Patents by Inventor Jung Hur
Jung Hur has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11913926Abstract: Various example embodiments described herein relate to a sensor assembly. The sensor assembly includes a substrate and a disk for providing parallel gas flow to a plurality of sensing dies. The substrate defines a plurality of openings and an inlet conduit. The plurality of openings is adapted to receive at least one sensing die of the plurality of sensing dies. The inlet conduit is defined between a first end of the substrate and a second end of the substrate. The first end of the substrate is adapted to receive an inflow of a gas. The disk is adapted to be positioned below the substrate so that a top portion of the disk is exposed to the second end of the inlet conduit and the disk defines a passage for the gas to uniformly flow from the second end to a sensor head of the at least one sensing die.Type: GrantFiled: November 4, 2019Date of Patent: February 27, 2024Assignee: HONEYWELL ANALYTICS INC.Inventors: Changyoung Jung, Jinkwang Cho, Sang Hoon Hur, Jae Hwan Lee
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Publication number: 20240060908Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.Type: ApplicationFiled: November 1, 2023Publication date: February 22, 2024Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Chan Kwon LEE, Moon Young JEON, Jung HUR, Deok Hwa HONG, Eun Ha JO
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Patent number: 11821846Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.Type: GrantFiled: May 3, 2022Date of Patent: November 21, 2023Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Chan Kwon Lee, Moon Young Jeon, Jung Hur, Deok Hwa Hong, Eun Ha Jo
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Publication number: 20230264628Abstract: An active notice device according to an embodiment includes a signal receiver configured to receive a signal generated by the active sensor of the surrounding vehicle, a signal analyzer configured to analyze characteristics of the signal received by the signal receiver, an information generator configured to generate information recognizable by the surrounding vehicle according to user setting, a signal generator configured to amplify and generate characteristics of the signal analyzed by the signal analyzer using the information generated by the information generator, and a signal transmitter configured to transmit the signal amplified and generated by the signal generator to an active sensor of the surrounding vehicle corresponding thereto.Type: ApplicationFiled: February 14, 2023Publication date: August 24, 2023Inventors: Gun Zung KIM, Soo Jung HUR, Jeong Sook EOM, Yong Wan PARK
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Publication number: 20220260503Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.Type: ApplicationFiled: May 3, 2022Publication date: August 18, 2022Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Chan Kwon LEE, Moon Young JEON, Jung HUR, Deok Hwa HONG, Eun Ha JO
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Patent number: 11360031Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.Type: GrantFiled: December 16, 2020Date of Patent: June 14, 2022Assignee: KOH YOUNG TECHNOLOGY INCInventors: Chan Kwon Lee, Moon Young Jeon, Jung Hur, Deok Hwa Hong, Eun Ha Jo
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Publication number: 20210254966Abstract: An inspection apparatus for inspecting the appearance of an inspection target object is provided. The inspection apparatus according to one embodiment of the present disclosure includes a support part configured to hold an inspection target object such that a side surface of the inspection target object faces a predetermined direction, a light source configured to irradiate light toward the inspection target object, a diffusion reflector configured to diffusely reflect at least a part of the irradiated light to irradiate the reflected light to the side surface of the inspection target object, and at least one inspection part configured to inspect the inspection target object by receiving the light reflected from the inspection target object and the diffusion reflector.Type: ApplicationFiled: November 15, 2018Publication date: August 19, 2021Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Jung HUR, Woo Jae CHOI
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Publication number: 20210207954Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: ApplicationFiled: March 25, 2021Publication date: July 8, 2021Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun LEE, Kwangill KOH, Moon-Young JEON, Sang-Kyu YUN, Hong-Min KIM, Jung HUR
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Patent number: 10996050Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: GrantFiled: January 6, 2020Date of Patent: May 4, 2021Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun Lee, Kwangill Koh, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
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Publication number: 20210102903Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.Type: ApplicationFiled: December 16, 2020Publication date: April 8, 2021Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Chan Kwon LEE, Moon Young JEON, Jung HUR, Deok Hwa HONG, Eun Ha JO
