has closer to the target index at the projected time than without such adjustment. The adjustment is calculated based on a feedback error calculated for a previous substrate. The feedback error for a subsequent substrate is calculated based on a second linear function that fits a sequence of index values associated with reference spectra that best match spectra measured after the polishing parameter is adjusted.
    Type: Application
    Filed: May 17, 2010
    Publication date: November 17, 2011
    Applicant: Applied Materials, Inc.
    Inventors: Jun Qian, Charles C. Garretson, Sivakumar Dhandapani, Jeffrey Drue David, Harry Q. Lee
  • Publication number: 20110269377
    Abstract: A computer-implemented method of generating reference spectra includes polishing a first substrate in a polishing apparatus having a rotatable platen, measuring a sequence of spectra from the substrate during polishing with an in-situ monitoring system, associating each spectrum in the sequence of spectra with a index value equal to a number of platen rotations at which the each spectrum was measured, and storing the sequence of spectra as reference spectra.
    Type: Application
    Filed: April 15, 2011
    Publication date: November 3, 2011
    Inventors: Jun Qian, Harry Q. Lee
  • Patent number: 8051346
    Abstract: Systems, methods, and other embodiments associated with programmable application specific integrated circuit (ASIC) fault injection are described. One example ASIC includes a serializer de-serializer (SERDES). The example ASIC may also include logics to process data in the ASIC. At least one of the logics either receives data from the SERDES and/or provides data to the SERDES. The example ASIC may also include an embedded fault injection logic (EFIL) to control injection of a fault to a path (e.g., data, control) associated with at least one of the logics. The example ASIC may also include an embedded set of multiplexers (ESOMs) controlled by the EFIL. The ESOMs are controllable by the EFIL to inject a fault signal to the data path.
    Type: Grant
    Filed: February 25, 2009
    Date of Patent: November 1, 2011
    Assignee: Cisco Technology, Inc.
    Inventors: Senthil Somasundaram, Jun Qian, Paul Chang, Thomas A. Hamilton
  • Publication number: 20110256812
    Abstract: Embodiments described herein use closed-loop control (CLC) of conditioning sweep to enable uniform groove depth removal across the pad, throughout pad life. A sensor integrated into the conditioning arm enables the pad stack thickness to be monitored in-situ and in real time. Feedback from the thickness sensor is used to modify pad conditioner dwell times across the pad surface, correcting for drifts in the pad profile that may arise as the pad and disk age. Pad profile CLC enables uniform reduction in groove depth with continued conditioning, providing longer consumables lifetimes and reduced operating costs.
    Type: Application
    Filed: April 14, 2011
    Publication date: October 20, 2011
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Sivakumar Dhandapani, Jun Qian, Christopher D. Cocca, Jason G. Fung, Shou-Sung Chang, Charles C. Garretson, Gregory E. Menk, Stan D. Tsai
  • Patent number: 8014004
    Abstract: A method of determining a physical property of a substrate includes recording a first spectrum obtained from a substrate, the first spectrum being obtained during a polishing process that alters a physical property of the substrate. The method includes identifying, in a database, at least one of several previously recorded spectra that is similar to the recorded first spectrum. Each of the spectra in the database has a physical property value associated therewith. The method includes generating a signal indicating that a first value of the physical property is associated with the first spectrum, the first value being determined using the physical property value associated with the identified previously recorded spectrum in the database. A system for determining a physical property of a substrate includes a polishing machine, an endpoint determining module, and a database.
    Type: Grant
    Filed: June 23, 2010
    Date of Patent: September 6, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Abraham Ravid, Boguslaw A. Swedek, Jeffrey Drue David, Jun Qian, Ingemar Carlsson, Dominic J. Benvegnu, Harry Q. Lee, Lakshmanan Karuppiah
  • Patent number: 7952708
    Abstract: A substrate processing system includes a processing module to process a substrate, a factory interface module configured to accommodate at least one cassette for holding the substrate, a spectrographic monitoring system positioned in or adjoining the factory interface module, and a substrate handler to transfer the substrate between the at least one cassette, the spectrographic monitoring system and the processing module.
    Type: Grant
    Filed: March 31, 2008
    Date of Patent: May 31, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Abraham Ravid, Boguslaw A. Swedek, Dominic J. Benvegnu, Jeffrey Drue David, Jun Qian, Sidney P. Huey, Ingemar Carlsson, Lakshmanan Karuppiah, Harry Q. Lee
  • Patent number: 7908533
    Abstract: Method and apparatus for operating for operating an Institute of Electrical and Electronics Engineers (IEEE) Standard 1149.1 compliant Joint Test Action Group (JTAG) Test Access Port (TAP) controller are disclosed. An example apparatus includes write logic that is configured to operationally interface with a TAP controller and a processor. The write logic is further configured to receive, from the processor, data for initializing the apparatus and operating the TAP controller, convert at least a portion of the data from a parallel format to a serial format and communicate the converted data to the TAP controller.
    Type: Grant
    Filed: September 2, 2008
    Date of Patent: March 15, 2011
    Assignee: Cisco Technology, Inc.
    Inventors: Senthil Somasundaram, Jun Qian
  • Publication number: 20110046918
    Abstract: A method of generating a library from a reference substrate for use in processing product wafers is described. The method includes measuring substrate characteristics at a plurality of well-defined points of a reference substrate, measuring spectra at plurality of measurement points of the reference substrate, there being more measurement points than well-defined points, and associating measured spectra with measured substrate characteristics.
    Type: Application
    Filed: November 2, 2010
    Publication date: February 24, 2011
    Inventors: Abraham Ravid, Boguslaw A. Swedek, Dominic J. Benvegnu, Jeffrey Drue David, Jun Qian, Sidney P. Huey, Ingemar Carlsson, Lakshmanan Karuppiah, Harry Q. Lee
  • Patent number: 7840375
    Abstract: A method of generating a library from a reference substrate for use in processing product wafers is described. The method includes measuring substrate characteristics at a plurality of well-defined points of a reference substrate, measuring spectra at plurality of measurement points of the reference substrate, there being more measurement points than well-defined points, and associating measured spectra with measured substrate characteristics.
    Type: Grant
    Filed: March 31, 2008
    Date of Patent: November 23, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Abraham Ravid, Boguslaw A. Swedek, Dominic J. Benvegnu, Jeffrey Drue David, Jun Qian, Sidney P. Huey, Ingemar Carlsson, Lakshmanan Karuppiah, Harry Q. Lee
  • Publication number: 20100261413
    Abstract: A method of determining a physical property of a substrate includes recording a first spectrum obtained from a substrate, the first spectrum being obtained during a polishing process that alters a physical property of the substrate. The method includes identifying, in a database, at least one of several previously recorded spectra that is similar to the recorded first spectrum. Each of the spectra in the database has a physical property value associated therewith. The method includes generating a signal indicating that a first value of the physical property is associated with the first spectrum, the first value being determined using the physical property value associated with the identified previously recorded spectrum in the database. A system for determining a physical property of a substrate includes a polishing machine, an endpoint determining module, and a database.
    Type: Application
    Filed: June 23, 2010
    Publication date: October 14, 2010
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Abraham Ravid, Boguslaw A. Swedek, Jeffrey Drue David, Jun Qian, Ingemar Carlsson, Dominic J. Benvegnu, Harry Q. Lee, Lakshmanan Karuppiah
  • Publication number: 20100218058
    Abstract: Systems, methods, and other embodiments associated with programmable application specific integrated circuit (ASIC) fault injection are described. One example ASIC includes a serializer de-serializer (SERDES). The example ASIC may also include logics to process data in the ASIC. At least one of the logics either receives data from the SERDES and/or provides data to the SERDES. The example ASIC may also include an embedded fault injection logic (EFIL) to control injection of a fault to a path (e.g., data, control) associated with at least one of the logics. The example ASIC may also include an embedded set of multiplexers (ESOMs) controlled by the EFIL. The ESOMs are controllable by the EFIL to inject a fault signal to the data path.
    Type: Application
    Filed: February 25, 2009
    Publication date: August 26, 2010
    Applicant: CISCO TECHNOLOGY, INC.
    Inventors: Senthil SOMASUNDARAM, Jun QIAN, Paul CHANG, Thomas A. HAMILTON
  • Publication number: 20100184357
    Abstract: A polishing system includes a polishing pad having a solid light-transmissive window, an optical fiber having an end, and a spacer having a vertical aperture therethrough. A bottom surface of the spacer contacts the end of the optical fiber, a top surface of the spacer contacts the underside of the window, and the vertical aperture is aligned with the optical fiber.
    Type: Application
    Filed: December 22, 2009
    Publication date: July 22, 2010
    Inventors: Jun Qian, Dominic J. Benvegnu, Ningzhuo Cui, Boguslaw A. Swedek, Thomas H. Osterheld
  • Patent number: 7746485
    Abstract: A method of determining a physical property of a substrate includes recording a first spectrum obtained from a substrate, the first spectrum being obtained during a polishing process that alters a physical property of the substrate. The method includes identifying, in a database, at least one of several previously recorded spectra that is similar to the recorded first spectrum. Each of the spectra in the database has a physical property value associated therewith. The method includes generating a signal indicating that a first value of the physical property is associated with the first spectrum, the first value being determined using the physical property value associated with the identified previously recorded spectrum in the database. A system for determining a physical property of a substrate includes a polishing machine, an endpoint determining module, and a database.