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Patent number: 10890538Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.Type: GrantFiled: October 15, 2019Date of Patent: January 12, 2021Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Chan Kwon Lee, Moon Young Jeon, Jung Hur, Deok Hwa Hong, Eun Ha Jo
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Patent number: 10883824Abstract: Disclosed are a pattern light irradiating device and an inspection apparatus using the same. The pattern light irradiating device includes first and second pattern light sources installed on a frame having a plurality of through-holes. Each of the through-holes is formed along a single optical axis. The first pattern light source is configured to irradiate first pattern light having a fixed pitch. The second pattern light source is configured to irradiate second pattern light having a variable pitch.Type: GrantFiled: October 23, 2017Date of Patent: January 5, 2021Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Jung Hur, Woo Jae Choi
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Patent number: 10737190Abstract: A smart toy platform includes a body including a top part, a bottom part, and a plurality of side parts, a function unit coupled to at least one of the plurality of side parts an application unit arranged in the body and to control an operation of the function unit, a base unit arranged in the body and to provide an application support function to the application unit, and a power supply unit configured to supply electric power to at least one of the function unit, the application unit, or the base unit. The function unit is coupled to the at least one of the plurality of side parts on an inner side or an outer side, across the inner side and the outer side, or an integrate manner.Type: GrantFiled: April 3, 2018Date of Patent: August 11, 2020Assignee: CREAMO INC.Inventors: Seok Lee, Taikjin Lee, Hyunduk Kim, Jeong Hun Shin, Won Kyo Jeong, Soo Jung Hur, Yong-Joon Park, Deokha Woo
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Publication number: 20200141721Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: ApplicationFiled: January 6, 2020Publication date: May 7, 2020Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun Lee, Kwangill Koh, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
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Publication number: 20200116653Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.Type: ApplicationFiled: October 15, 2019Publication date: April 16, 2020Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Chan Kwon LEE, Moon Young JEON, Jung HUR, Deok Hwa HONG, Eun Ha JO
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Patent number: 10563978Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: GrantFiled: June 12, 2019Date of Patent: February 18, 2020Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun Lee, Kwangill Koh, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur
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Publication number: 20190299113Abstract: A smart toy platform includes a body including a top part, a bottom part, and a plurality of side parts, a function unit coupled to at least one of the plurality of side parts an application unit arranged in the body and to control an operation of the function unit, a base unit arranged in the body and to provide an application support function to the application unit, and a power supply unit configured to supply electric power to at least one of the function unit, the application unit, or the base unit. The function unit is coupled to the at least one of the plurality of side parts on an inner side or an outer side, across the inner side and the outer side, or an integrate manner.Type: ApplicationFiled: April 3, 2018Publication date: October 3, 2019Applicant: CREAMO Inc.Inventors: Seok LEE, Taikjin LEE, Hyunduk KIM, Jeong Hun SHIN, Won Kyo JEONG, Soo Jung HUR, Yong-Joon PARK, Deokha WOO
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Publication number: 20190293413Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: ApplicationFiled: June 12, 2019Publication date: September 26, 2019Applicant: KOH YOUNG TECHNOLOGY INCInventors: Seung-Jun LEE, Kwangill KOH, Moon-Young JEON, Sang-Kyu YUN, Hong-Min KIM, Jung HUR
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Publication number: 20190265025Abstract: Disclosed are a pattern light irradiating device and an inspection apparatus using the same. The pattern light irradiating device includes first and second pattern light sources installed on a frame having a plurality of through-holes. Each of the through-holes is formed along a single optical axis. The first pattern light source is configured to irradiate first pattern light having a fixed pitch. The second pattern light source is configured to irradiate second pattern light having a variable pitch.Type: ApplicationFiled: October 23, 2017Publication date: August 29, 2019Applicant: KOH YOUNG TECHNOLOGY INC.Inventors: Jung HUR, Woo Jae CHOI
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Patent number: 10359276Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.Type: GrantFiled: October 21, 2016Date of Patent: July 23, 2019Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Seung-Jun Lee, Kwangill Koh, Moon-Young Jeon, Sang-Kyu Yun, Hong-Min Kim, Jung Hur