    Type: Grant
    Filed: October 16, 2008
    Date of Patent: June 29, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Abraham Ravid, Boguslaw A. Swedek, Jeffrey Drue David, Jun Qian, Ingemar Carlsson, Dominic J. Benvegnu, Harry Q. Lee, Lakshmanan Karuppiah
  • Publication number: 20100090743
    Abstract: A method and apparatus to regulate voltage used to power an ASIC comprising an ASIC having a signal source and a modulator. The modulator establishes a characteristic of a signal created by the signal source to indicate a voltage level to be used to power the ASIC. The signal is communicated to a voltage regulator to apply an optimal voltage to the ASIC.
    Type: Application
    Filed: October 10, 2008
    Publication date: April 15, 2010
    Applicant: CISCO TECHNOLOGY, INC.
    Inventors: Mehran Ataee, Udupi Harisharan, Jun Qian, Thomas A. Hamilton, Senthil Somasundaram
  • Publication number: 20100058130
    Abstract: Method and apparatus for operating for operating an Institute of Electrical and Electronics Engineers (IEEE) Standard 1149.1 compliant Joint Test Action Group (JTAG) Test Access Port (TAP) controller are disclosed. An example apparatus includes write logic that is configured to operationally interface with a TAP controller and a processor. The write logic is further configured to receive, from the processor, data for initializing the apparatus and operating the TAP controller, convert at least a portion of the data from a parallel format to a serial format and communicate the converted data to the TAP controller.
    Type: Application
    Filed: September 2, 2008
    Publication date: March 4, 2010
    Inventors: Senthil Somasundaram, Jun Qian
  • Publication number: 20090307354
    Abstract: A wireless communication system capable of sharing system resource includes a wireless communication device for performing a first wireless communication function, and a plurality of electronic devices each including an interface for coupling the wireless communication device by means of plug and play, an operating unit for performing a function of each electronic device, a wireless communication unit for performing a second wireless communication function, a detection unit coupled to the interface for detecting whether the wireless communication device is coupled to the interface, and a control unit coupled to the detection unit and the operating unit for controlling the operating unit to perform the first communication function via the interface according to a detection result provided by the detection unit.
    Type: Application
    Filed: May 6, 2009
    Publication date: December 10, 2009
    Inventor: Jian-Jun Qian
  • Publication number: 20090295745
    Abstract: An input method for a touch panel includes displaying a plurality of selecting objects each corresponding to a control signal, enlarging the plurality of neighboring selecting objects in the plurality of selecting objects when the plurality of neighboring selecting objects in the plurality of selecting objects are selected, receiving a direction indication signal corresponding to a direction toward to a first selecting object of the plurality of neighboring selecting objects from a first position, and outputting a control signal corresponding to the first selecting objects according to the direction indication signal.
    Type: Application
    Filed: April 28, 2009
    Publication date: December 3, 2009
    Inventor: Jian-Jun Qian
  • Publication number: 20090286324
    Abstract: A method for identifying persons with increased risk of developing type 2 diabetes mellitus utilizing selected biomarkers described hereafter either alone or in combination. The present invention allows for broad based, reliable, screening of large population bases and provides other advantages, including the formulation of effective strategies for characterizing, archiving, and contrasting data from multiple sample types under varying conditions.
    Type: Application
    Filed: May 13, 2008
    Publication date: November 19, 2009
    Inventors: Thomas O. Metz, Wei-Jun Qian, Jon M. Jacobs, Ashoka D. Polpitiya, David G. Camp, II, Richard D. Smith
  • Publication number: 20090275265
    Abstract: A computer implemented method includes obtaining at least one current spectrum with an in-situ optical monitoring system, comparing the current spectrum to a plurality of different reference spectra, and determining based on the comparing whether a polishing endpoint has been achieved for the substrate having the outermost layer undergoing polishing. The current spectrum is a spectrum of light reflected from a substrate having an outermost layer undergoing polishing and at least one underlying layer. The plurality of reference spectra represent spectra of light reflected from substrates with outermost layers having the same thickness and underlying layers having different thicknesses.
    Type: Application
    Filed: April 28, 2009
    Publication date: November 5, 2009
    Inventors: Jun Qian, Sivakumar Dhandapani, Harry Q. Lee, Thomas H. Osterheld, Zhize Zhu
  • Publication number: 20090041007
    Abstract: A method for obtaining Internet radio resources based on Session Initiation Protocol (SIP) is adapted for use between an administrator server and at least one client terminal. The method includes the following steps: (a) enabling the client terminal and the administrator server to set up a tunnel based on the SIP; (b) enabling the client terminal to send a SIP message requesting radio station data to the administrator server through the tunnel; and (c) enabling the administrator server to provide the radio station data to the client terminal through the tunnel. Since SIP has very good flexibility and functionality, obtaining Internet radio resources based on the SIP can overcome inconveniences associated with searching by the user.
    Type: Application
    Filed: November 5, 2007
    Publication date: February 12, 2009
    Applicant: WISTRON CORPORATION
    Inventor: Jian-Jun Qian